scholarly journals Marker-Assisted Gene Pyramiding and the Reliability of Using SNP Markers Located in the Recombination Suppressed Regions of Sunflower (Helianthus annuus L.)

Genes ◽  
2019 ◽  
Vol 11 (1) ◽  
pp. 10
Author(s):  
Lili Qi ◽  
Guojia Ma

Rust caused by the fungus Puccinia helianthi and downy mildew (DM) caused by the obligate pathogen Plasmopara halstedii are two of the most globally important sunflower diseases. Resistance to rust and DM is controlled by race-specific single dominant genes. The present study aimed at pyramiding rust resistance genes combined with a DM resistance gene, using molecular markers. Four rust resistant lines, HA-R3 (carrying the R4 gene), HA-R2 (R5), HA-R8 (R15), and RHA 397 (R13b), were each crossed with a common line, RHA 464, carrying a rust gene R12 and a DM gene PlArg. An additional cross was made between HA-R8 and RHA 397. Co-dominant simple sequence repeat (SSR) and single nucleotide polymorphism (SNP) markers linked to the target genes were used to discriminate between homozygotes and heterozygotes in F2 populations. Five pyramids with different combinations of rust resistance genes were selected in the homozygous condition through marker-assisted selection, and three of them were combined with a DM resistance gene PlArg: R4/R12/PlArg, R5/R12/PlArg, R13b/R12/PlArg, R15/R12, and R13b/R15. The pyramiding lines with the stacking of two rust and one DM genes were resistant to all known races of North American sunflower rust and all known races of the pathogen causing DM, potentially providing multiple and durable resistance to both rust and DM. A cluster of 12 SNP markers spanning a region of 34.5 Mb on chromosome 1, which co-segregate with PlArg, were tested in four populations. Use of those markers, located in a recombination suppressed region in marker selection, is discussed.

2003 ◽  
Vol 93 (7) ◽  
pp. 784-789 ◽  
Author(s):  
G. L. Brown-Guedira ◽  
S. Singh ◽  
A. K. Fritz

Host plant resistance is an economical and environmentally sound method of control of leaf rust caused by the fungus Puccinia triticina, which is one of the most serious diseases of wheat (Triticum aestivum) worldwide. Wild relatives of wheat, including the tetraploid T. timopheevii subsp. armeniacum, represent an important source of genes for resistance to leaf rust. The objectives of this study were to (i) evaluate the performance of leaf rust resistance genes previously transferred to wheat from three accessions of T. timopheevii subsp. armeniacum, (ii) determine inheritance and allelic relationship of the new leaf rust resistance genes, and (iii) determine the genetic map location of one of the T. timopheevii subsp. armeniacum-derived genes using microsatellite markers. The leaf rust resistance gene transferred to hexaploid wheat from accession TA 28 of T. timopheevii subsp. armeniacum exhibited slightly different infection types (ITs) to diverse races of leaf rust in inoculated tests of seedlings compared with the gene transferred from TA 870 and TA 874. High ITs were exhibited when seedlings of all the germ plasm lines were inoculated with P. triticina races MBRL and PNMQ. However, low ITs were observed on adult plants of all lines having the T. timopheevii subsp. armeniacum-derived genes for resistance in the field at locations in Kansas and Texas. Analysis of crosses between resistant germ plasm lines showed that accessions TA 870 and TA 874 donated the same gene for resistance to leaf rust and TA 28 donated an independent resistance gene. The gene donated to germ plasm line KS96WGRC36 from TA 870 of T. timopheevii subsp. armeniacum was linked to microsatellite markers Xgwm382 (6.7 cM) and Xgdm87 (9.4 cM) on wheat chromosome arm 2B long. This new leaf rust resistance gene is designated Lr50. It is the first named gene for leaf rust resistance transferred from wild timopheevi wheat and is the only Lr gene located on the long arm of wheat homoeologous group 2 chromosomes.


2016 ◽  
Author(s):  
O.P. Hurtado-Gonzales ◽  
G. Valentini ◽  
T.A.S Gilio ◽  
A.M. Martins ◽  
Q. Song ◽  
...  

