scholarly journals Evaluation of imaging plates as recording medium for images of negatively stained single particles and electron diffraction patterns of two-dimensional crystals

Microscopy ◽  
2009 ◽  
Vol 59 (1) ◽  
pp. 53-63 ◽  
Author(s):  
Zongli Li ◽  
Richard K. Hite ◽  
Yifan Cheng ◽  
Thomas Walz
Keyword(s):  
Electron Diffraction ◽  
Two Dimensional ◽  
Recording Medium ◽  
Single Particles ◽  
Diffraction Patterns ◽  
Imaging Plates

On Diffraction Patterns of Structures Containing Regular Crystallographic Shear Planes

1992 ◽  
Vol 45 (9) ◽  
pp. 1397 ◽  
Author(s):  
G Harburn ◽  
BH Parry ◽  
RJD Tilley ◽  
RP Williams
Keyword(s):  
Electron Diffraction ◽  
Fourier Analysis ◽  
Tungsten Trioxide ◽  
Two Dimensional ◽  
Analysis Study ◽  
Shear Structures ◽  
Crystallographic Shear ◽  
Diffraction Patterns ◽  
Special Case ◽  
Shear Planes

The appearances of the diffraction patterns expected for the phases derived from tungsten trioxide by crystallographic shear have been deduced by Fourier analysis. Study of electron- diffraction patterns and optical analogues confirms the predictions of the theory. The results have been generalized to a two-dimensional continuum of 'infinitely adaptive structures' by use of the shift lattice, of which the crystallographic shear structures are a special case.

Accurate lattice-parameter determination from electron diffraction tomography data using two-dimensional diffraction vectors

2018 ◽  
Vol 51 (4) ◽  
pp. 982-989 ◽  
Author(s):  
Jonas Ångström ◽  
Hong Chen ◽  
Wei Wan
Keyword(s):  
Electron Diffraction ◽  
Rotation Axis ◽  
Three Dimensional ◽  
Lattice Parameter ◽  
Parameter Determination ◽  
Data Sets ◽  
Diffraction Tomography ◽  
Two Dimensional ◽  
Lower Accuracy ◽  
Diffraction Patterns

Electron diffraction tomography (EDT) has emerged as a successful tool for ab initio atomic structure determination of nanometre-sized crystals. However, lattice parameters obtained from EDT data are often of lower accuracy than those from powder X-ray data, owing to experimental errors and data-processing methods. This work describes a lattice-parameter refinement method for EDT data using two-dimensional diffraction vectors and shows that the accuracy of lattice-parameter determination can be improved significantly. It is also shown that the method is tolerant to sample displacement during data collection and to geometric distortions in the electron diffraction patterns due to lens imperfections. For the data sets tested, the method reduces the 95% confidence interval of the worst errors in angles from ±1.98 to ±0.82° and the worst relative errors of the unit-cell lengths from ±1.8% to ±1.3%, compared with the conventional method using clustering of three-dimensional diffraction vectors. The improvement is attributed to the fact that the new method makes use of the positions of two-dimensional diffraction spots, which can be determined with high accuracy, and disregards the position of the central beam, the orientation of the rotation axis and the angles of the diffraction frames, whose errors all contribute to the errors for lattice-parameter determination using the three-dimensional method.

A study of the thickness of ferrihydrite coatings on kaolinite

1987 ◽  
Vol 51 (359) ◽  
pp. 87-92 ◽  
Author(s):  
Angela A. Jones ◽  
Adil M. Saleh
Keyword(s):  
Electron Diffraction ◽  
Surface Area ◽  
Single Particles ◽  
Selected Area Electron Diffraction ◽  
Diffraction Patterns

AbstractThe form and thickness of the ferrihydrite coating on kaolinite basal surfaces was studied in mixes containing 1–10% ferrihydrite through a combination of TEM, shadowed replicas, selected area electron diffraction, and determinations of surface area and distribution of charge on the surfaces. At pH3 the ferrihydrite was found to attach initially as single particles to certain sites on the kaolinite. These particles grew laterally and vertically until with 4% ferrihydrite they were aggregates of from 8 to 25 layers of particles. With more ferrihydrite the aggregates coalesced. Despite the irregular cover on the kaolinite satisfactory electron diffraction patterns were obtained and as little as 2% ferrihydrite was detected in a mixture at pH3.

Computer Indexing of Electron Diffraction Patterns Including the Effects of Lattice Symmetry

1977 ◽  
Vol 35 ◽  
pp. 22-23
Author(s):  
J. S. Lally ◽  
R. J. Lee
Keyword(s):  
Electron Diffraction ◽  
Zone Axis ◽  
Crystal Thickness ◽  
Double Diffraction ◽  
Automated Method ◽  
Lattice Symmetry ◽  
Intensity Calculations ◽  
Unknown Structure ◽  
Diffraction Patterns ◽  
Orientation Parameters

In the 50 year period since the discovery of electron diffraction from crystals there has been much theoretical effort devoted to the calculation of diffracted intensities as a function of crystal thickness, orientation, and structure. However, in many applications of electron diffraction what is required is a simple identification of an unknown structure when some of the shape and orientation parameters required for intensity calculations are not known. In these circumstances an automated method is needed to solve diffraction patterns obtained near crystal zone axis directions that includes the effects of systematic absences of reflections due to lattice symmetry effects and additional reflections due to double diffraction processes.Two programs have been developed to enable relatively inexperienced microscopists to identify unknown crystals from diffraction patterns. Before indexing any given electron diffraction pattern, a set of possible crystal structures must be selected for comparison against the unknown.

