Direct measurement of hot-carrier stress effects on CMOS circuit performance

1989 ◽  
Vol 36 (11) ◽  
pp. 2604-2605
Author(s):  
S.C. Hu ◽  
M.P. Brassington
Keyword(s):  
Direct Measurement ◽  
Cmos Circuit ◽  
Circuit Performance ◽  
Hot Carrier ◽  
Stress Effects ◽  
Hot Carrier Stress

Hot Carrier Stress Effects of SiO2 Passivated AlGaN/GaN High Electron Mobility Transistors

2019 ◽  
Vol 3 (5) ◽  
pp. 213-220 ◽  
Author(s):  
Min-Woo Ha ◽  
Young-Hwan Choi ◽  
Joon-Hyun Park ◽  
Kwang-Seok Seo ◽  
Min-Koo Han
Keyword(s):  
Electron Mobility ◽  
High Electron Mobility Transistors ◽  
High Electron ◽  
High Electron Mobility ◽  
Hot Carrier ◽  
Stress Effects ◽  
Electron Mobility Transistors ◽  
Hot Carrier Stress

Hot-Carrier Stress Effects on GIDL and SILC in 90nm LDD-MOSFET with Ultra-Thin Gate Oxide

2009 ◽  
Vol 26 (1) ◽  
pp. 017304 ◽  
Author(s):  
Hu Shi-Gang ◽  
Hao Yue ◽  
Ma Xiao-Hua ◽  
Cao Yan-Rong ◽  
Chen Chi ◽  
...  
Keyword(s):  
Gate Oxide ◽  
Hot Carrier ◽  
Stress Effects ◽  
Hot Carrier Stress ◽  
Thin Gate Oxide

DC pulse hot-carrier-stress effects on gate-induced drain leakage current in n-channel MOSFETs

2001 ◽  
Vol 48 (12) ◽  
pp. 2746-2753 ◽  
Author(s):  
Ja-Hao Chen ◽  
Shyh-Chyi Wong ◽  
Yeong-Her Wang
Keyword(s):  
Leakage Current ◽  
Hot Carrier ◽  
Stress Effects ◽  
Hot Carrier Stress

Hot-Carrier Stress Effects on AlGaN/GaN HEMTs Employing 500 ℃ Oxidized Ni/Au Gate

2007 ◽  
Author(s):  
Young-Hwan Choi ◽  
Jiyong Lim ◽  
In-Hwan Ji ◽  
Kyu-Heon Cho ◽  
Min-Koo Han
Keyword(s):  
Hot Carrier ◽  
Stress Effects ◽  
Hot Carrier Stress ◽  
Gan Hemts

Hot carrier stress effects in p-MOSFETs: physical effects relevant for circuit operation

1993 ◽  
Vol 22 (1-4) ◽  
pp. 253-260 ◽  
Author(s):  
W. Weber ◽  
M. Brox ◽  
A.v. Schwerin ◽  
R. Thewes
Keyword(s):  
Hot Carrier ◽  
Stress Effects ◽  
Hot Carrier Stress ◽  
Physical Effects
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