A novel high speed impact testing method for evaluating the low temperature effects of eutectic and lead‐free solder joints

2012 ◽  
Vol 24 (1) ◽  
pp. 22-29 ◽  
Author(s):  
De‐Shin Liu ◽  
Chang‐Lin Hsu ◽  
Chia‐Yuan Kuo ◽  
Ya‐Ling Huang ◽  
Kwang‐Lung Lin ◽  
...  
2008 ◽  
Vol 494 (1-2) ◽  
pp. 196-202 ◽  
Author(s):  
De-Shin Liu ◽  
Chia-Yuan Kuo ◽  
Chang-Lin Hsu ◽  
Geng-Shin Shen ◽  
Yu-Ren Chen ◽  
...  

2008 ◽  
Vol 130 (1) ◽  
Author(s):  
Wen-Ren Jong ◽  
Hsin-Chun Tsai ◽  
Hsiu-Tao Chang ◽  
Shu-Hui Peng

In this study, the effects of the temperature cyclic loading on three lead-free solder joints of 96.5Sn–3.5Ag, 95.5Sn–3.8Ag-0.7Cu, and 95.5Sn–3.9Ag-0.6Cu bumped wafer level chip scale package (WLCSP) on printed circuit board assemblies are investigated by Taguchi method. The orthogonal arrays of L16 is applied to examine the shear strain effects of solder joints under five temperature loading parameters of the temperature ramp rate, the high and low temperature dwells, and the dwell time of both high and low temperatures by means of three simulated analyses of creep, plastic, and plastic-creep behavior on the WLCSP assemblies. It is found that the temperature dwell is the most significant factor on the effects of shear strain range from these analyses. The effect of high temperature dwell on the shear strain range is larger than that of low temperature dwell in creep analysis, while the effect of high temperature dwell on the shear strain range is smaller than that of low temperature dwell in both plastic and plastic-creep analyses.


2010 ◽  
Vol 2010 (1) ◽  
pp. 000110-000118
Author(s):  
Mudasir Ahmad ◽  
Ravi Assudani ◽  
Drew Nelson ◽  
Amir Youssef

The conversion to lead free Ball Grid Array (BGA) packages has raised several new assembly and reliability issues. Lead-free solder joints are generally stiffer than tin-lead solder joints, and mechanically induced failures have become more prevalent in lead-free solder assemblies. Traditionally, assembly bend and shock testing is performed to evaluate mechanical assembly reliability. However, bend and shock tests are expensive, cumbersome and not feasible for evaluating lot-to-lot variations in mechanical strength. Consequently, there is a need for a validated, component level test method that can be used as an accurate indicator of assembly level mechanical strength. Several publications have been written to evaluate the efficacy of high speed pull and shear testing as a viable reliability indicator [1 – 10]. In this study, a comprehensive Gauge R&R study was performed to evaluate the accuracy of the test equipment, including high speed video calibration. Then, test studies were performed to compare the accuracy of the results, spread across different package constructions, solder metallurgies, ball pitch and surface finish. In addition, the effect of parameters like multiple reflows and aging on specific metallurgies and surface finishes was studied. The results were generated over more than 2000 test runs. Finally, the study rank orders all critical test parameters and articulates what precise steps can be taken to generate relevant data for standard and custom devices during early evaluation stages and during high volume manufacturing.


Author(s):  
Karsten Meier ◽  
Maximilian Ochmann ◽  
Karlheinz Bock ◽  
David Leslie ◽  
Abhijit Dasgupta

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