AbstractBean rust is a devastating disease of common bean in the Americas and Africa. The historically important Ur-3 gene confers resistance to many races of the highly variable bean rust pathogen that overcome all known rust resistance genes. Existing molecular markers tagging Ur-3 for use in marker assisted selection produce false results. We described here the fine mapping of Ur-3 for the development of highly accurate markers linked to this gene. An F2 population from Pinto 114 × Aurora was evaluated for its reaction to four different races of the bean rust pathogen. A bulked segregant analysis using the SNP chip BARCBEAN6K_3 positioned the approximate location of the Ur-3 locus to the lower arm of chromosome Pv11. Specific SSR and SNP markers and haplotype analysis of 18 sequenced bean lines led to position the Ur-3 locus to a 46.5 Kb genomic region. We discovered a KASP marker, SS68 that was tightly linked to the Ur-3 locus. Validation of SS68 on a panel of 130 diverse common bean lines and varieties containing all known rust resistance genes revealed that it was highly accurate producing no false results. The SS68 marker will be of great value to pyramid Ur-3 with other rust resistance genes. It will also reduce significantly time and labor associated with the current phenotypic detection of Ur-3. This is the first utilization of fine mapping to discover markers linked to a rust resistance in common bean.


Plant Disease ◽  
2006 ◽  
Vol 90 (10) ◽  
pp. 1302-1312 ◽  
Author(s):  
Z. F. Li ◽  
X. C. Xia ◽  
X. C. Zhou ◽  
Y. C. Niu ◽  
Z. H. He ◽  
...  

Identification of seedling and slow stripe rust resistance genes is important for gene pyramiding, gene deployment, and developing slow-rusting wheat cultivars to control the disease. A total of 98 Chinese lines were inoculated with 26 pathotypes of Puccinia striiformis f. sp. tritici for postulation of stripe rust resistance genes effective at the seedling stage. A total of 135 wheat lines were planted at two locations to characterize their slow rusting responses to stripe rust in the 2003-2004 and 2004-2005 cropping seasons. Genes Yr2, Yr3a, Yr4a, Yr6, Yr7, Yr9, Yr26, Yr27, and YrSD, either singly or in combinations, were postulated in 72 lines, whereas known resistance genes were not identified in the other 26 accessions. The resistance genes Yr9 and Yr26 were found in 42 and 19 accessions, respectively. Yr3a and Yr4a were detected in two lines, and four lines may contain Yr6. Three lines were postulated to possess YrSD, one carried Yr27, and one may possess Yr7. Thirty-three lines showed slow stripe rusting resistance at two locations in both seasons.


Genome ◽  
2002 ◽  
Vol 45 (1) ◽  
pp. 100-109 ◽  
Author(s):  
Davis W Cheng ◽  
Ken C Armstrong ◽  
Nick Tinker ◽  
Charlene P Wight ◽  
Shan He ◽  
...  

Oat receptor-like kinase gene sequences, homologous to the Lrk10 gene from wheat (Triticum aestivum L.), were mapped in oat (Avena sativa L.). PCR primers designed from the wheat Lrk10 were used to produce ALrk10 from oat. Two DNA sequences, ALrk1A1 and ALrk4A5, were produced from primers designed from coding and non-coding regions of ALrk10. Their use as RFLP probes indicated that the kinase genes mapped to four loci on different hexaploid oat 'Kanota' × 'Ogle' linkage groups (4_12, 5, 6, and 13) and to a fifth locus unlinked to other markers. Three of these linkage groups contain a region homologous to the short arm of chromosome 1 of wheat and the fourth contains a region homologous to chromosome 3 of wheat. Analysis with several nullisomics of oat indicated that two of the map locations are on satellite chromosomes. RFLP mapping in a 'Dumont' × 'OT328' population indicated that one map location is closely linked to Pg9, a resistance gene to oat stem rust (Puccinia graminis subsp. avenae). Comparative mapping indicates this to be the region of a presumed cluster of crown rust (Puccinia coronata subsp. avenae) and stem rust resistance genes (Pg3, Pg9, Pc44, Pc46, Pc50, Pc68, Pc95, and PcX). The map position of several RGAs located on KO6 and KO3_38 with respect to Lrk10 and storage protein genes are also reported.Key words: oat, rust resistance genes, molecular markers, comparative mapping, chromosomal location.


