Slow-electron elastic scattering on argon

1982 ◽  
Vol 25 (1) ◽  
pp. 219-225 ◽  
Author(s):  
M. Ya. Amusia ◽  
N. A. Cherepkov ◽  
L. V. Chernysheva ◽  
Dragomir M. Davidović ◽  
Vojislav Radojević
Keyword(s):  
Elastic Scattering ◽  
Slow Electron

scholarly journals Time Delay in Electron Collision with a Spherical Target as a Function of the Scattering Angle

Atoms ◽  
2021 ◽  
Vol 9 (4) ◽  
pp. 105
Author(s):  
Miron Ya. Amusia ◽  
Arkadiy S. Baltenkov ◽  
Igor Woiciechowski
Keyword(s):  
Time Delay ◽  
Elastic Scattering ◽  
Hard Sphere ◽  
Time Delays ◽  
Electron Collision ◽  
Potential Fields ◽  
Slow Electron ◽  
Potential Well ◽  
Spherical Target ◽  
Slow Electrons

We have studied the angular time delay in slow-electron elastic scattering by spherical targets as well as the average time delay of electrons in this process. It is demonstrated how the angular time delay is connected to the Eisenbud–Wigner–Smith (EWS) time delay. The specific features of both angular and energy dependencies of these time delays are discussed in detail. The potentialities of the derived general formulas are illustrated by the numerical calculations of the time delays of slow electrons in the potential fields of both absolutely hard-sphere and delta-shell potential well of the same radius. The conducted studies shed more light on the specific features of these time delays.

scholarly journals Elastic scattering of slow electrons by carbon nanotubes

2021 ◽  
Author(s):  
Miron Ya. Amusia ◽  
Arkadiy S Baltenkov
Keyword(s):  
Carbon Nanotubes ◽  
Elastic Scattering ◽  
Cross Sections ◽  
Angular Distributions ◽  
Slow Electron ◽  
Scattering Cross ◽  
Angular Momenta ◽  
Incoming Electron ◽  
Slow Electrons ◽  
Scattering Cross Sections

Abstract In this paper we calculate the elastic scattering cross sections of slow electron by carbon nanotubes. The corresponding electron-nanotube interaction is substituted by a zero-thickness cylindrical potential that neglects the atomic structure of real nanotubes, thus limiting the range of applicability of our approach to sufficiently low incoming electron energies. The strength of the potential is chosen the same that was used in describing scattering of electrons by fullerene C60. We present results for total and partial electron scattering cross sections as well as respective angular distributions, all with account of five lowest angular momenta contributions. In the calculations we assumed that the incoming electron moves perpendicular to the nanotube axis, since along the axis the incoming electron moves freely.

Momentum transfer cross sections for slow electron elastic scattering on Ca, Sr and Ba atoms

1992 ◽  
Vol 164 (1) ◽  
pp. 73-82 ◽  
Author(s):  
C.F. Cribakin ◽  
B.V. Gul'tsev ◽  
V.K. Ivanov ◽  
M.Yu. Kuchiev ◽  
A.R. Tančić
Keyword(s):  
Elastic Scattering ◽  
Momentum Transfer ◽  
Cross Sections ◽  
Slow Electron

Elastic Scattering in Electron Microscopy

1973 ◽  
Vol 31 ◽  
pp. 252-253
Author(s):  
J. Langmore ◽  
M. Isaacson ◽  
J. Wall ◽  
A. V. Crewe
Keyword(s):  
Electron Microscopy ◽  
Elastic Scattering ◽  
Cross Section ◽  
Quantum Noise ◽  
Dark Field ◽  
Elastic Cross Section ◽  
Biological Molecules ◽  
Dark Field Microscopy ◽  
Field Systems ◽  
Effects Of Radiation

High resolution dark field microscopy is becoming an important tool for the investigation of unstained and specifically stained biological molecules. Of primary consideration to the microscopist is the interpretation of image Intensities and the effects of radiation damage to the specimen. Ignoring inelastic scattering, the image intensity is directly related to the collected elastic scattering cross section, σɳ, which is the product of the total elastic cross section, σ and the eficiency of the microscope system at imaging these electrons, η. The number of potentially bond damaging events resulting from the beam exposure required to reduce the effect of quantum noise in the image to a given level is proportional to 1/η. We wish to compare η in three dark field systems.

The Resolution and Contrast in Biological Sections Determined by Inelastic and Elastic Scattering

1973 ◽  
Vol 31 ◽  
pp. 224-225
Author(s):  
D. L. Misell
Keyword(s):  
Electron Microscopy ◽  
Adverse Effect ◽  
Elastic Scattering ◽  
Inelastic Scattering ◽  
Amorphous Carbon ◽  
Polymeric Materials ◽  
Chromatic Aberration ◽  
Image Resolution ◽  
Quantitative Estimates ◽  
Elastic Ratio

In the electron microscopy of biological sections the adverse effect of chromatic aberration on image resolution is well known. In this paper calculations are presented for the inelastic and elastic image intensities using a wave-optical formulation. Quantitative estimates of the deterioration in image resolution as a result of chromatic aberration are presented as an alternative to geometric calculations. The predominance of inelastic scattering in the unstained biological and polymeric materials is shown by the inelastic to elastic ratio, I/E, within an objective aperture of 0.005 rad for amorphous carbon of a thickness, t=50nm, typical of biological sections; E=200keV, I/E=16.

A New Image Processing Technique for STEM

1974 ◽  
Vol 32 ◽  
pp. 432-433
Author(s):  
Yasushi Kokubo ◽  
Hirotami Koike ◽  
Teruo Someya
Keyword(s):  
Electron Microscopy ◽  
Image Processing ◽  
Scanning Electron Microscopy ◽  
Elastic Scattering ◽  
Field Emission ◽  
Processing Technique ◽  
Image Processing Technique ◽  
Energy Analyzer ◽  
Scanning Microscope ◽  
Scanning Electron

One of the advantages of scanning electron microscopy is the capability for processing the image contrast, i.e., the image processing technique. Crewe et al were the first to apply this technique to a field emission scanning microscope and show images of individual atoms. They obtained a contrast which depended exclusively on the atomic numbers of specimen elements (Zcontrast), by displaying the images treated with the intensity ratio of elastically scattered to inelastically scattered electrons. The elastic scattering electrons were extracted by a solid detector and inelastic scattering electrons by an energy analyzer. We noted, however, that there is a possibility of the same contrast being obtained only by using an annular-type solid detector consisting of multiple concentric detector elements.

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