scholarly journals Three Essential Resources to Improve Differential Scanning Fluorimetry (DSF) Experiments

Author(s):  
Taia Wu ◽  
Joshua Yu ◽  
Zachary Gale-Day ◽  
Amanda Woo ◽  
Arundhati Suresh ◽  
...  

AbstractDifferential Scanning Fluorimetry (DSF) is a method that enables rapid determination of a protein’s apparent melting temperature (Tma). Owing to its high throughput, DSF has found widespread application in fields ranging from structural biology to chemical screening. Yet DSF has developed two opposing reputations: one as an indispensable laboratory tool to probe protein stability, another as a frustrating platform that often fails. Here, we aim to reconcile these disparate reputations and help users perform more successful DSF experiments with three resources: an updated, interactive theoretical framework, practical tips, and online data analysis. We anticipate that these resources, made available online at DSFworld (https://gestwickilab.shinyapps.io/dsfworld/), will broaden the utility of DSF.

2013 ◽  
Vol 8 (1) ◽  
pp. 48-53 ◽  
Author(s):  
Everaldo Attard

AbstractSeveral methods have been described for the determination of phenolic compounds in animal and plant products using the Folin-Ciocalteu (FC) assay. Most of these methods describe the use of this reagent and sodium carbonate in spectrophotometric methods. The macro FC assay was compared with two micro FC assays carried out on a microplate reader. Excellent correlation was obtained among the three assays with a molar extinction coefficient of 5.228±0.187x103 M−1 cm−1. The micro assay may serve as a high throughput method for the rapid determination of polyphenols in various samples.


2014 ◽  
Vol 5 (11) ◽  
pp. 4278-4282 ◽  
Author(s):  
P. Metola ◽  
S. M. Nichols ◽  
B. Kahr ◽  
E. V. Anslyn

A novel circular dichroism spectropolarimeter is evaluated for high throughput determination of ee% of a series of chiral primary amines.


RSC Advances ◽  
2012 ◽  
Vol 2 (31) ◽  
pp. 11892 ◽  
Author(s):  
Morgane J. J. Moreau ◽  
Isabelle Morin ◽  
Samuel. P. Askin ◽  
Alanna Cooper ◽  
Nicole J. Moreland ◽  
...  

Author(s):  
T. Y. Tan ◽  
W. K. Tice

In studying ion implanted semiconductors and fast neutron irradiated metals, the need for characterizing small dislocation loops having diameters of a few hundred angstrom units usually arises. The weak beam imaging method is a powerful technique for analyzing these loops. Because of the large reduction in stacking fault (SF) fringe spacing at large sg, this method allows for a rapid determination of whether the loop is faulted, and, hence, whether it is a perfect or a Frank partial loop. This method was first used by Bicknell to image small faulted loops in boron implanted silicon. He explained the fringe spacing by kinematical theory, i.e., ≃l/(Sg) in the fault fringe in depth oscillation. The fault image contrast formation mechanism is, however, really more complicated.


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