scholarly journals Combined CFA-AFM Analytical approach for precipitation reaction regarding crystal growth building single and multiple monolayers based on surface area calculation with image surface roughness analysis (unseen surface)

2021 ◽  
Vol 2063 (1) ◽  
pp. 012031
Author(s):  
Issam Mohammad Shakir Ali ◽  
Nagham Shakir ◽  
Turkie ◽  
Abd Al-razackAbd Hussein Fares
Keyword(s):  
Surface Roughness ◽  
Crystal Growth ◽  
Surface Area ◽  
Peak Height ◽  
Precipitation Reaction ◽  
Hybrid Functional ◽  
Contact Mode ◽  
Mono Layer ◽  
Mebeverine Hydrochloride ◽  
Roughness Analysis

Abstract A reaction of Mebeverine hydrochloride (0.03mM) in pure form with sodium nitroprusside (0.07mM) to form OFF White precipitate. A constant feed was used to collect an enough amount in weight for AFM study. Continuous flow injection analysis was conducted as it is the aim of this study to combine FIA with AFM. To elucidate the study of surface morphology. Various parameters of AFM image surface roughness analysis were discussed in relation to the kind of precipitate formed. Skewness, kurtosis, peak-peak, ten peak height, fractal dimension, wavelength, core roughness depth, and reduced valley depth. All these with the four parameter mainly amplitude, hybrid, functional and spetial. Since no previous study of such was conducted; all usual mode of imaging was dealt with i.e., contact, non-contact and intermittent contact was defined. A non contact mode was used in this study. A detailed study of how the crystal growth buildup first mono layer (hypothetical based on the date obtained also how much each grain carry a concentration with the number that are on the first mono layer. Number of given samples of surface area calculation plus a demonstration of the hypothetically formed multi mono layers specially at high reactant concentration. The main aim of this project was the binding of AFM with FIA which is regarded as an new approach which might be a very useful knowledge for other researcher.

Surface roughness measurements of vanadium-contaminated fluidized cracking catalysts by atomic force microscopy

1996 ◽  
Vol 54 ◽  
pp. 866-867
Author(s):  
H. Kinney ◽  
M.L. Occelli ◽  
S.A.C. Gould
Keyword(s):  
Surface Roughness ◽  
Zeolite Y ◽  
Atomic Level ◽  
Microporous Structure ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Before And After ◽  
Roughness Measurements ◽  
Cracking Catalysts

For this study we have used a contact mode atomic force microscope (AFM) to study to topography of fluidized cracking catalysts (FCC), before and after contamination with 5% vanadium. We selected the AFM because of its ability to well characterize the surface roughness of materials down to the atomic level. It is believed that the cracking in the FCCs occurs mainly on the catalysts top 10-15 μm suggesting that the surface corrugation could play a key role in the FCCs microactivity properties. To test this hypothesis, we chose vanadium as a contaminate because this metal is capable of irreversibly destroying the FCC crystallinity as well as it microporous structure. In addition, we wanted to examine the extent to which steaming affects the vanadium contaminated FCC. Using the AFM, we measured the surface roughness of FCCs, before and after contamination and after steaming.We obtained our FCC (GRZ-1) from Davison. The FCC is generated so that it contains and estimated 35% rare earth exchaged zeolite Y, 50% kaolin and 15% binder.

scholarly journals Atomic force microscopy comparative analysis of the surface roughness of two posterior chamber phakic intraocular lens models: ICL versus IPCL

2021 ◽  
Vol 21 (1) ◽  
Author(s):  
Juan Gros-Otero ◽  
Samira Ketabi ◽  
Rafael Cañones-Zafra ◽  
Montserrat Garcia-Gonzalez ◽  
Cesar Villa-Collar ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Intraocular Lenses ◽  
Posterior Chamber ◽  
Anterior Surface ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Phakic Intraocular Lenses ◽  
Roughness Measurements

Abstract Background To compare the anterior surface roughness of two commercially available posterior chamber phakic intraocular lenses (IOLs) using atomic force microscopy (AFM). Methods Four phakic IOLs were used for this prospective, experimental study: two Visian ICL EVO+ V5 lenses and two iPCL 2.0 lenses. All of them were brand new, were not previously implanted in humans, were monofocal and had a dioptric power of − 12 diopters (D). The anterior surface roughness was assessed using a JPK NanoWizard II® atomic force microscope in contact mode immersed in liquid. Olympus OMCL-RC800PSA commercial silicon nitride cantilever tips were used. Anterior surface roughness measurements were made in 7 areas of 10 × 10 μm at 512 × 512 point resolution. The roughness was measured using the root-mean-square (RMS) value within the given regions. Results The mean of all anterior surface roughness measurements was 6.09 ± 1.33 nm (nm) in the Visian ICL EVO+ V5 and 3.49 ± 0.41 nm in the iPCL 2.0 (p = 0.001). Conclusion In the current study, we found a statistically significant smoother anterior surface in the iPCL 2.0 phakic intraocular lenses compared with the VISIAN ICL EVO+ V5 lenses when studied with atomic force microscopy.

