scholarly journals Twin domain imaging in topological insulator Bi2Te3 and Bi2Se3 epitaxial thin films by scanning X-ray nanobeam microscopy and electron backscatter diffraction

2017 ◽  
Vol 50 (2) ◽  
pp. 369-377 ◽  
Author(s):  
Dominik Kriegner ◽  
Petr Harcuba ◽  
Jozef Veselý ◽  
Andreas Lesnik ◽  
Guenther Bauer ◽  
...  
Keyword(s):  
Crystal Orientation ◽  
Electron Backscatter Diffraction ◽  
Domain Size ◽  
Epitaxial Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Twin Domain ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
Diffraction Microscopy

The twin distribution in topological insulators Bi2Te3 and Bi2Se3 was imaged by electron backscatter diffraction (EBSD) and scanning X-ray diffraction microscopy (SXRM). The crystal orientation at the surface, determined by EBSD, is correlated with the surface topography, which shows triangular pyramidal features with edges oriented in two different orientations rotated in the surface plane by 60°. The bulk crystal orientation is mapped out using SXRM by measuring the diffracted X-ray intensity of an asymmetric Bragg peak using a nano-focused X-ray beam scanned over the sample. By comparing bulk- and surface-sensitive measurements of the same area, buried twin domains not visible on the surface are identified. The lateral twin domain size is found to increase with the film thickness.

scholarly journals Effect of TiO2-Nanoparticles on Ni Electrodeposition on Copper Wire

Metals ◽  
2020 ◽  
Vol 10 (3) ◽  
pp. 406
Author(s):  
Samiha Saad ◽  
Zakaria Boumerzoug ◽  
Anne Laure Helbert ◽  
François Brisset ◽  
Thierry Baudin
Keyword(s):  
Surface Morphology ◽  
Tio2 Nanoparticles ◽  
Vickers Microhardness ◽  
Electron Backscatter Diffraction ◽  
Copper Wire ◽  
X Ray Diffraction ◽  
X Ray ◽  
Electron Backscatter ◽  
Electrodeposited Nickel ◽  
Backscatter Diffraction

The objective of this work is to study, on a copper wire, the effect of TiO2-nanoparticles on electrodeposited nickel. Both the microstructure and surface morphology (texture) of the coating were investigated. This deposit is obtained from baths of sulfated electroplating Watts. The Ni-TO2 composite coating is deposited at a temperature of 45 °C. The composite deposit is prepared by adding nanoparticles of TiO2 to the electrolyte. The characterization has been carried out by X-ray diffraction, scanning electron microscopy, microhardness measurements, and electron backscatter diffraction (EBSD). Vickers microhardness was used to characterize the mechanical properties of the electrodeposited nickel. The results showed the effects of the TiO2 on the composition, the surface morphology, and the hardness of the deposited layer. However, there was not an effect of TiO2 nanoparticles on texture.

Surface Crystallization of Cordierite from Glass Studied by High-Temperature X-ray Diffraction and Electron Backscatter Diffraction (EBSD)

2011 ◽  
Vol 11 (10) ◽  
pp. 4660-4666 ◽  
Author(s):  
Wolfgang Wisniewski ◽  
Carlos André Baptista ◽  
Matthias Müller ◽  
Günter Völksch ◽  
Christian Rüssel
Keyword(s):  
High Temperature ◽  
Electron Backscatter Diffraction ◽  
Surface Crystallization ◽  
X Ray Diffraction ◽  
X Ray ◽  
Electron Backscatter ◽  
Backscatter Diffraction

Microstructural Evaluation of Alloy 800H After SCWL Exposure

2021 ◽  
Vol 7 (2) ◽  
Author(s):  
D. Marušáková ◽  
C. Aparicio ◽  
R. Fukač
Keyword(s):  
Supercritical Water ◽  
Electron Backscatter Diffraction ◽  
X Ray Diffraction ◽  
Alloy 800H ◽  
X Ray ◽  
Electron Backscatter ◽  
Microstructural Evaluation ◽  
The Matrix ◽  
Core Components ◽  
Backscatter Diffraction

