Electronics for SPring-8 X-ray beam monitors

1998 ◽  
Vol 5 (3) ◽  
pp. 630-631 ◽  
Author(s):  
Togo Kudo ◽  
Hideki Aoyagi ◽  
Hideaki Shiwaku ◽  
Yoshiharu Sakurai ◽  
Hideo Kitamura
Keyword(s):  
Processing System ◽  
Measuring System ◽  
Signal Processing System ◽  
Beam Position ◽  
X Ray ◽  
Current Voltage ◽  
Highly Sensitive ◽  
Position Data ◽  
Current Measuring ◽  
A Current

A sensitive current-measuring system is required to construct a highly sensitive X-ray beam-position monitor (XBPM). A current–voltage converter (I/V) which can measure currents between 0.1 nA and 10 mA was designed, and the signal processing system of the XBPM was constucted using this I/V. This system was used in beamline commissioning. Beam-position data standard deviations of σ ≃ 3 µm for the bending-magnet beamline, and σ x ≃ 3 µm and σ y ≃ 1 µm for the insertion-device beamline were obtained during the beamline commissioning.

Morphology and I-V Characteristics of Electrochemically Deposited Zinc Oxide on Silicon

2021 ◽  
Vol 20 (3) ◽  
pp. 32-36
Author(s):  
Ahmad Bukhairi Md Rashid ◽  
Mastura Shafinaz Zainal Abidin ◽  
Shaharin Fadzli Abd Rahman ◽  
Amirjan Nawabjan
Keyword(s):  
Zinc Oxide ◽  
Electrochemical Deposition ◽  
Dark Current ◽  
Room Temperature ◽  
Volume Ratio ◽  
Deposition Process ◽  
X Ray ◽  
Current Voltage ◽  
Electrochemically Deposited ◽  
A Current

This paper reported on the electrochemical deposition of zinc oxide (ZnO) on p-silicon (p-Si) (100) substrate in the mixture of 0.1 M of zinc chloride (ZnCl2) and potassium chloride (KCl) electrolyte at a volume ratio of 1:1, 3:1 and 5:1 namely Sample A, B and C. The deposition process was done in room temperature with a current density of 10 mA/cm2 for 30 minutes. Prior to the experiment, all samples were treated by RCA cleaning steps. All samples were characterized using scanning electron microscopy (SEM) and energy dispersive X-ray (EDX). The results show that all samples have the same morphology of a flake-like structure with different Zn:O ratio that were 2.81, 2.35 and 2.49 for samples A, B and C. The current-voltage (I-V) characteristic graph was obtained by dark current measurement using Keithley SMU 2400 and the threshold voltage (Vth) values were determined at 2.21 V, 0.85 V and 1.22 V for sample A, B and C respectively which correspond with the Zn:O ratio where the highest value of Zn:O ratio can be found in sample A and the lowest in sample B. Based on these results, it shows that electrochemical deposition technique is capable of being used to deposit the flake-like structure ZnO on semiconductor material to form the p-n junction which behaves like a diode. The value of Vth seems to be depended on the ratio between Zn and O. Higher ratio of Zn and O will cause the higher value of intrinsic carrier concentration and built in potential which will increase the Vth value.

Cavity Beam Position Monitor Test System Based on Virtual Instrument

2013 ◽  
Vol 333-335 ◽  
pp. 2354-2357
Author(s):  
Bao Peng Wang ◽  
Yong Bin Leng ◽  
Wei Min Zhou ◽  
Lu Yang Yu ◽  
Ying Bing Yan
Keyword(s):  
Virtual Instrument ◽  
Processing System ◽  
Test System ◽  
Beam Position Monitor ◽  
Signal Processing System ◽  
Beam Position ◽  
Instrument Control ◽  
Instrument Technology ◽  
Soft Architecture ◽  
Cavity Beam Position Monitor

Based on the virtual instrument technology, a dedicated test system has been developed for cavity beam position monitor (CBPM). The system consists of commercial nanopositioning stage and its controller, the analog output DAQ card based on PXI and network analyzer. In the LABVIEW environment, software which implemented function of instrument control and data acquisition based on virtual instrument soft architecture (VISA) has been developed. Experimental results illustrated that the test system achieved positioning precision of sub micron which meets requirement of test of CBPM. Also it could serve CBPM signal processing system.

