Atomic force microscopy observation of the enamel roughness and depth profile after phosphoric acid etching
2009 ◽
Vol 59
(2)
◽
pp. 119-125
◽
Keyword(s):
In situ atomic force microscopy observation of hydrogen absorption/desorption by Palladium thin film
2011 ◽
Vol 258
(4)
◽
pp. 1456-1459
◽
1997 ◽
Vol 36
(Part 1, No. 9B)
◽
pp. 5917-5920
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2012 ◽
Vol 1
(3)
◽
pp. 187
◽
2013 ◽
Vol 139
(8)
◽
pp. 085102
◽
2001 ◽
Vol 97-98
◽
pp. 265-268
◽
2003 ◽
Vol 42
(3-4)
◽
pp. 753-760
◽
2002 ◽
Vol 116
(5)
◽
pp. 1753-1756
◽
1996 ◽
Vol 14
(2)
◽
pp. 1153
◽