scholarly journals Fine mapping of Ur-3, a historically important rust resistance locus in common bean

2016 ◽  
Author(s):  
O.P. Hurtado-Gonzales ◽  
G. Valentini ◽  
T.A.S Gilio ◽  
A.M. Martins ◽  
Q. Song ◽  
...  

AbstractBean rust is a devastating disease of common bean in the Americas and Africa. The historically important Ur-3 gene confers resistance to many races of the highly variable bean rust pathogen that overcome all known rust resistance genes. Existing molecular markers tagging Ur-3 for use in marker assisted selection produce false results. We described here the fine mapping of Ur-3 for the development of highly accurate markers linked to this gene. An F2 population from Pinto 114 × Aurora was evaluated for its reaction to four different races of the bean rust pathogen. A bulked segregant analysis using the SNP chip BARCBEAN6K_3 positioned the approximate location of the Ur-3 locus to the lower arm of chromosome Pv11. Specific SSR and SNP markers and haplotype analysis of 18 sequenced bean lines led to position the Ur-3 locus to a 46.5 Kb genomic region. We discovered a KASP marker, SS68 that was tightly linked to the Ur-3 locus. Validation of SS68 on a panel of 130 diverse common bean lines and varieties containing all known rust resistance genes revealed that it was highly accurate producing no false results. The SS68 marker will be of great value to pyramid Ur-3 with other rust resistance genes. It will also reduce significantly time and labor associated with the current phenotypic detection of Ur-3. This is the first utilization of fine mapping to discover markers linked to a rust resistance in common bean.

2021 ◽  
Vol 12 ◽  
Author(s):  
Meriem Aoun ◽  
Matthew N. Rouse ◽  
James A. Kolmer ◽  
Ajay Kumar ◽  
Elias M. Elias

Leaf rust, caused by Puccinia triticina (Pt), stripe rust caused by Puccinia striiformis f. sp. tritici (Pst), and stem rust caused by Puccinia graminis f. sp. tritici (Pgt) are major diseases to wheat production globally. Host resistance is the most suitable approach to manage these fungal pathogens. We investigated the phenotypic and genotypic structure of resistance to leaf rust, stem rust, and stripe rust pathogen races at the seedling stage in a collection of advanced durum wheat breeding lines and cultivars adapted to Upper Mid-West region of the United States. Phenotypic evaluation showed that the majority of the durum wheat genotypes were susceptible to Pt isolates adapted to durum wheat, whereas all the genotypes were resistant to common wheat type-Pt isolate. The majority of genotypes were resistant to stripe rust and stem rust pathogen races. The durum panel genotyped using Illumina iSelect 90 K wheat SNP assay was used for genome-wide association mapping (GWAS). The GWAS revealed 64 marker-trait associations (MTAs) representing six leaf rust resistance loci located on chromosome arms 2AS, 2AL, 5BS, 6AL, and 6BL. Two of these loci were identified at the positions of Lr52 and Lr64 genes, whereas the remaining loci are most likely novel. A total of 46 MTAs corresponding to four loci located on chromosome arms 1BS, 5BL, and 7BL were associated with stripe rust response. None of these loci correspond to designated stripe rust resistance genes. For stem rust, a total of 260 MTAs, representing 22 loci were identified on chromosome arms 1BL, 2BL, 3AL, 3BL, 4AL, 5AL, 5BL, 6AS, 6AL, 6BL, and 7BL. Four of these loci were located at the positions of known genes/alleles (Sr7b, Sr8155B1, Sr13a, and Sr13b). The discovery of known and novel rust resistance genes and their linked SNPs will help diversify rust resistance in durum wheat.


Euphytica ◽  
2014 ◽  
Vol 199 (3) ◽  
pp. 303-316 ◽  
Author(s):  
Thiago Lívio P. O. Souza ◽  
Vilmar A. Ragagnin ◽  
Suelen N. Dessaune ◽  
Demerson A. Sanglard ◽  
José Eustáquio S. Carneiro ◽  
...  

2016 ◽  
Vol 130 (3) ◽  
pp. 495-504 ◽  
Author(s):  
Naeela Qureshi ◽  
Harbans Bariana ◽  
Kerrie Forrest ◽  
Matthew Hayden ◽  
Beat Keller ◽  
...  

