The white beam station at imaging beamline BL-4, Indus-2

The high flux density of synchrotron white beam offers several advantages in X-ray imaging such as higher resolution and signal-to-noise ratio in 3D/4D micro-tomography, higher frame rate in real-time imaging of transient phenomena, and higher penetration in thick and dense materials especially at higher energies. However, these advantages come with additional challenges to beamline optics, camera and sample due to increased heat load and radiation damage, and to personal safety due to higher radiation dose and ozone gas hazards. In this work, a white beam imaging facility at imaging beamline BL-4, Indus-2, has been developed, while taking care of various instrumental and personal safety challenges. The facility has been tested to achieve 1.5 µm spatial resolution, increased penetration depth up to 900 µm in steel, and high temporal resolutions of ∼10 ms (region of interest 2048 × 2048 pixels) and 70 µs (256 × 2048 pixels). The facility is being used successfully for X-ray imaging, non-destructive testing and dosimetry experiments.

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High-speed X-ray imaging pixel array detector for synchrotron bunch isolation

Journal of Synchrotron Radiation ◽

10.1107/s1600577515022754 ◽

2016 ◽

Vol 23 (2) ◽

pp. 395-403 ◽

Cited By ~ 14

Author(s):

Hugh T. Philipp ◽

Mark W. Tate ◽

Prafull Purohit ◽

Katherine S. Shanks ◽

Joel T. Weiss ◽

...

Keyword(s):

Integrated Circuit ◽

High Speed ◽

Structural Changes ◽

Dynamic Range ◽

Signal To Noise Ratio ◽

Frame Rate ◽

Array Detector ◽

X Ray ◽

X Ray Imaging ◽

Additional Mode

A wide-dynamic-range imaging X-ray detector designed for recording successive frames at rates up to 10 MHz is described. X-ray imaging with frame rates of up to 6.5 MHz have been experimentally verified. The pixel design allows for up to 8–12 frames to be stored internally at high speed before readout, which occurs at a 1 kHz frame rate. An additional mode of operation allows the integration capacitors to be re-addressed repeatedly before readout which can enhance the signal-to-noise ratio of cyclical processes. This detector, along with modern storage ring sources which provide short (10–100 ps) and intense X-ray pulses at megahertz rates, opens new avenues for the study of rapid structural changes in materials. The detector consists of hybridized modules, each of which is comprised of a 500 µm-thick silicon X-ray sensor solder bump-bonded, pixel by pixel, to an application-specific integrated circuit. The format of each module is 128 × 128 pixels with a pixel pitch of 150 µm. In the prototype detector described here, the three-side buttable modules are tiled in a 3 × 2 array with a full format of 256 × 384 pixels. The characteristics, operation, testing and application of the detector are detailed.

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Spatial resolution and signal-to-noise ratio in x-ray imaging

Quantitative Phase Imaging V ◽

10.1117/12.2511608 ◽

2019 ◽

Author(s):

Timur Gureyev ◽

David M. Paganin ◽

Alex Kozlov ◽

Harry Quiney

Keyword(s):

Spatial Resolution ◽

Signal To Noise Ratio ◽

Signal To Noise ◽

X Ray ◽

X Ray Imaging ◽

Noise Ratio

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Design, development and first experiments on the X-ray imaging beamline at Indus-2 synchrotron source RRCAT, India

Journal of Synchrotron Radiation ◽

10.1107/s1600577515016276 ◽

2015 ◽

Vol 22 (6) ◽

pp. 1531-1539 ◽

Cited By ~ 30

Author(s):

A. K. Agrawal ◽

B. Singh ◽

Y. S. Kashyap ◽

M. Shukla ◽

P. S. Sarkar ◽

...

Keyword(s):

Phase Contrast ◽

Imaging Techniques ◽

Phase Contrast Imaging ◽

Design Development ◽

Contrast Imaging ◽

Synchrotron Source ◽

Full Field ◽

X Ray ◽

X Ray Imaging ◽

Micro Tomography

A full-field hard X-ray imaging beamline (BL-4) was designed, developed, installed and commissioned recently at the Indus-2 synchrotron radiation source at RRCAT, Indore, India. The bending-magnet beamline is operated in monochromatic and white beam mode. A variety of imaging techniques are implemented such as high-resolution radiography, propagation- and analyzer-based phase contrast imaging, real-time imaging, absorption and phase contrast tomographyetc. First experiments on propagation-based phase contrast imaging and micro-tomography are reported.

