Speed Up Light Field Synthesis from Stereo Images

AbstractDisparity estimation using the structure tensor is a local approach to determine orientation in Epipolar Plane Images. A global extension would lead to more precise and robust estimations. In this work, a novel algorithm for 3D reconstruction from linear light fields is proposed. This method uses a modified version of the Progressive Probabilistic Hough Transform to extract orientations from Epipolar Plane Images, allowing to achieve high quality disparity maps. To this aim, the structure tensor estimates are used to speed up computation and improve the disparity estimation near occlusion boundaries. The new algorithm is evaluated on both synthetic and real light field datasets, and compared with classical local disparity estimation techniques based on the structure tensor.

Download Full-text

Robust Light Field Synthesis From Stereo Images With Left-Right Geometric Consistency

10.1109/icip42928.2021.9506423 ◽

2021 ◽

Author(s):

Chun-Hao Chao ◽

Chang-Le Liu ◽

Homer H. Chen

Keyword(s):

Light Field ◽

Stereo Images ◽

Geometric Consistency

Download Full-text

Stereo imaging in the shadow electron microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100107745 ◽

1978 ◽

Vol 36 (1) ◽

pp. 120-121

Author(s):

W. C. T. Dowell

Keyword(s):

Electron Microscopy ◽

Electron Microscope ◽

Convenient Method ◽

Patent Application ◽

Standard Technique ◽

Stereo Imaging ◽

Stereo Images ◽

Specimen Height

Stereo imaging is not new to electron microscopy. Von Ardenne, who first published transmission pairs nearly forty hears ago, himself refers to a patent application by Ruska in 1934. In the early days of the electron microscope von Ardenne employed a pair of magnetic lenses to view untilted specimens but soon opted for the now standard technique of tilting the specimen with respect to the beam.In the shadow electron microscope stereo images can, of course, be obtained by tilting the specimen between micrographs. This obvious method suffers from the disadvantage that the magnification is very sensitive to small changes in specimen height which accompany tilting in the less sophisticated stages and it is also time consuming. A more convenient method is provided by horizontally displacing the specimen between micrographs. The specimen is not tilted and the technique is both simple and rapid, stereo pairs being obtained in less than thirty seconds.

Download Full-text

Scanning x-ray fluorescence microscopy and principal component analysis

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100133394 ◽

1992 ◽

Vol 50 (2) ◽

pp. 1752-1753

Author(s):

Brian Cross

Keyword(s):

Principal Component Analysis ◽

Fluorescence Microscopy ◽

Spatial Resolution ◽

High Speed ◽

Image Acquisition ◽

Principal Component ◽

Fluorescence Microscope ◽

Acquisition Rate ◽

X Ray ◽

Speed Up

A relatively new entry, in the field of microscopy, is the Scanning X-Ray Fluorescence Microscope (SXRFM). Using this type of instrument (e.g. Kevex Omicron X-ray Microprobe), one can obtain multiple elemental x-ray images, from the analysis of materials which show heterogeneity. The SXRFM obtains images by collimating an x-ray beam (e.g. 100 μm diameter), and then scanning the sample with a high-speed x-y stage. To speed up the image acquisition, data is acquired "on-the-fly" by slew-scanning the stage along the x-axis, like a TV or SEM scan. To reduce the overhead from "fly-back," the images can be acquired by bi-directional scanning of the x-axis. This results in very little overhead with the re-positioning of the sample stage. The image acquisition rate is dominated by the x-ray acquisition rate. Therefore, the total x-ray image acquisition rate, using the SXRFM, is very comparable to an SEM. Although the x-ray spatial resolution of the SXRFM is worse than an SEM (say 100 vs. 2 μm), there are several other advantages.

Download Full-text

Direct measurement of electron-diffraction-pattern intensities using an energy loss spectrometer

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100155311 ◽

1989 ◽

Vol 47 ◽

pp. 668-669

Author(s):

A. G. Jackson ◽

M. Rowe

Keyword(s):

Thermal Effects ◽

Dynamic Range ◽

Scattering Amplitude ◽

Dynamical Theory ◽

Site Symmetry ◽

Proof Of Concept ◽

Parallel Acquisition ◽

Kinematic Approximation ◽

Speed Up ◽

Structure Calculations

Diffraction intensities from intermetallic compounds are, in the kinematic approximation, proportional to the scattering amplitude from the element doing the scattering. More detailed calculations have shown that site symmetry and occupation by various atom species also affects the intensity in a diffracted beam. [1] Hence, by measuring the intensities of beams, or their ratios, the occupancy can be estimated. Measurement of the intensity values also allows structure calculations to be made to determine the spatial distribution of the potentials doing the scattering. Thermal effects are also present as a background contribution. Inelastic effects such as loss or absorption/excitation complicate the intensity behavior, and dynamical theory is required to estimate the intensity value.The dynamic range of currents in diffracted beams can be 104or 105:1. Hence, detection of such information requires a means for collecting the intensity over a signal-to-noise range beyond that obtainable with a single film plate, which has a S/N of about 103:1. Although such a collection system is not available currently, a simple system consisting of instrumentation on an existing STEM can be used as a proof of concept which has a S/N of about 255:1, limited by the 8 bit pixel attributes used in the electronics. Use of 24 bit pixel attributes would easily allowthe desired noise range to be attained in the processing instrumentation. The S/N of the scintillator used by the photoelectron sensor is about 106 to 1, well beyond the S/N goal. The trade-off that must be made is the time for acquiring the signal, since the pattern can be obtained in seconds using film plates, compared to 10 to 20 minutes for a pattern to be acquired using the digital scan. Parallel acquisition would, of course, speed up this process immensely.

Download Full-text

How to speed up to be in time: Action-judgment dissociations in children and adults

Swiss Journal of Psychology ◽

10.1024/1421-0185.63.1.17 ◽

2004 ◽

Vol 63 (1) ◽

pp. 17-29 ◽

Cited By ~ 4

Author(s):

Friedrich Wilkening ◽

Claudia Martin

Keyword(s):

Rating Scale ◽

Constant Speed ◽

Linear Condition ◽

Speed Up ◽

Nonlinear Condition ◽

Speed Change ◽

Catch Up ◽

Normative Rule ◽

Judgment Condition ◽

Time Linear

Children 6 and 10 years of age and adults were asked how fast a toy car had to be to catch up with another car, the latter moving with a constant speed throughout. The speed change was required either after half of the time (linear condition) or half of the distance (nonlinear condition), and responses were given either on a rating scale (judgment condition) or by actually producing the motion (action condition). In the linear condition, the data patterns for both judgments and actions were in accordance with the normative rule at all ages. This was not true for the nonlinear condition, where children’s and adults’ judgment and also children’s action patterns were linear, and only adults’ action patterns were in line with the nonlinearity principle. Discussing the reasons for the misconceptions and for the action-judgment dissociations, a claim is made for a new view on the development of children’s concepts of time and speed.

Download Full-text