scholarly journals Grazing-Transmission Scattering for Measuring Nano-structured Thin Films

2014 ◽  
Vol 70 (a1) ◽  
pp. C876-C876
Author(s):  
Kevin Yager
Keyword(s):  
Thin Films ◽  
Data Analysis ◽  
Small Angle ◽  
Three Dimensional ◽  
Object Size ◽  
X Ray ◽  
X Ray Scattering ◽  
Lattice Symmetry ◽  
Scattering Geometry ◽  
Nanoscale Order

We describe a new scattering geometry which can be used to quantify three-dimensional nanoscale order in thin films: Grazing-Transmission Small-Angle X-ray Scattering (GTSAXS). This technique collects sub-horizon scattering which exits from the edge of the sample, and does not suffer from the large refraction-distortions and multiple-scattering terms that complicate GISAXS data analysis. We also present a new modelling formalism applicable to superlattices of nano-objects, where lattice symmetry and nano-object size/shape can be arbitrarily defined.

X-ray imaging with ultra-small-angle X-ray scattering as a contrast mechanism

2004 ◽  
Vol 37 (5) ◽  
pp. 757-765 ◽  
Author(s):  
L. E. Levine ◽  
G. G. Long
Keyword(s):  
Small Angle ◽  
Imaging Technique ◽  
Three Dimensional ◽  
Sample Volume ◽  
Contrast Imaging ◽  
X Ray ◽  
X Ray Scattering ◽  
X Ray Imaging ◽  
Contrast Mechanism ◽  
Ray Scattering

A new transmission X-ray imaging technique using ultra-small-angle X-ray scattering (USAXS) as a contrast mechanism is described. USAXS imaging can sometimes provide contrast in cases where radiography and phase-contrast imaging are unsuccessful. Images produced at different scattering vectors highlight different microstructural features within the same sample volume. When used in conjunction with USAXS scans, USAXS imaging provides substantial quantitative and qualitative three-dimensional information on the sizes, shapes and spatial arrangements of the scattering objects. The imaging technique is demonstrated on metal and biological samples.

scholarly journals Global Small-Angle X-ray Scattering Data Analysis of Triacylglycerols in the Molten State (Part I)

2018 ◽  
Vol 122 (45) ◽  
pp. 10320-10329 ◽  
Author(s):  
Amin Sadeghpour ◽  
Marjorie Ladd Parada ◽  
Josélio Vieira ◽  
Megan Povey ◽  
Michael Rappolt
Keyword(s):  
Data Analysis ◽  
Small Angle ◽  
Scattering Data ◽  
Molten State ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Evaluation on Pore Structures of Organosilicate Thin Films by Grazing Incidence Small-Angle X-ray Scattering

2009 ◽  
Vol 113 (38) ◽  
pp. 12623-12627 ◽  
Author(s):  
Hong-Ji Chen ◽  
Sheng-Ying Li ◽  
Xiao-Jun Liu ◽  
Rui-Peng Li ◽  
Detlef-M. Smilgies ◽  
...  
Keyword(s):  
Thin Films ◽  
Small Angle ◽  
Grazing Incidence ◽  
X Ray ◽  
X Ray Scattering ◽  
Pore Structures ◽  
Organosilicate Thin Films ◽  
Ray Scattering

scholarly journals Evaluation of the Dispersion Stability of AZO Mesocrystals for Their Processing into Functional Thin Films Using Small Angle X-ray Scattering

Crystals ◽  
2020 ◽  
Vol 10 (5) ◽  
pp. 374
Author(s):  
Julian Ungerer ◽  
Ann-Kathrin Thurm ◽  
Georg Garnweitner ◽  
Hermann Nirschl
Keyword(s):  
Thin Films ◽  
Small Angle ◽  
Dispersion Stability ◽  
Synthesis Process ◽  
Stable Phase ◽  
Process Chain ◽  
X Ray ◽  
Entire Process ◽  
X Ray Scattering ◽  
Ray Scattering

Within the scope of the comprehensive elucidation of the entire process chain for the production of highly functional thin films made of semiconducting aluminum-doped zinc oxide ( A Z O ) nanocrystals, this work deals with the detailed investigation of the stabilization sub-process, considering the requirements for the subsequent coating process. An innovative investigation procedure using non-invasive small angle X-ray scattering ( S A X S ) is developed, enabling an evaluation of qualitative and quantitative dispersion stability criteria of sterically stabilized A Z O nanocrystals. On the one hand, qualitative criteria for minimizing layer inhomogeneities due to sedimentation as well as aggregate formation are discussed, enabling a high particle occupancy density. On the other hand, a procedure for determining the A Z O concentration using S A X S , both in the stable phase and in the non-stabilized phase, is demonstrated to provide a quantitative evaluation of the stabilization success, having a significant impact on the final layer thickness. The obtained insights offer a versatile tool for the precise stabilization process control based on synthesis process using S A X S to meet coating specific requirements and thus a successful integration into the entire process chain for the production of functional A Z O thin films.

In-Situ Grazing Incidence Small-Angle X-ray Scattering Studies on Nanopore Evolution in Low-kOrganosilicate Dielectric Thin Films

2005 ◽  
Vol 38 (8) ◽  
pp. 3395-3405 ◽  
Author(s):  
Byeongdu Lee ◽  
Jinhwan Yoon ◽  
Weontae Oh ◽  
Yongtaek Hwang ◽  
Kyuyoung Heo ◽  
...  
Keyword(s):  
Thin Films ◽  
Small Angle ◽  
Grazing Incidence ◽  
Dielectric Thin Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals Structure of Glancing Incidence Deposited TiO2 Thin Films as Revealed by Grazing Incidence Small-Angle X-ray Scattering

ChemPhysChem ◽  
2010 ◽  
Vol 11 (10) ◽  
pp. 2205-2208 ◽  
Author(s):  
Lola González-García ◽  
Angel Barranco ◽  
Adela Muñoz Páez ◽  
Agustín R. González-Elipe ◽  
Mari-Cruz García-Gutiérrez ◽  
...  
Keyword(s):  
Thin Films ◽  
Small Angle ◽  
Grazing Incidence ◽  
Tio2 Thin Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Nano-structure in micro-crystalline silicon thin films studied by small-angle X-ray scattering

2006 ◽  
Vol 501 (1-2) ◽  
pp. 113-116 ◽  
Author(s):  
Bingqing Zhou ◽  
Fengzhen Liu ◽  
Jinhua Gu ◽  
Qunfang Zhang ◽  
Yuqin Zhou ◽  
...  
Keyword(s):  
Thin Films ◽  
Small Angle ◽  
Crystalline Silicon ◽  
Nano Structure ◽  
X Ray ◽  
Silicon Thin Films ◽  
X Ray Scattering ◽  
Ray Scattering
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