Electron-diffraction studies in synthetic polymer materials

1983 ◽  
Vol 41 ◽  
pp. 362-365
Author(s):  
D.T. Grubb
Keyword(s):  
Electron Diffraction ◽  
Synthetic Polymer ◽  
Polymer Materials ◽  
Crystallographic Structure ◽  
High Dose ◽  
Electron Dose ◽  
Dose Rates ◽  
First Case ◽  
Diffraction Patterns ◽  
The Many

Diffraction studies in polymeric and other beam sensitive materials may bring to mind the many experiments where diffracted intensity has been used as a measure of the electron dose required to destroy fine structure in the TEM. But this paper is concerned with a range of cases where the diffraction pattern itself contains the important information.In the first case, electron diffraction from paraffins, degraded polyethylene and polyethylene single crystals, all the samples are highly ordered, and their crystallographic structure is well known. The diffraction patterns fade on irradiation and may also change considerably in a-spacing, increasing the unit cell volume on irradiation. The effect is large and continuous far C94H190 paraffin and for PE, while for shorter chains to C 28H58 the change is less, levelling off at high dose, Fig.l. It is also found that the change in a-spacing increases at higher dose rates and at higher irradiation temperatures.

An Interactive Minicomputer Program for the Indexing and Simulation of Electron Diffraction Patterns

1976 ◽  
Vol 34 ◽  
pp. 542-543
Author(s):  
R.P. Goehner ◽  
W.T. Hatfield ◽  
Prakash Rao
Keyword(s):  
Electron Diffraction ◽  
Real Time ◽  
Pattern Analysis ◽  
Flow Diagram ◽  
Hard Copy ◽  
Time Analysis ◽  
Real Time Analysis ◽  
Transmission Electron ◽  
One Step ◽  
Diffraction Patterns

Computer programs are now available in various laboratories for the indexing and simulation of transmission electron diffraction patterns. Although these programs address themselves to the solution of various aspects of the indexing and simulation process, the ultimate goal is to perform real time diffraction pattern analysis directly off of the imaging screen of the transmission electron microscope. The program to be described in this paper represents one step prior to real time analysis. It involves the combination of two programs, described in an earlier paper(l), into a single program for use on an interactive basis with a minicomputer. In our case, the minicomputer is an INTERDATA 70 equipped with a Tektronix 4010-1 graphical display terminal and hard copy unit.A simplified flow diagram of the combined program, written in Fortran IV, is shown in Figure 1. It consists of two programs INDEX and TEDP which index and simulate electron diffraction patterns respectively. The user has the option of choosing either the indexing or simulating aspects of the combined program.

Planar defects in ordered (Ga,In)P

1988 ◽  
Vol 46 ◽  
pp. 902-903
Author(s):  
S. McKernan ◽  
C. B. Carter ◽  
D. Bour ◽  
J. R. Shealy
Keyword(s):  
Electron Diffraction ◽  
Vapor Phase ◽  
Growth Direction ◽  
High Density ◽  
Ordered Structure ◽  
Planar Defects ◽  
Diffraction Patterns ◽  
Ternary Semiconductors ◽  
Anion Species ◽  
Metallic Vapor

The growth of ternary III-V semiconductors by organo-metallic vapor phase epitaxy (OMVPE) is widely practiced. It has been generally assumed that the resulting structure is the same as that of the corresponding binary semiconductors, but with the two different cation or anion species randomly distributed on their appropriate sublattice sites. Recently several different ternary semiconductors including AlxGa1-xAs, Gaxln-1-xAs and Gaxln1-xP1-6 have been observed in ordered states. A common feature of these ordered compounds is that they contain a relatively high density of defects. This is evident in electron diffraction patterns from these materials where streaks, which are typically parallel to the growth direction, are associated with the extra reflections arising from the ordering. However, where the (Ga,ln)P epilayer is reasonably well ordered the streaking is extremely faint, and the intensity of the ordered spot at 1/2(111) is much greater than that at 1/2(111). In these cases it is possible to image relatively clearly many of the defects found in the ordered structure.

Computer Assisted Image Reconstruction of Oligomer Structure

1976 ◽  
Vol 34 ◽  
pp. 472-473
Author(s):  
A.M. Jones ◽  
A. Max Fiskin
Keyword(s):  
Three Dimensional ◽  
Depth Of Field ◽  
Computer Assisted ◽  
Projection Data ◽  
Two Dimensional ◽  
Single Particles ◽  
Dimensional Reconstruction ◽  
Computer Assisted Image ◽  
The Fourier Transform ◽  
Space Approach

If the tilt of a specimen can be varied either by the strategy of observing identical particles orientated randomly or by use of a eucentric goniometer stage, three dimensional reconstruction procedures are available (l). If the specimens, such as small protein aggregates, lack periodicity, direct space methods compete favorably in ease of implementation with reconstruction by the Fourier (transform) space approach (2). Regardless of method, reconstruction is possible because useful specimen thicknesses are always much less than the depth of field in an electron microscope. Thus electron images record the amount of stain in columns of the object normal to the recording plates. For single particles, practical considerations dictate that the specimen be tilted precisely about a single axis. In so doing a reconstructed image is achieved serially from two-dimensional sections which in turn are generated by a series of back-to-front lines of projection data.

Sign in / Sign up

Export Citation Format

Share Document