A multimodal deep architecture for large-scale protein ubiquitylation site prediction

Author(s):  
Fei He ