Determination Of Energy Profile In Road Cycling Using Experimental Tests In Combination With Computer Assisted Analysis Of Energy Metabolism

The Kossel diffraction technique is well suited for investigating crystal lattices. Progress in digital recording of images opens the opportunity for simplification and improvement of the examination of Kossel patterns. Such patterns can be processed immediately after recording if appropriate computer programs are available. To provide such a tool, a new Windows-based software for computer-assisted analysis of Kossel patterns has been developed. With its easy-to-operate user interface, the program is intended to facilitate refinement of lattice parameters and determination of elastic strains. The refinement is based on matching experimental and geometrically simulated patterns, whereas the strain is obtained by matching Kossel line profiles in similar experimental patterns. The software is capable of simultaneous handling of multiple patterns.

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Computer-Assisted Analysis of Multi-Color Confocal Microscopic Datasets: Automated Light Microscopic Discrimination of Synaptic Relationships

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100163885 ◽

1996 ◽

Vol 54 ◽

pp. 284-285

Author(s):

M Wessendorf ◽

A Beuning ◽

D Cameron ◽

J Williams ◽

C Knox

Keyword(s):

Nerve Fibers ◽

Confocal Scanning Laser Microscopy ◽

Computer Assisted ◽

Nerve Terminals ◽

Neuronal Somata ◽

Scanning Laser Microscopy ◽

Confocal Scanning ◽

Entire Cell ◽

Confocal Scanning Laser ◽

Assisted Analysis

Multi-color confocal scanning-laser microscopy (CSLM) allows examination of the relationships between neuronal somata and the nerve fibers surrounding them at sub-micron resolution in x,y, and z. Given these properties, it should be possible to use multi-color CSLM to identify relationships that might be synapses and eliminate those that are clearly too distant to be synapses. In previous studies of this type, pairs of images (e.g., red and green images for tissue stained with rhodamine and fluorescein) have been merged and examined for nerve terminals that appose a stained cell (see, for instance, Mason et al.). The above method suffers from two disadvantages, though. First, although it is possible to recognize appositions in which the varicosity abuts the cell in the x or y axes, it is more difficult to recognize them if the apposition is oriented at all in the z-axis—e.g., if the varicosity lies above or below the neuron rather than next to it. Second, using this method to identify potential appositions over an entire cell is time-consuming and tedious.

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Computer-Assisted High-Re Solution TEM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100179567 ◽

1990 ◽

Vol 48 (1) ◽

pp. 162-163

Author(s):

F.A. Ponce ◽

H. Hikashi

Keyword(s):

Signal To Noise Ratio ◽

Accurate Determination ◽

Computer Software ◽

Video Camera ◽

Image Contrast ◽

Objective Lens ◽

Computer Assisted ◽

Optical Parameters ◽

Astigmatism Correction

The determination of the atomic positions from HRTEM micrographs is only possible if the optical parameters are known to a certain accuracy, and reliable through-focus series are available to match the experimental images with calculated images of possible atomic models. The main limitation in interpreting images at the atomic level is the knowledge of the optical parameters such as beam alignment, astigmatism correction and defocus value. Under ordinary conditions, the uncertainty in these values is sufficiently large to prevent the accurate determination of the atomic positions. Therefore, in order to achieve the resolution power of the microscope (under 0.2nm) it is necessary to take extraordinary measures. The use of on line computers has been proposed [e.g.: 2-5] and used with certain amount of success.We have built a system that can perform operations in the range of one frame stored and analyzed per second. A schematic diagram of the system is shown in figure 1. A JEOL 4000EX microscope equipped with an external computer interface is directly linked to a SUN-3 computer. All electrical parameters in the microscope can be changed via this interface by the use of a set of commands. The image is received from a video camera. A commercial image processor improves the signal-to-noise ratio by recursively averaging with a time constant, usually set at 0.25 sec. The computer software is based on a multi-window system and is entirely mouse-driven. All operations can be performed by clicking the mouse on the appropiate windows and buttons. This capability leads to extreme friendliness, ease of operation, and high operator speeds. Image analysis can be done in various ways. Here, we have measured the image contrast and used it to optimize certain parameters. The system is designed to have instant access to: (a) x- and y- alignment coils, (b) x- and y- astigmatism correction coils, and (c) objective lens current. The algorithm is shown in figure 2. Figure 3 shows an example taken from a thin CdTe crystal. The image contrast is displayed for changing objective lens current (defocus value). The display is calibrated in angstroms. Images are stored on the disk and are accessible by clicking the data points in the graph. Some of the frame-store images are displayed in Fig. 4.

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