Surface properties of composite resins with and without fluorides for bracket bonding / Propriedades de superfície de resinas compostas com e sem fluoretos para colagem de suportes

2021 ◽  
Vol 7 (7) ◽  
pp. 67267-67276
Author(s):  
Emillyn Jones Greijal Dias Holanda ◽  
José Guilherme Neves ◽  
Milton Santamaria-Jr ◽  
Silvia Amélia Scudeler Vedovello ◽  
Ana Rosa Costa ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Surface Properties ◽  
Color Change ◽  
Composite Resins ◽  
Hardness Tester ◽  
Significant Difference ◽  
Post Test ◽  
Roughness Analysis ◽  
Diamond Paste ◽  
Penetration Time

The aim of this study was to evaluate the surface properties of orthodontic resins with and without fluoride. Forty disks, measuring 2 mm thick by 6 mm in diameter, were made of 4 bracket-bonding composite resins (n=10): Transbond Plus Color Change-3M/Unitek (TPCC); Transbond XT- 3M/Unitek (TXT), Orthocem -FGM (OC); Orthocem UV Trace-FGM (OCUV). The discs were photoactivated for 40 seconds with irradiance of 450 mW/cm2 and manually polished in sequence by silicon carbide sandpapers with 1200 and 2000 grain size and finished with diamond paste and felt disc. The surface microhardness analysis was performed using a Shimadzu Micro Hardness Tester HMV-2,000 (Shimadzu Corporation, Kyoto, Japan) with a load of 50 gF and a 5 second penetration time. Surface roughness readings were taken using a Surf Corder Roughness Meter (SE 1700- Kosaka, Lisboa-Portugal). For data analysis, ANOVA (one-way) was used, followed by Tukey's post-test (?=0.05). The microhardness results showed a difference (p?0.05) in the means of the orthodontic resins between TPCC and TXT with the other groups. After the surface roughness analysis, the averages showed that TPCC resin showed higher roughness compared to OC and OCUV (p?0.05), and there was no statistical difference with TXT. It was concluded that statistically the composite resins with fluoride showed significant difference regarding hardness and roughness.

Laser singulation of thin wafer: Die strength and surface roughness analysis of 80μm silicon dice

2009 ◽  
Vol 47 (7-8) ◽  
pp. 850-854 ◽  
Author(s):  
Nitin Sudani ◽  
Krishnan Venkatakrishnan ◽  
Bo Tan
Keyword(s):  
Surface Roughness ◽  
Roughness Analysis

Scaling Analysis of a- and poly-Si Surface Roughness by Atomic Force Microscopy

1994 ◽  
Vol 367 ◽  
Author(s):  
T. Yoshinobu ◽  
A. Iwamoto ◽  
K. Sudoh ◽  
H. Iwasaki
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Surface Area ◽  
Scaling Behavior ◽  
Linear Size ◽  
Scaling Analysis ◽  
Macroscopic Scale ◽  
Force Microscopy ◽  
Atomic Force ◽  
Roughness Exponent

AbstractThe scaling behavior of the surface roughness of a-and poly-Si deposited on Si was investigated by atomic force microscopy (AFM). The interface width W(L), defined as the rms roughness as a function of the linear size of the surface area, was calculated from various sizes of AFM images. W(L) increased as a power of L with the roughness exponent ∝ on shorter length scales, and saturated at a constant value of on a macroscopic scale. The value of roughness exponent a was 0.48 and 0.90 for a-and poly-Si, respectively, and σ was 1.5 and 13.6nm for 350nm-thick a-Si and 500nm-thick poly-Si, respectively. The AFM images were compared with the surfaces generated by simulation.

Hydroxyapatite as a bifunctional nanocatalyst for solventless Henry reaction: A demonstration of morphology dependent catalysis

2022 ◽  
Author(s):  
Smriti Mukherjee ◽  
Iyyappan E ◽  
Keerthi Satheesh ◽  
Elsa Maria Jordi ◽  
Saranya S ◽  
...  
Keyword(s):  
Crystal Growth ◽  
Surface Area ◽  
High Surface ◽  
High Surface Area ◽  
Chemical Precipitation ◽  
Chemical Precipitation Method ◽  
Precipitation Method ◽  
Current Investigation ◽  
Henry Reaction

In the current investigation, HA nanorods and nanoplates with a high surface area have been synthesized using the chemical precipitation method via alcogel formation employing L-arginine as a crystal growth...

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