High-resolution Structural Analysis on Ionic-Liquid/Solid Interfaces by Frequency Modulation Atomic Force Microscopy

Microscopy ◽  
2014 ◽  
Vol 63 (suppl 1) ◽  
pp. i10.1-i11
Author(s):  
Takashi Ichii ◽  
Hiroyuki Sugimura
2010 ◽  
Vol 3 (6) ◽  
pp. 065205 ◽  
Author(s):  
Ken-ichi Umeda ◽  
Noriaki Oyabu ◽  
Kei Kobayashi ◽  
Yoshiki Hirata ◽  
Kazumi Matsushige ◽  
...  

2015 ◽  
Vol 17 (10) ◽  
pp. 6794-6800 ◽  
Author(s):  
Yasuyuki Yokota ◽  
Hisaya Hara ◽  
Yusuke Morino ◽  
Ken-ichi Bando ◽  
Akihito Imanishi ◽  
...  

Frequency modulation atomic force microscopy was employed to show a molecularly clean interface between an ionic liquid and a rubrene single crystal for possible applications to electric double-layer field-effect transistors.


2013 ◽  
Vol 49 (90) ◽  
pp. 10596 ◽  
Author(s):  
Yasuyuki Yokota ◽  
Hisaya Hara ◽  
Tomohiro Harada ◽  
Akihito Imanishi ◽  
Takafumi Uemura ◽  
...  

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