Abstract Alloy 800H is a candidate material for supercritical water-cooled reactors (SCWR), specifically for in-core components in Canadian-type SCWR, that will operate at a pressure of 25 MPa and a core temperature from 350 °C to 625 °C. To evaluate this, several exposures to supercritical water took place at 395 °C and 25 MPa in a supercritical water loop (SCWL). The duration of each exposure was 500, 150, and 1000 h. Scanning electron microscopy (SEM) with electron backscatter diffraction (EBSD), in combination with Raman spectroscopy (RS) and X-ray diffraction (XRD), was used to evaluate the microstructure of alloy 800H after the exposures to supercritical water. All these methods confirmed the presence of magnetite and trevorite/chromite crystals, with a thickness of less than 1 μm, on the surface after each exposure. No significant change occurred after the second and third exposures. The matrix crystallography did not change during the exposures and demonstrated grain twinning with a grain size of 100–400 μm.

Stacking Fault Analysis of Epitaxial 3C-SiC on Si(001) Ridges

2016 ◽  
Vol 858 ◽  
pp. 147-150 ◽  
Author(s):  
Mojmír Meduňa ◽  
Thomas Kreiliger ◽  
Ivan Prieto ◽  
Marco Mauceri ◽  
Marco Puglisi ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Electron Backscatter Diffraction ◽  
Stacking Faults ◽  
Stacking Fault ◽  
Fault Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Electron Backscatter ◽  
Backscatter Diffraction

The stacking faults (SFs) in 3C-SiC epitaxially grown on ridges deeply etched into Si (001) substrates offcut towards [110] were quantitatively analyzed by electron microscopy and X-ray diffraction. A significant reduction of SF density with respect to planar material was observed for the {111} planes parallel to the ridges. The highest SF density was found in the (-1-11) plane. A previously observed defect was identified as twins by electron backscatter diffraction.

Comparison of electron backscatter and X-ray diffraction techniques for measuring dislocation density in Zircaloy-2

2019 ◽  
Vol 52 (2) ◽  
pp. 415-427 ◽  
Author(s):  
T. Skippon ◽  
L. Balogh ◽  
M. R. Daymond
Keyword(s):  
Dislocation Density ◽  
Electron Backscatter Diffraction ◽  
Profile Analysis ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
Density Measurements ◽  
X Ray ◽  
Ebsd Data ◽  
Electron Backscatter ◽  
Backscatter Diffraction

Two methods for measuring dislocation density were applied to a series of plastically deformed tensile samples of Zircaloy-2. Samples subjected to plastic strains ranging from 4 to 17% along a variety of loading paths were characterized using both electron backscatter diffraction (EBSD) and synchrotron X-ray line profile analysis (LPA). It was found that the EBSD-based method gave results which were similar in magnitude to those obtained by LPA and followed a similar trend with increasing plastic strain. The effects of microscope parameters and post-processing of the EBSD data on dislocation density measurements are also discussed. The typical method for estimating uncertainty in dislocation density measured via EBSD was shown to be overly conservative, and a more realistic method of determining uncertainty is presented as an alternative.

Shape Recovery and ε - γ Transformation in Fe29Mn7Si5Cr SMA

2008 ◽  
Vol 59 ◽  
pp. 86-91 ◽  
Author(s):  
Nele Van Caenegem ◽  
Kim Verbeken ◽  
Roumen H. Petrov ◽  
N.M. van der Pers ◽  
Yvan Houbaert
Keyword(s):  
Martensitic Transformation ◽  
Shape Memory ◽  
Shape Recovery ◽  
Electron Backscatter Diffraction ◽  
X Ray Diffraction ◽  
X Ray ◽  
Electron Backscatter ◽  
Shape Memory Behaviour ◽  
Backscatter Diffraction

The shape memory behaviour of a Fe29Mn7Si5Cr based alloy has been investigated. Characterization of the martensitic transformation and the different structural constituents was performed using optical microscopy, X-ray diffraction (XRD) methods and electron backscatter diffraction (EBSD). The transformation temperatures and the shape recovery were determined by dilatometry on prestrained samples.

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