scholarly journals Real-time brain activity measurement and signal processing system using highly sensitive MI sensor

AIP Advances ◽  
2017 ◽  
Vol 7 (5) ◽  
pp. 056635 ◽  
Author(s):  
Kewang Wang ◽  
Changmei Cai ◽  
Michiharu Yamamoto ◽  
Tsuyoshi Uchiyama
Keyword(s):  
Signal Processing ◽  
Real Time ◽  
Brain Activity ◽  
Processing System ◽  
Activity Measurement ◽  
Signal Processing System ◽  
Highly Sensitive

scholarly journals Design and Implementation of a Novel Measuring Scheme for Fiber Interferometer Based Sensors

Sensors ◽  
2019 ◽  
Vol 19 (19) ◽  
pp. 4080 ◽  
Author(s):  
Chao-Tsung Ma ◽  
Cheng-Ling Lee ◽  
Yan-Wun You
Keyword(s):  
Electromagnetic Interference ◽  
Processing System ◽  
Optical Power ◽  
Measuring System ◽  
Physical Parameters ◽  
Long Distance ◽  
Signal Processing System ◽  
Practical Applications ◽  
Interference Spectrum ◽  
Measuring Scheme

This paper presents a novel measuring scheme for fiber interferometer (FI) based sensors. With the advantages of being small sizes, having high sensitivity, a simple structure, good durability, being easy to integrate fiber optic communication and having immunity to electromagnetic interference (EMI), FI based sensing devices are suitable for monitoring remote system states or variations in physical parameters. However, the sensing mechanism for the interference spectrum shift of FI based sensors requires expensive equipment, such as a broadband light source (BLS) and an optical spectrum analyzer (OSA). This has strongly handicapped their wide application in practice. To solve this problem, we have, for the first time, proposed a smart measuring scheme, in which a commercial laser diode (LD) and a photodetector (PD) are used to detect the equivalent changes of optical power corresponding to the variation in measuring parameters, and a signal processing system is used to analyze the optical power changes and to determine the spectrum shifts. To demonstrate the proposed scheme, a sensing device on polymer microcavity fiber Fizeau interferometer (PMCFFI) is taken as an example for constructing a measuring system capable of long-distance monitoring of the temperature and relative humidity. In this paper, theoretical analysis and fundamental tests have been carried out. Typical results are presented to verify the feasibility and effectiveness of the proposed measuring scheme, smartly converting the interference spectrum shifts of an FI sensing device into the corresponding variations of voltage signals. With many attractive features, e.g., simplicity, low cost, and reliable remote-monitoring, the proposed scheme is very suitable for practical applications.

scholarly journals Operation of X-ray gas monitors at the European XFEL

2019 ◽  
Vol 26 (4) ◽  
pp. 1045-1051 ◽  
Author(s):  
Theophilos Maltezopoulos ◽  
Florian Dietrich ◽  
Wolfgang Freund ◽  
Ulf Fini Jastrow ◽  
Andreas Koch ◽  
...  
Keyword(s):  
Pulse Energy ◽  
Absolute Measurement ◽  
Single Shot ◽  
Main Principle ◽  
Beam Position ◽  
X Ray ◽  
Non Invasive ◽  
Position Data ◽  
Monitor Data ◽  
Position Monitoring

X-ray gas monitors (XGMs) are operated at the European XFEL for non-invasive single-shot pulse energy measurements and average beam position monitoring. They are used for tuning and maintaining the self-amplified spontaneous emission (SASE) operation and for sorting single-shot experimental data according to the pulse-resolved energy monitor data. The XGMs were developed at DESY based on the specific requirements for the European XFEL. In total, six XGM units are continuously in operation. Here, the main principle and experimental setup of an XGM are summarized, and the locations of the six XGMs at the facility are shown. Pulse energy measurements at 0.134 nm wavelength are presented, exceeding 1 mJ obtained with an absolute measurement uncertainty of 7–10%; correlations between different XGMs are shown, from which a SASE1 beamline transmission of 97% is deduced. Additionally, simultaneous position measurements close to the undulator and at the end of the tunnel are shown, along with the correlation of beam position data simultaneously acquired by an XGM and an imager.

