Contrast enhancement in the phase plate transmission electron microscopy using an objective lens with a long focal length

Microscopy ◽  
2011 ◽  
Vol 60 (5) ◽  
pp. 337-343 ◽  
Author(s):  
Hiroki Minoda ◽  
Tatsuhiro Okabe ◽  
Hirofumi Iijima
Author(s):  
J. M. Pankratz

It is often desirable in transmission electron microscopy to know the vertical spacing of points of interest within a specimen. However, in order to measure a stereo effect, one must have two pictures of the same area taken from different angles, and one must have also a formula for converting measured differences between corresponding points (parallax) into a height differential.Assume (a) that the impinging beam of electrons can be considered as a plane wave and (b) that the magnification is the same at the top and bottom of the specimen. The first assumption is good when the illuminating system is overfocused. The second assumption (the so-called “perspective error”) is good when the focal length is large (3 x 107Å) in relation to foil thickness (∼103 Å).


2012 ◽  
Vol 18 (S2) ◽  
pp. 1138-1139
Author(s):  
Y. Inayoshi ◽  
H. Minoda

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.


2016 ◽  
Vol 18 (5) ◽  
pp. 053005 ◽  
Author(s):  
S Hettler ◽  
M Dries ◽  
J Zeelen ◽  
M Oster ◽  
R R Schröder ◽  
...  

2014 ◽  
Vol 139 ◽  
pp. 29-37 ◽  
Author(s):  
M. Dries ◽  
S. Hettler ◽  
B. Gamm ◽  
E. Müller ◽  
W. Send ◽  
...  

2021 ◽  
Vol 28 (5) ◽  
pp. 1343-1356
Author(s):  
Yue Zhang ◽  
Peng-Han Lu ◽  
Enzo Rotunno ◽  
Filippo Troiani ◽  
J. Paul van Schayck ◽  
...  

Imaging of biomolecules by ionizing radiation, such as electrons, causes radiation damage which introduces structural and compositional changes of the specimen. The total number of high-energy electrons per surface area that can be used for imaging in cryogenic electron microscopy (cryo-EM) is severely restricted due to radiation damage, resulting in low signal-to-noise ratios (SNR). High resolution details are dampened by the transfer function of the microscope and detector, and are the first to be lost as radiation damage alters the individual molecules which are presumed to be identical during averaging. As a consequence, radiation damage puts a limit on the particle size and sample heterogeneity with which electron microscopy (EM) can deal. Since a transmission EM (TEM) image is formed from the scattering process of the electron by the specimen interaction potential, radiation damage is inevitable. However, we can aim to maximize the information transfer for a given dose and increase the SNR by finding alternatives to the conventional phase-contrast cryo-EM techniques. Here some alternative transmission electron microscopy techniques are reviewed, including phase plate, multi-pass transmission electron microscopy, off-axis holography, ptychography and a quantum sorter. Their prospects for providing more or complementary structural information within the limited lifetime of the sample are discussed.


Author(s):  
A. Engel ◽  
J. W. Wiggins ◽  
David Woodruff

Six modes of transmission electron microscopy are compared by a numerical simulation of the image formation assuming perfectly coherent illumination and ignoring the influence of radiation damage and noise. The comparison includes five modes of conventional electron microscopy (CEM): axial bright field, Unwin's phase plate, central stop dark field, tilted-beam dark field and conical illumination dark field, and the annular detector mode of the scanning transmission electron microscope (STEM).


Author(s):  
J. Bihr ◽  
G. Benner ◽  
D. Krahl ◽  
A. Rilk ◽  
E. Weimer

Conventional transmission electron microscopy (CTEM) can be used for high resolution imaging of specimens and for the analysis of minute specimen areas. The capabilities of such an instrument are strongly improved by the integration of an imaging electron energy loss spectrometer. All imaging and diffraction techmques are provided in such an energy filtered transmission electron microscope (EFTEM).In addition to the well-known objective lens for Koehler illumination, the new Zeiss EFTEM features a projective lens system which integrates a new imaging ω-spectrometer comprising four individual magnets and one hexapole corrector Fig.l and Fig. 3 show the design of this microscope.


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