Digital light processing in a hybrid atomic force microscope: In Situ, nanoscale characterization of the printing process

A compact high-speed X-ray atomic force microscope has been developed forin situuse in normal-incidence X-ray experiments on synchrotron beamlines, allowing for simultaneous characterization of samples in direct space with nanometric lateral resolution while employing nanofocused X-ray beams. In the present work the instrument is used to observe radiation damage effects produced by an intense X-ray nanobeam on a semiconducting organic thin film. The formation of micrometric holes induced by the beam occurring on a timescale of seconds is characterized.

Download Full-text

In Situ Chemical Functionalization of a Single Carbon Nanotube Functionalized AFM Tip using a Correlated Optical and Atomic Force Microscope

MRS Proceedings ◽

10.1557/opl.2011.141 ◽

2011 ◽

Vol 1318 ◽

Author(s):

Ifat Kaplan-Ashiri ◽

Eric J. Titus ◽

Katherine A. Willets

Keyword(s):

Carbon Nanotube ◽

Atomic Force Microscope ◽

Spectroscopic Characterization ◽

Optical Microscope ◽

Multiwalled Carbon ◽

Atomic Force ◽

Before And After ◽

Afm Probe

ABSTRACTWe present a method for performing nanoscale wet chemistry on single carbon nanotubes as well as spectroscopic characterization of the functionalized molecules using a coupled atomic force microscope (AFM) and optical microscope. An AFM probe was functionalized with a single multiwalled carbon nanotube and then locally oxidized by dipping it into nitric acid (HNO3) in situ using AFM manipulation. Raman scattering was collected from the carbon nanotube functionalized probe before and after the oxidation reaction. An increase in the Raman D band was observed after the acid treatment, demonstrating that oxidation had occurred. This is the first step towards developing a real-time technique for dynamic studies of chemical reactions on single nanoparticles/molecules.

Download Full-text

Silicon structures for in situ characterization of atomic force microscope probe geometry

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.588774 ◽

1996 ◽

Vol 14 (6) ◽

pp. 3425 ◽

Cited By ~ 14

Author(s):

K. F. Jarausch

Keyword(s):

Atomic Force Microscope ◽

Atomic Force Microscope Probe ◽

In Situ Characterization ◽

Atomic Force ◽

Silicon Structures ◽

Microscope Probe ◽

Probe Geometry

Download Full-text

Characterization of photosystem II with the atomic-force microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100130365 ◽

1992 ◽

Vol 50 (2) ◽

pp. 1146-1147

Author(s):

Kathleen M. Marr ◽

Mary K. Lyon

Keyword(s):

Photosystem Ii ◽

Atomic Force Microscope ◽

Three Dimensional ◽

Biologically Active ◽

Atomic Force ◽

Freeze Etching ◽

Image Averaging ◽

Oxygen Evolving ◽

Averaging Techniques

Photosystem II (PSII) is different from all other reaction centers in that it splits water to evolve oxygen and hydrogen ions. This unique ability to evolve oxygen is partly due to three oxygen evolving polypeptides (OEPs) associated with the PSII complex. Freeze etching on grana derived insideout membranes revealed that the OEPs contribute to the observed tetrameric nature of the PSIl particle; when the OEPs are removed, a distinct dimer emerges. Thus, the surface of the PSII complex changes dramatically upon removal of these polypeptides. The atomic force microscope (AFM) is ideal for examining surface topography. The instrument provides a topographical view of individual PSII complexes, giving relatively high resolution three-dimensional information without image averaging techniques. In addition, the use of a fluid cell allows a biologically active sample to be maintained under fully hydrated and physiologically buffered conditions. The OEPs associated with PSII may be sequentially removed, thereby changing the surface of the complex by one polypeptide at a time.

Download Full-text

In Situ Characterization of the Mechanical Behavior of Gecko's Spatulae by Atomic Force Microscopy

Journal of Nano Research ◽

10.4028/www.scientific.net/jnanor.22.85 ◽

2013 ◽

Vol 22 ◽

pp. 85-93

Author(s):

Shuang Yi Liu ◽

Min Min Tang ◽

Ai Kah Soh ◽

Liang Hong

Keyword(s):

Mechanical Behavior ◽

Hierarchical Level ◽

Intrinsic Properties ◽

In Situ Characterization ◽

Force Microscopy ◽

Atomic Force ◽

Theoretical Predictions ◽

Multi Mode

In-situ characterization of the mechanical behavior of geckos spatula has been carried out in detail using multi-mode AFM system. Combining successful application of a novel AFM mode, i.e. Harmonix microscopy, the more detail elastic properties of spatula is brought to light. The results obtained show the variation of the mechanical properties on the hierarchical level of a seta, even for the different locations, pad and stalk of the spatula. A model, which has been validated using the existing experimental data and phenomena as well as theoretical predictions for geckos adhesion, crawling and self-cleaning of spatulae, is proposed in this paper. Through contrast of adhesive and craw ability of the gecko on the surfaces with different surface roughness, and measurement of the surface adhesive behaviors of Teflon, the most effective adhesion of the gecko is more dependent on the intrinsic properties of the surface which is adhered.

Download Full-text