Highly Sensitive Organic Photoconductor Using Boron Sub-2,3-naphthalocyanine as a Red-sensitive Film for Stack-type Image Sensors

MRS Advances ◽  
2015 ◽  
Vol 1 (7) ◽  
pp. 459-464 ◽  
Author(s):  
Toshikatsu Sakai ◽  
Hokuto Seo ◽  
Tomomi Takagi ◽  
Hiroshi Ohtake
Keyword(s):  
Dark Current ◽  
Image Sensors ◽  
Promising Candidate ◽  
Organic Layers ◽  
Patterned Substrate ◽  
Sensitive Film ◽  
Current Voltage ◽  
Highly Sensitive ◽  
Current Voltage Characteristics ◽  
A Current

ABSTRACTBoron sub-2,3-naphthalocyanine chloride (SubNc) was investigated as a potential red-sensitive organic photoconductive film (OPF). A photoconductive cell was fabricated, and its current–voltage characteristics, both with and without light irradiation, and external quantum efficiency (EQE) were determined. The structure of the photoconductive cell was as follows, with thicknesses in nm given in parentheses: glass substrate/In–Zn–O (100)/spiro-2CBP (30)/SubNc (50)/Alq3 (30)/Al (50) (spiro-2CBP = 2,7-bis(carbazol-9-yl)-9,9-spirobifluorene; Alq3 = tris(8-hydroxyquinolinato)aluminum). The spiro-2CBP and Alq3 layers were inserted between the SubNc layer and the electrodes to block dark current injection. The three organic layers were successively deposited by evaporation in a vacuum on the In–Zn–O-patterned substrate. SubNc film absorbed light in the red region well, with an absorption peak at 695 nm. The EQE of the cell reached 80% when the applied bias was 15 V. In addition, the blocking layers effectively suppressed dark current in the OPF, which corresponded to a current density of 20 nA/cm2 at 15 V. These results indicate that SubNc is a promising candidate as a red-sensitive OPF.

New beam-position monitor system for upgraded Photon Factory storage ring

1998 ◽  
Vol 5 (3) ◽  
pp. 624-626 ◽  
Author(s):  
K. Haga ◽  
T. Honda ◽  
M. Tadano ◽  
T. Obina ◽  
T. Kasuga
Keyword(s):  
Storage Ring ◽  
Closed Orbit ◽  
Processing System ◽  
Feedback System ◽  
Beam Position Monitor ◽  
Signal Processing System ◽  
Beam Position ◽  
Photon Factory ◽  
Beam Movement ◽  
Improve Reliability

Accompanying the brilliance-upgrading project at the Photon Factory storage ring, the beam-position monitor (BPM) system has been renovated. The new system was designed to enable precise and fast measurements to correct the closed-orbit distortion (COD), as well as to feed back the orbit position during user runs. There are 42 BPMs newly installed, amounting to a total of 65 BPMs. All of the BPMs are calibrated on the test bench using a coaxially strung metallic wire. The measured electrical offsets are typically 200 µm in both directions, which is 1/2–1/3 of those of the old-type BPMs. In the signal-processing system, PIN diode switches are employed in order to improve reliability. In the fastest mode, this system is capable of measuring COD within about 10 ms; this fast acquisition will allow fast suppression of the beam movement for frequencies up to 50 Hz using a global feedback system.

scholarly journals THE SYNTHESIS OF AN OPTICAL THREE-BEAM OZONE SENSOR MODEL

2021 ◽  
pp. 148-152
Author(s):  
Kiselov Yehor ◽  
Aleksiievskyi Dmytro ◽  
Turyshev Kostiantyn
Keyword(s):  
Measurement Error ◽  
Modulation Frequency ◽  
Processing System ◽  
Working Environment ◽  
Measuring System ◽  
Optical Channel ◽  
Signal Processing System ◽  
Sensor Model ◽  
Simulink Simulation ◽  
Ozone Measurement

The synthesis of an optical three-beam ozone sensor model for the Matlab Simulink simulation is performed. The structure of the sensor signal processing system is proposed. The simulation of the measuring system noise resistance is carried out on the basis of the developed visual block model. The dependence of the measurement error on the modulation frequency of the radiation in the optical channel is obtained. The operation modes are determined to minimize the ozone measurement error. It is shown that the precision of determining the ozone concentration in the working environment can be achieved at the level of 99.9% using the obtained results.

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