scholarly journals The sensitivity evaluation of the television sensor for the radiation-resistant transmitting television camera based on vacuum transfertube

2019 ◽  
Vol 1313 ◽  
pp. 012061
Author(s):  
E V Zaytseva
Keyword(s):  
Television Camera ◽  
Sensitivity Evaluation ◽  
Radiation Resistant

High Voltage Transmission Microscopy of Surveyor III Camera Shrouds

1971 ◽  
Vol 29 ◽  
pp. 138-139
Author(s):  
W. R. Duff ◽  
L. E. Thomas ◽  
R. M. Fisher ◽  
S. V. Radcliffe
Keyword(s):  
Alloy Sheet ◽  
Transmission Microscopy ◽  
Television Camera ◽  
Window Method ◽  
Transmission Electron ◽  
Microstructural Effects ◽  
Lunar Environment ◽  
Successful Retrieval ◽  
Materials Used ◽  
Abrasive Paper

Successful retrieval of the television camera and other components from the Surveyor III spacecraft by the Apollo 12 astronauts has provided a unique opportunity to study the effects of a known and relatively extensive exposure to the lunar environment. Microstructural effects including those produced by micro-meteorite impact, radiation damage (by both the solar wind and cosmic rays) and solar heating might be expected in the materials used to fabricate the spacecraft. Samples received were in the form of 1 cm2 of painted unpainted aluminum alloy sheet from the top of the camera visor (JPL Code 933) and the sides (935,936) and bottom (934) of the lower camera shroud. They were prepared for transmission electron microscopy by first hand-grinding with abrasive paper to a thickness of 0.006". The edges were lacquered and the sample electropolished in 10% perchloric methanol using the “window” method, to a thickness of ~0.001". Final thinning was accomplished by polishing 3 mm punched disks in an acetic-phosphoric-nitric acid solution.

In Situ Observation of Catalyzed Gasification of Graphite by Nickel

1981 ◽  
Vol 39 ◽  
pp. 76-77
Author(s):  
R. T. K. Baker ◽  
R. D. Sherwood
Keyword(s):  
Objective Lens ◽  
In Situ Observation ◽  
Gas Flows ◽  
Catalytic Gasification ◽  
Television Camera ◽  
Viewing Screen ◽  
Fuels And Chemicals ◽  
Gasification Of Carbon ◽  
Transmission Microscope

The catalytic gasification of carbon at high temperature by microscopic size metal particles is of fundamental importance to removal of coke deposits and conversion of refractory hydrocarbons into fuels and chemicals. The reaction of metal/carbon/gas systems can be observed by controlled atmosphere electron microscopy (CAEM) in an 100 KV conventional transmission microscope. In the JEOL gas reaction stage model AGl (Fig. 1) the specimen is positioned over a hole, 200μm diameter, in a platinum heater strip, and is interposed between two apertures, 75μm diameter. The control gas flows across the specimen and exits through these apertures into the specimen chamber. The gas is further confined by two apertures, one in the condenser and one in the objective lens pole pieces, and removed by an auxiliary vacuum pump. The reaction zone is <1 mm thick and is maintained at gas pressure up to 400 Torr and temperature up to 1300<C as measured by a Pt-Pt/Rh 13% thermocouple. Reaction events are observed and recorded on videotape by using a Philips phosphor-television camera located below a hole in the center of the viewing screen. The overall resolution is greater than 2.5 nm.

Alternative approaches to ultra-high resolution imaging

1991 ◽  
Vol 49 ◽  
pp. 650-651
Author(s):  
J.M. Cowley
Keyword(s):  
High Resolution ◽  
High Voltage ◽  
High Resolution Electron Microscopy ◽  
Crystal Defects ◽  
High Resolution Imaging ◽  
General Applicability ◽  
Resolution Electron ◽  
Radiation Resistant ◽  
Resolution Imaging ◽  
Alternative Approaches

By extrapolation of past experience, it would seem that the future of ultra-high resolution electron microscopy rests with the advances of electron optical engineering that are improving the instrumental stability of high voltage microscopes to achieve the theoretical resolutions of 1Å or better at 1MeV or higher energies. While these high voltage instruments will undoubtedly produce valuable results on chosen specimens, their general applicability has been questioned on the basis of the excessive radiation damage effects which may significantly modify the detailed structures of crystal defects within even the most radiation resistant materials in a period of a few seconds. Other considerations such as those of cost and convenience of use add to the inducement to consider seriously the possibilities for alternative approaches to the achievement of comparable resolutions.

Imaging sub-micron objects with light microscopy: Visualization of the T-4 bacteriophage

1989 ◽  
Vol 47 ◽  
pp. 834-835
Author(s):  
Malcolm Brown ◽  
Reynolds M. Delgado ◽  
Michael J. Fink
Keyword(s):  
Electron Microscopy ◽  
Light Microscopy ◽  
Focal Plane ◽  
Phase Contrast ◽  
Dark Field ◽  
E Coli ◽  
Polystyrene Beads ◽  
Television Camera ◽  
Transmission Electron ◽  
Universal Microscope

While light microscopy has been used to image sub-micron objects, numerous problems with diffraction-limitations often preclude extraction of useful information. Using conventional dark-field and phase contrast light microscopy coupled with image processing, we have studied the following objects: (a) polystyrene beads (88nm, 264nm, and 557mn); (b) frustules of the diatom, Pleurosigma angulatum, and the T-4 bacteriophage attached to its host, E. coli or free in the medium. Equivalent images of the same areas of polystyrene beads and T-4 bacteriophages were produced using transmission electron microscopy.For light microscopy, we used a Zeiss universal microscope. For phase contrast observations a 100X Neofluar objective (N.A.=1.3) was applied. With dark-field, a 100X planachromat objective (N.A.=1.25) in combination with an ultra-condenser (N.A.=1.25) was employed. An intermediate magnifier (Optivar) was available to conveniently give magnification settings of 1.25, 1.6, and 2.0. The image was projected onto the back focal plane of a film or television camera with a Carl Zeiss Jena 18X Compens ocular.

Pulsed Laser Stimulation Coupled with Optical Failure Analysis Technique—A Methodology to Help Space Application Electrical Designers

2015 ◽  
Author(s):  
G. Bascoul ◽  
K. Sanchez ◽  
G. Perez ◽  
F. Bezerra ◽  
H. Chauvin
Keyword(s):  
Heavy Ions ◽  
Pulsed Laser ◽  
Radiation Sensitivity ◽  
Radiation Environment ◽  
Physical Analysis ◽  
Space Application ◽  
Voltage Converter ◽  
Industrial Laboratory ◽  
Sensitivity Evaluation ◽  
Analysis Technique

Abstract Pulsed laser for radiation sensitivity evaluation has become a common tool used in research and industrial laboratory. This paper aims to highlight an approach to understand weaknesses of a component under radiation environment using a short pulsed width laser beam coupled to thermography technique, heavy ions test inputs and physical analysis. This paper is based on a study of a PWM device embedded on voltage converter.

Radiation-resistant magnetic field sensors based on SiO2(Ni)/Si structures

2019 ◽  
Vol 460 ◽  
pp. 209-211 ◽  
Author(s):  
E. Kaniukov ◽  
V. Bundyukova ◽  
D. Yakimchuk ◽  
A. Shumskaya ◽  
Yu. Bogatyrev ◽  
...  
Keyword(s):  
Magnetic Field ◽  
Magnetic Field Sensors ◽  
Radiation Resistant
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