2019 ◽  
Vol 132 (5) ◽  
pp. 1473-1485 ◽  
Author(s):  
Deepika Narang ◽  
Satinder Kaur ◽  
Burkhard Steuernagel ◽  
Sreya Ghosh ◽  
Roopan Dhillon ◽  
...  

2016 ◽  
Vol 7 (2) ◽  
pp. 557-569 ◽  
Author(s):  
Oscar P. Hurtado-Gonzales ◽  
Giseli Valentini ◽  
Thiago A. S. Gilio ◽  
Alexandre M. Martins ◽  
Qijian Song ◽  
...  

Crop Science ◽  
2000 ◽  
Vol 40 (3) ◽  
pp. 804-807 ◽  
Author(s):  
Ronan Xavier Corr e ˆ a ◽  
M. R. Costa ◽  
P. I. Good-God ◽  
V. A. Ragagnin ◽  
F. G. Faleiro ◽  
...  

Genes ◽  
2019 ◽  
Vol 11 (1) ◽  
pp. 10
Author(s):  
Lili Qi ◽  
Guojia Ma

Rust caused by the fungus Puccinia helianthi and downy mildew (DM) caused by the obligate pathogen Plasmopara halstedii are two of the most globally important sunflower diseases. Resistance to rust and DM is controlled by race-specific single dominant genes. The present study aimed at pyramiding rust resistance genes combined with a DM resistance gene, using molecular markers. Four rust resistant lines, HA-R3 (carrying the R4 gene), HA-R2 (R5), HA-R8 (R15), and RHA 397 (R13b), were each crossed with a common line, RHA 464, carrying a rust gene R12 and a DM gene PlArg. An additional cross was made between HA-R8 and RHA 397. Co-dominant simple sequence repeat (SSR) and single nucleotide polymorphism (SNP) markers linked to the target genes were used to discriminate between homozygotes and heterozygotes in F2 populations. Five pyramids with different combinations of rust resistance genes were selected in the homozygous condition through marker-assisted selection, and three of them were combined with a DM resistance gene PlArg: R4/R12/PlArg, R5/R12/PlArg, R13b/R12/PlArg, R15/R12, and R13b/R15. The pyramiding lines with the stacking of two rust and one DM genes were resistant to all known races of North American sunflower rust and all known races of the pathogen causing DM, potentially providing multiple and durable resistance to both rust and DM. A cluster of 12 SNP markers spanning a region of 34.5 Mb on chromosome 1, which co-segregate with PlArg, were tested in four populations. Use of those markers, located in a recombination suppressed region in marker selection, is discussed.


2000 ◽  
Vol 23 (2) ◽  
pp. 399-402 ◽  
Author(s):  
Fábio Gelape Faleiro ◽  
Wender Santos Vinhadelli ◽  
Vilmar Antonio Ragagnin ◽  
Ronan Xavier Corrêa ◽  
Maurilio Alves Moreira ◽  
...  

Rust, caused by the fungus Uromyces appendiculatus, may cause a significant loss to common bean (Phaseolus vulgaris L.) yield. RAPD markers tightly linked to the resistance genes may be used in breeding programs to aid the development of rust-resistant bean cultivars. In this sense, the objective of the present work was to identify RAPD markers linked to a rust resistance gene block present in the cultivar Ouro Negro. Two hundred and fourteen F2 individuals from a cross between the resistant cultivar Ouro Negro and the susceptible cultivar US Pinto 111 were inoculated with a mixture of eight races of U. appendiculatus. The segregation ratio obtained suggested that resistance is monogenic and dominant. Bulked segregant analysis was used in conjunction with the RAPD technique to search for markers linked to rust resistance genes. Two molecular markers flanking the rust resistance gene block were identified, one at 5.8 ± 1.6 cM (OX11(630)) and the other at 7.7 ± 1.7 cM (OF10(1,050)) of the gene. Simulated indirect selection efficiency in the F2 population using the two markers was 100%. The molecular markers identified in this work are currently being used for the selection of disease-resistant plants in the commom bean breeding program of the Federal University of Viçosa.


Sign in / Sign up

Export Citation Format

Share Document