The SU-8 spin-coating on silicon nanowires formed by cryogenic dry etching
2021 ◽
Vol 2086
(1)
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pp. 012078
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Abstract Arrays of vertically aligned silicon nanowires were fabricated by cryogenic dry etching. The post-processing technology was developed to full coating of arrays of NWs by SU-8 and release the top side of SiNWs. The Schottky diodes were fabricated on arrays of SiNWs with and without SU-8 by gold evaporation. The cryogenic dry etching leads to defect formation with Ea=0.28 eV and concentration lower 5⋅1012 cm−3 in near-surface area in silicon, and no defect are detected in bulk silicon. However, oxygen plasma treatment used to release top side of SiNWs leads to increase of its concentration by two order and formation of defect with Ea=0.39 eV, σ = 1⋅10−16 cm2 and a concentration of 5⋅1014 cm−3 in a bulk of SiNWs deeper than 1 μm.
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2013 ◽
Vol 347-350
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pp. 1535-1539
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2011 ◽
Vol 209
(2)
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pp. 369-372
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2003 ◽
Vol 437-438
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pp. 81-84
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