Single-event gate rupture in vertical power MOSFETs; an original empirical expression
1994 ◽
Vol 41
(6)
◽
pp. 2152-2159
◽
1992 ◽
Vol 39
(6)
◽
pp. 1698-1703
◽
2020 ◽
Vol 67
(9)
◽
pp. 3698-3704
1989 ◽
Vol 36
(6)
◽
pp. 2260-2266
◽
2011 ◽
Vol 58
(6)
◽
pp. 2739-2747
◽
1995 ◽
Vol 42
(6)
◽
pp. 1935-1939
◽
A physical interpretation for the single-event-gate-rupture cross-section of n-channel power MOSFETs
1996 ◽
Vol 43
(6)
◽
pp. 2932-2937
◽