Scanning Electron Microscopy on Ion-Etching of Enamel and Dentin

1982 ◽  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Ion Etching ◽  
Scanning Electron

Technique for Visualizing Subgrain Structure at Fatigue Crack Tips by Ion Etching and Scanning Electron Microscopy

1973 ◽  
Vol 31 ◽  
pp. 86-87 ◽  
Author(s):  
G. G. Shaw ◽  
D. K. Benson
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Fatigue Crack ◽  
Single Crystal ◽  
Fatigue Cracks ◽  
Subgrain Structure ◽  
Ion Etching ◽  
Etch Patterns ◽  
Crack Tips ◽  
Scanning Electron

The subgrain structure in ram size areas adjacent to fatigue cracks has been observed by ion etching followed by scanning electron microscopy. The etch patterns have been definitely identified as subgrain structure resulting from the fatigue strains by direct comparison with channelling electron microscopy. The technique is described as it was applied to a single crystal of aluminum which had been fatigued in Stage I by reversed bending.A 5 mm long section of crystal containing the crack was cut from the fatigue sample by spark machining. This section was sliced into pieces 2 to 3 mm thick, and a slice selected with the crack tip close to its center. The selected slice was placed in a shallow aluminum cup about 2 cm in diameter.

Fractographic Studies of Biological Specimens by Scanning Electron Microscopy

1974 ◽  
Vol 32 ◽  
pp. 318-319
Author(s):  
Walter J. Humphreys
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Brine Shrimp ◽  
Dense Body ◽  
Mechanical Deformation ◽  
Structural Components ◽  
Ion Etching ◽  
Artemia Cysts ◽  
Fractured Surface ◽  
Scanning Electron

Some organisms remain viable even after the cytoplasm of their cells is dried out. Naturally dried cysts of the brine shrimp, Artemia, e. g. hatch normally even after further desiccation by weeks of exposure to a vacuum of 10- torr. If such organisms are fractured at the temperature of liquid nitrogen (in order to minimize mechanical deformation) direct viewing of the exposed intracellular cytoplasmic constituents by means of the SEM probably gives a faithful, unaltered picture of this cryptobiotic cytoplasm as it exists in nature. Ion etching the fractured surface can exaggerate physical differences in structural components within intracellular constituents. Certain yolk particles in Artemia cysts e. g. consists of an aggregation of very electron dense particles centered inside a less electron dense body (Fig. 1). These particles are identifiable in fractured yolk bodies (Arrow Fig. 2) but more dramatically so after ion etching (Arrows Fig. 3).

Pathogenesis of Human Hair Defects

1974 ◽  
Vol 32 ◽  
pp. 12-13
Author(s):  
P.S. Porter ◽  
T. Aoyagi ◽  
R. Matta
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Human Hair ◽  
Standard Techniques ◽  
Scanning Electron

Using standard techniques of scanning electron microscopy (SEM), over 1000 human hair defects have been studied. In several of the defects, the pathogenesis of the abnormality has been clarified using these techniques. It is the purpose of this paper to present several distinct morphologic abnormalities of hair and to discuss their pathogenesis as elucidated through techniques of scanning electron microscopy.

Ultrastructural Analysis of the Salivary Glands of Gromphadorhina Portentosa (Schaum)

1977 ◽  
Vol 35 ◽  
pp. 638-639
Author(s):  
P.J. Dailey
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Salivary Glands ◽  
Secretory Vesicles ◽  
The Past ◽  
Transmission Electron ◽  
Means Of Transmission ◽  
Gromphadorhina Portentosa ◽  
Scanning Electron ◽  
Topographical Relief

The structure of insect salivary glands has been extensively investigated during the past decade; however, none have attempted scanning electron microscopy (SEM) in ultrastructural examinations of these secretory organs. This study correlates fine structure by means of SEM cryofractography with that of thin-sectioned epoxy embedded material observed by means of transmission electron microscopy (TEM).Salivary glands of Gromphadorhina portentosa were excised and immediately submerged in cold (4°C) paraformaldehyde-glutaraldehyde fixative1 for 2 hr, washed and post-fixed in 1 per cent 0s04 in phosphosphate buffer (4°C for 2 hr). After ethanolic dehydration half of the samples were embedded in Epon 812 for TEM and half cryofractured and subsequently critical point dried for SEM. Dried specimens were mounted on aluminum stubs and coated with approximately 150 Å of gold in a cold sputtering apparatus.Figure 1 shows a cryofractured plane through a salivary acinus revealing topographical relief of secretory vesicles.

Two- or three-way observations of the identical cell elements within the same sections by LM, TEM and/or SEM

1978 ◽  
Vol 36 (2) ◽  
pp. 82-83 ◽  
Author(s):  
Nakazo Watari ◽  
Yasuaki Hotta ◽  
Yoshio Mabuchi
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Fine Structure ◽  
Light Microscopy ◽  
Thin Sections ◽  
Transmission Electron ◽  
Identical Cell ◽  
Electron Microscopes ◽  
Scanning Electron

It is very useful if we can observe the identical cell elements within the same sections by light microscopy (LM), transmission electron microscopy (TEM) and/or scanning electron microscopy (SEM) sequentially, because, the cell fine structure can not be indicated by LM, while the color is; on the other hand, the cell fine structure can be very easily observed by EM, although its color properties may not. However, there is one problem in that LM requires thick sections of over 1 μm, while EM needs very thin sections of under 100 nm. Recently, we have developed a new method to observe the same cell elements within the same plastic sections using both light and transmission (conventional or high-voltage) electron microscopes.In this paper, we have developed two new observation methods for the identical cell elements within the same sections, both plastic-embedded and paraffin-embedded, using light microscopy, transmission electron microscopy and/or scanning electron microscopy (Fig. 1).

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