Research on the Application of Manufacturing Technology for Large-size Bearing Raceway Surface Integrity

The paper presents the optimization of the manufacturing technology of silicon-lithium Δ Ε -detectors of large size, as well as some research data on the radiometric characteristics of silicon-lithium Δ Ε -detectors with a diameter of 4-8 cm and a radiometer based on them.

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Manufacturing Technology for Large-Size Hard-Forgings

Journal of the Japan Society for Technology of Plasticity ◽

10.9773/sosei.52.965 ◽

2011 ◽

Vol 52 (608) ◽

pp. 965-969

Author(s):

Shoitsu SEO

Keyword(s):

Manufacturing Technology ◽

Large Size

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Study on scatter of surface integrity of bearing raceway grinding

MANUFACTURING TECHNOLOGY ◽

10.21062/mft.2021.090 ◽

2021 ◽

Author(s):

Zhou Chang ◽

Lai Hu

Keyword(s):

Surface Integrity ◽

Bearing Raceway

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Coherency loss in γ' precipitates in nickel-base superalloy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100075014 ◽

1983 ◽

Vol 41 ◽

pp. 244-245

Author(s):

R. A. Ricks ◽

Angus J. Porter

Keyword(s):

Lattice Mismatch ◽

Lattice Parameter ◽

Nickel Base Superalloy ◽

Large Size ◽

The Matrix ◽

Nimonic 80A ◽

Interfacial Dislocations ◽

Nickel Base ◽

Coherency Loss ◽

Nimonic 115

During a recent investigation concerning the growth of γ' precipitates in nickel-base superalloys it was observed that the sign of the lattice mismatch between the coherent particles and the matrix (γ) was important in determining the ease with which matrix dislocations could be incorporated into the interface to relieve coherency strains. Thus alloys with a negative misfit (ie. the γ' lattice parameter was smaller than the matrix) could lose coherency easily and γ/γ' interfaces would exhibit regularly spaced networks of dislocations, as shown in figure 1 for the case of Nimonic 115 (misfit = -0.15%). In contrast, γ' particles in alloys with a positive misfit could grow to a large size and not show any such dislocation arrangements in the interface, thus indicating that coherency had not been lost. Figure 2 depicts a large γ' precipitate in Nimonic 80A (misfit = +0.32%) showing few interfacial dislocations.

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Automatic analysis of Kikuchi diffraction patterns

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100172231 ◽

1994 ◽

Vol 52 ◽

pp. 900-901

Author(s):

H. Weiland ◽

D. P. Field

Keyword(s):

Electron Beam ◽

Electron Microscope ◽

Spatial Resolution ◽

Relevant Information ◽

Crystalline Materials ◽

Large Size ◽

Transmission Electron ◽

New Type ◽

Diffraction Patterns ◽

Orientation Determination

Recent advances in the automatic indexing of backscatter Kikuchi diffraction patterns on the scanning electron microscope (SEM) has resulted in the development of a new type of microscopy. The ability to obtain statistically relevant information on the spatial distribution of crystallite orientations is giving rise to new insight into polycrystalline microstructures and their relation to materials properties. A limitation of the technique in the SEM is that the spatial resolution of the measurement is restricted by the relatively large size of the electron beam in relation to various microstructural features. Typically the spatial resolution in the SEM is limited to about half a micron or greater. Heavily worked structures exhibit microstructural features much finer than this and require resolution on the order of nanometers for accurate characterization. Transmission electron microscope (TEM) techniques offer sufficient resolution to investigate heavily worked crystalline materials.Crystal lattice orientation determination from Kikuchi diffraction patterns in the TEM (Figure 1) requires knowledge of the relative positions of at least three non-parallel Kikuchi line pairs in relation to the crystallite and the electron beam.

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Immunoprobe localization in mammalian embryos

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100157693 ◽

1990 ◽

Vol 48 (3) ◽

pp. 32-33

Author(s):

Patricia G. Calarco ◽

Margaret C. Siebert

Keyword(s):

Electron Microscopy ◽

Endoplasmic Reticulum ◽

Thin Sections ◽

Relative Lack ◽

Large Size ◽

Mammalian Embryos ◽

Antigen Localization ◽

Difficult Challenge ◽

Lowicryl K4m ◽

Fertilized Egg

Visualization of preimplantation mammalian embryos by electron microscopy is difficult due to the large size of the ircells, their relative lack of internal structure, and their highly hydrated cytoplasm. For example, the fertilized egg of the mouse is a single cell of approximately 75μ in diameter with little organized cytoskelet on and apaucity ofor ganelles such as endoplasmic reticulum (ER) and Golgi material. Thus, techniques that work well on tissues or cell lines are often not adaptable to embryos at either the LM or EM level.Over several years we have perfected techniques for visualization of mammalian embryos by LM and TEM, SEM and for the pre-embedding localization of antigens. Post-embedding antigenlocalization in thin sections of mouse oocytes and embryos has presented a more difficult challenge and has been explored in LR White, LR Gold, soft EPON (after etching of sections), and Lowicryl K4M. To date, antigen localization has only been achieved in Lowicryl-embedded material, although even with polymerization at-40°C, the small ER vesicles characteristic of embryos are unrecognizable.

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