scholarly journals Interface characterization of nanoscale SiOxlayers grown on RF plasma hydrogenated silicon

2016 ◽  
Vol 700 ◽  
pp. 012029
Author(s):  
E Halova ◽  
N Kojuharova ◽  
S Alexandrova ◽  
A Szekeres
Keyword(s):  
Rf Plasma ◽  
Hydrogenated Silicon ◽  
Interface Characterization

Interface Characterization of Immiscible Polymer Blends by Means of XR and NR Investigations

2000 ◽  
Vol 321-324 ◽  
pp. 475-480
Author(s):  
D. Jehnichen ◽  
P. Friedel ◽  
S. Kummer ◽  
L. Häußler ◽  
K. Eckstein ◽  
...  
Keyword(s):  
Polymer Blends ◽  
Immiscible Polymer Blends ◽  
Interface Characterization ◽  
Immiscible Polymer

Surface and Interface Characterization of Asphaltenic Fractions Obtained with Different Alkanes: A Study by Atomic Force Microscopy and Pendant Drop Tensiometry

2018 ◽  
Vol 32 (12) ◽  
pp. 12174-12186 ◽  
Author(s):  
Iago Oliveira ◽  
Larissa Gomes ◽  
Elton Franceschi ◽  
Gustavo Borges ◽  
Juliana F. de Conto ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Pendant Drop ◽  
Force Microscopy ◽  
Interface Characterization ◽  
Surface And Interface ◽  
Atomic Force

Advanced modeling for optical characterization of amorphous hydrogenated silicon films

2013 ◽  
Vol 541 ◽  
pp. 12-16 ◽  
Author(s):  
Daniel Franta ◽  
David Nečas ◽  
Lenka Zajíčková ◽  
Ivan Ohlídal ◽  
Jiří Stuchlík
Keyword(s):  
Optical Characterization ◽  
Silicon Films ◽  
Hydrogenated Silicon ◽  
Amorphous Hydrogenated Silicon
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