Parity-scan design to reduce the cost of test application

Author(s):  
H. Fujiwara ◽  
A. Yamamoto
2007 ◽  
Vol 16 (03) ◽  
pp. 467-488
Author(s):  
JOSÉ M. SOLANA

A full-scan structure is described, in which the classic single serial scan-path and the parallel-in/serial-out scan (PASE-Scan) designs coexist. It requires only one extra pin and a small hardware overhead with respect to the single serial scan-path approach, and is compatible with a test scheme of this type. A method for the structure design is outlined and a structure-oriented optimized procedure for obtaining the test is proposed which considerably reduces the test application cost with respect to the serial scan case, improving the previous results for parallel-serial designs. The experiments performed with the ISCAS89 benchmarks show average reductions in test length of 60.6% with respect to its full serial scan counterpart and of 58.7%, with respect to a conventional full serial scan test with normal compaction. The advantage of the COMPASES scheme in testing some circuits with multiple PASE-Scan structures is also outlined.


Author(s):  
Yuki YOSHIKAWA ◽  
Tomomi NUWA ◽  
Hideyuki ICHIHARA ◽  
Tomoo INOUE

Author(s):  
Yuki Yoshikawa ◽  
Tomomi Nuwa ◽  
Hideyuki Ichihara ◽  
Tomoo Inoue

2012 ◽  
Vol 482-484 ◽  
pp. 343-346
Author(s):  
Jin Jun Wu ◽  
Li Cai Liu ◽  
Guo Hua Zhao ◽  
Xiao San Chu

Currently, most of Chinese oil companies have getting in the later production period, the oil wells are processed frequently and the cost is increasing. In view of the higher problems existed popular in the oil fields such as multiple layers, big interlayer, the technology composited perforation and high energy gas fracturing has to construct with every layer alone, operate long time, cost high. The author puts forward the design research on the composite process of consecutive perforation-strong pulse fracturing for multiple oil layers and thick interlayer This paper introduces the basic design principle and technology method. The design is realized by using the technology of the perforation-symmetrical overpressure fracturing technology, the multi-pulse multistage fracturing, to efficiently guarantee the effect of perforating and pulse fracturing in every layer. The designed multistage detonating device makes the once completed construction technology used in the single well of the multiple oil layers with big interlayer come true. The field test application has gained good effects, greatly reduced the construction cost, and also promoted the application and generalization of the technology composited perforation and high energy gas fracturing.


Author(s):  
James F. Mancuso

IBM PC compatible computers are widely used in microscopy for applications ranging from control to image acquisition and analysis. The choice of IBM-PC based systems over competing computer platforms can be based on technical merit alone or on a number of factors relating to economics, availability of peripherals, management dictum, or simple personal preference.IBM-PC got a strong “head start” by first dominating clerical, document processing and financial applications. The use of these computers spilled into the laboratory where the DOS based IBM-PC replaced mini-computers. Compared to minicomputer, the PC provided a more for cost-effective platform for applications in numerical analysis, engineering and design, instrument control, image acquisition and image processing. In addition, the sitewide use of a common PC platform could reduce the cost of training and support services relative to cases where many different computer platforms were used. This could be especially true for the microscopists who must use computers in both the laboratory and the office.


Author(s):  
H. Rose

The imaging performance of the light optical lens systems has reached such a degree of perfection that nowadays numerical apertures of about 1 can be utilized. Compared to this state of development the objective lenses of electron microscopes are rather poor allowing at most usable apertures somewhat smaller than 10-2 . This severe shortcoming is due to the unavoidable axial chromatic and spherical aberration of rotationally symmetric electron lenses employed so far in all electron microscopes.The resolution of such electron microscopes can only be improved by increasing the accelerating voltage which shortens the electron wave length. Unfortunately, this procedure is rather ineffective because the achievable gain in resolution is only proportional to λ1/4 for a fixed magnetic field strength determined by the magnetic saturation of the pole pieces. Moreover, increasing the acceleration voltage results in deleterious knock-on processes and in extreme difficulties to stabilize the high voltage. Last not least the cost increase exponentially with voltage.


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