Test application time reduction for sequential circuits with scan

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.406714 ◽

1995 ◽

Vol 14 (9) ◽

pp. 1128-1140 ◽

Author(s):

Soo Young Lee ◽

K.K. Saluja

Keyword(s):

Sequential Circuits ◽

Application Time ◽

Test Application Time ◽

Test Application ◽

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Test application time reduction for scan based sequential circuits

Proceedings. Fifth Great Lakes Symposium on VLSI ◽

10.1109/glsv.1995.516050 ◽

2002 ◽

Author(s):

Hao Zheng ◽

K.K. Saluja ◽

R. Jain

Keyword(s):

Sequential Circuits ◽

Application Time ◽

Test Application Time ◽

Test Application ◽

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Tester Memory Requirements and Test Application Time Reduction for Delay Faults with Digital Captureless Test Sensors

Journal of Electronic Testing ◽

10.1007/s10836-011-5271-2 ◽

2011 ◽

Vol 28 (2) ◽

pp. 229-242

Author(s):

C. Thibeault ◽

Y. Hariri ◽

C. Hobeika

Keyword(s):

Delay Faults ◽

Application Time ◽

Test Application Time ◽

Test Application ◽

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A Hybrid Test Architecture to Reduce Test Application Time in Full Scan Sequential Circuits

2009 Annual IEEE India Conference ◽

10.1109/indcon.2009.5409404 ◽

2009 ◽

Author(s):

Priyankar Ghosh ◽

Srobona Mitra ◽

Indranil Sengupta ◽

Bhargab Bhattacharya ◽

Sharad Seth

Keyword(s):

Sequential Circuits ◽

Application Time ◽

Test Application Time ◽

Test Application ◽

Full Scan ◽

Hybrid Test ◽

Test Architecture

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Test application time reduction for scan circuits using limited scan operations

International Symposium on Signals Circuits and Systems Proceedings SCS 2003 (Cat No 03EX720) ISQED-04 ◽

10.1109/isqed.2004.1283675 ◽

2004 ◽

Author(s):

Yonsang Cho ◽

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Application Time ◽

Test Application Time ◽

Test Application ◽

Time Reduction ◽

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A genetic approach to test application time reduction for full scan and partial scan circuits

Proceedings of the 8th International Conference on VLSI Design ◽

10.1109/icvd.1995.512126 ◽

2002 ◽

Author(s):

E.M. Rudnick ◽

J.H. Patel

Keyword(s):

Genetic Approach ◽

Application Time ◽

Partial Scan ◽

Test Application Time ◽

Test Application ◽

Full Scan ◽

Time Reduction ◽

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Modified Selective Huffman Coding for Optimization of Test Data Compression, Test Application Time and Area Overhead

Journal of Electronic Testing ◽

10.1007/s10836-010-5183-6 ◽

2010 ◽

Vol 26 (6) ◽

pp. 679-688 ◽

Author(s):

Usha Sandeep Mehta ◽

Kankar S. Dasgupta ◽

Nirnjan M. Devashrayee

Keyword(s):

Data Compression ◽

Test Data ◽

Compression Test ◽

Huffman Coding ◽

Test Data Compression ◽

Application Time ◽

Test Application Time ◽

Area Overhead ◽

Test Application

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Test response reuse-based SoC core test compression and test scheduling for test application time minimization

Microelectronics Journal ◽

10.1016/j.mejo.2008.03.001 ◽

2008 ◽

Vol 39 (12) ◽

pp. 1704-1709

Author(s):

Jingbo Shao ◽

Guangsheng Ma ◽

Zhi Yang ◽

Ruixue Zhang

Keyword(s):

Test Scheduling ◽

Application Time ◽

Test Application Time ◽

Test Response ◽

Test Compression ◽

Test Application ◽

Time Minimization

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Multi-mode Toggle Random Access Scan to Minimize Test Application Time

Communications in Computer and Information Science - VLSI Design and Test ◽

10.1007/978-981-10-7470-7_21 ◽

2017 ◽

pp. 205-216

Author(s):

Anshu Goel ◽

Rohini Gulve

Keyword(s):

Random Access ◽

Application Time ◽

Test Application Time ◽

Test Application ◽

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Reduced Test Application Time Based on Reachability Analysis

Sixth International Symposium on Quality of Electronic Design (ISQED'05) ◽

10.1109/isqed.2005.102 ◽

2005 ◽

Author(s):

Th. Haniotakis ◽

S. Tragoudas ◽

G. Pani

Keyword(s):

Reachability Analysis ◽

Application Time ◽

Test Application Time ◽

Test Application

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Improving Compression Ratio, Area Overhead, and Test Application Time for System-on-Chip Test Data Compression/Decompression

Design, Automation, and Test in Europe ◽

10.1007/978-1-4020-6488-3_35 ◽

2008 ◽

pp. 479-495

Author(s):

Paul Theo Gonciari ◽

Bashir M. Al-Hashimi ◽

Nicola Nicolici

Keyword(s):

Data Compression ◽

Test Data ◽

Compression Ratio ◽

System On Chip ◽

Test Data Compression ◽

Application Time ◽

Test Application Time ◽

Area Overhead ◽

Test Application ◽

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