Real-time spectroscopic ellipsometry studies of the nucleation and grain growth processes in microcrystalline silicon thin films

2001 ◽  
Vol 63 (11) ◽  
Author(s):  
Hiroyuki Fujiwara ◽  
Michio Kondo ◽  
Akihisa Matsuda
2012 ◽  
Vol 61 (3) ◽  
pp. 036802
Author(s):  
Li Xin-Li ◽  
Gu Jin-Hua ◽  
Gao Hai-Bo ◽  
Chen Yong-Sheng ◽  
Gao Xiao-Yong ◽  
...  

2002 ◽  
Vol 92 (5) ◽  
pp. 2467-2474 ◽  
Author(s):  
T. D. Kang ◽  
Hosun Lee ◽  
S. J. Park ◽  
J. Jang ◽  
Soonil Lee

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