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X-ray imaging and computed tomography for engineering applications

tm - Technisches Messen ◽

10.1515/teme-2019-0151 ◽

2020 ◽

Vol 0 (0) ◽

Author(s):

Simon Zabler ◽

Michael Maisl ◽

Peter Hornberger ◽

Jochen Hiller ◽

Christian Fella ◽

...

Keyword(s):

Computed Tomography ◽

Three Dimensional ◽

Industrial Applications ◽

Destructive Testing ◽

X Ray ◽

X Ray Imaging ◽

Application Problem ◽

Dimensional Measurements ◽

Dimensional Object ◽

Application Specific

AbstractAfter an incremental development which took place over four decades, X-ray imaging has become an important tool for non-destructive testing and evaluation. Computed Tomography (CT) in particular beholds the power of determining the location of flaws and inclusions (e. g. in castings and composites) in three-dimensional object coordinates. Therefore, and thanks to a speed-up of the measurement, CT is now routinely considered for in-line inspection of electronics, castings and composites. When precision and not speed is important, Micro-CT (μCT) can be employed for Dimensional Measurements (DM, e. g. quality assurance and shape verification), as well as for in situ testing, and for characterizing micro-structures in metals and composites. Using appropriate image processing and analysis μCT can determine the local fibre orientation in composites, the granular morphology of battery cathodes or the inter-connectivity of certain phases in casting alloys.Today, the large variety of X-ray instruments and methods poses an application problem which requires experience and a lot of knowledge for deciding which technique applies best to the task at hand. Application-specific guidelines exist for X-ray radiography testing (RT) only, whereas standardization has been applied to CT, unfortunately leaving out high resolution subμ CT, and nano-CT. For the latter exist an equally high number of NDT applications, however these instruments still necessitate a profound expertise. The task is to identify key industrial applications and push CT from system standardization to application specific automation.

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MTF, NPS and DQE characterization of an in-house developed X-ray imaging detector for synchrotron based micro-tomography

Journal of Instrumentation ◽

10.1088/1748-0221/9/06/c06001 ◽

2014 ◽

Vol 9 (06) ◽

pp. C06001-C06001 ◽

Cited By ~ 6

Author(s):

K Desjardins ◽

M Bordessoule ◽

C Petrache ◽

C Menneglier ◽

D Dallé ◽

...

Keyword(s):

X Ray ◽

X Ray Imaging ◽

Imaging Detector ◽

Micro Tomography

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TU-EE-A4-04: A New Antiscatter Grid for High-Resolution Region-Of-Interest (ROI) X-Ray Imaging

Medical Physics ◽

10.1118/1.2761407 ◽

2007 ◽

Vol 34 (6Part18) ◽

pp. 2563-2563

Author(s):

G Yadava ◽

S Rudin ◽

A Kuhls ◽

D Bednarek

Keyword(s):

High Resolution ◽

Region Of Interest ◽

X Ray ◽

X Ray Imaging ◽

Antiscatter Grid

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Artifact reduction in the CSPAD detectors used for LCLS experiments

Journal of Synchrotron Radiation ◽

10.1107/s160057751701058x ◽

2017 ◽

Vol 24 (5) ◽

pp. 1092-1097 ◽

Cited By ~ 5

Author(s):

Alberto Pietrini ◽

Carl Nettelblad

Keyword(s):

False Positive ◽

Signal To Noise Ratio ◽

Imaging Techniques ◽

Detection Threshold ◽

Photon Detection ◽

X Ray ◽

Photon Count ◽

X Ray Imaging ◽

Count Distribution ◽

Linac Coherent Light Source

The existence of noise and column-wise artifacts in the CSPAD-140K detector and in a module of the CSPAD-2.3M large camera, respectively, is reported for the L730 and L867 experiments performed at the CXI Instrument at the Linac Coherent Light Source (LCLS), in low-flux and low signal-to-noise ratio regime. Possible remedies are discussed and an additional step in the preprocessing of data is introduced, which consists of performing a median subtraction along the columns of the detector modules. Thus, we reduce the overall variation in the photon count distribution, lowering the mean false-positive photon detection rate by about 4% (from 5.57 × 10−5to 5.32 × 10−5 photon counts pixel−1frame−1in L867, cxi86715) and 7% (from 1.70 × 10-3to 1.58 × 10−3 photon counts pixel−1frame−1in L730, cxi73013), and the standard deviation in false-positive photon count per shot by 15% and 35%, while not making our average photon detection threshold more stringent. Such improvements in detector noise reduction and artifact removal constitute a step forward in the development of flash X-ray imaging techniques for high-resolution, low-signal and in serial nano-crystallography experiments at X-ray free-electron laser facilities.

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