2021 ◽  
Vol 12 ◽  
Author(s):  
Achla Sharma ◽  
Puja Srivastava ◽  
G. S. Mavi ◽  
Satinder Kaur ◽  
Jaspal Kaur ◽  
...  

Wheat variety PBW343, released in India in 1995, became the most widely grown cultivar in the country by the year 2000 owing to its wide adaptability and yield potential. It initially succumbed to leaf rust, and resistance genes Lr24 and Lr28 were transferred to PBW343. After an unbroken reign of about 10 years, the virulence against gene Yr27 made PBW343 susceptible to stripe rust. Owing to its wide adaptability and yield potential, PBW343 became the prime target for marker-assisted introgression of stripe rust resistance genes. The leaf rust-resistant versions formed the base for pyramiding stripe rust resistance genes Yr5, Yr10, Yr15, Yr17, and Yr70, in different introgression programs. Advanced breeding lines with different gene combinations, PBW665, PBW683, PBW698, and PBW703 were tested in national trials but could not be released as varieties. The genes from alien segments, Aegilops ventricosa (Lr37/Yr17/Sr38) and Aegilops umbellulata (Lr76/Yr70), were later pyramided in PBW343. Modified marker-assisted backcross breeding was performed, and 81.57% of the genetic background was recovered in one of the selected derivative lines, PBW723. This line was evaluated in coordinated national trials and was released for cultivation under timely sown irrigated conditions in the North Western Plain Zone of India. PBW723 yields an average of 58.0 qtl/ha in Punjab with high potential yields. The genes incorporated are susceptible to stripe rust individually, but PBW723 with both genes showed enhanced resistance. Three years post-release, PBW723 occupies approximately 8–9% of the cultivated area in the Punjab state. A regular inflow of diverse resistant genes, their rapid mobilization to most productive backgrounds, and keeping a close eye on pathogen evolution is essential to protect the overall progress for productivity and resistance in wheat breeding, thus helping breeders to keep pace with pathogen evolution.


2011 ◽  
Vol 101 (2) ◽  
pp. 241-249 ◽  
Author(s):  
Lili Qi ◽  
Tom Gulya ◽  
Gerald J. Seiler ◽  
Brent S. Hulke ◽  
Brady A. Vick

Sunflower rust, caused by Puccinia helianthi, is a prevalent disease in many countries throughout the world. The U.S. Department of Agriculture (USDA)-Agricultural Research Service, Sunflower Research Unit has released rust resistant breeding materials for several decades. However, constantly coevolving rust populations have formed new virulent races to which current hybrids have little resistance. The objectives of this study were to identify resistance to race 336, the predominant race in North America, and to race 777, the most virulent race currently known, and to validate molecular markers known to be linked to rust resistance genes in the sunflower gene pool. A total of 104 entries, including 66 released USDA inbred lines, 14 USDA interspecific germplasm lines, and 24 foreign germplasms, all developed specifically for rust resistance, were tested for their reaction to races 336 and 777. Only 13 of the 104 entries tested were resistant to both races, whereas another six were resistant only to race 336. The interspecific germplasm line, Rf ANN-1742, was resistant to both races and was identified as a new rust resistance source. A selection of 24 lines including 19 lines resistant to races 777 and/or 336 was screened with DNA markers linked to rust resistance genes R1, R2, R4u, and R5. The results indicated that the existing resistant lines are diverse in rust resistance genes. Durable genetic resistance through gene pyramiding will be effective for the control of rust.


2010 ◽  
Vol 36 (1) ◽  
pp. 109-114 ◽  
Author(s):  
Hong ZHANG ◽  
Zhi-Long REN ◽  
Yin-Gang HU ◽  
Chang-You WANG ◽  
Wan-Quan JI

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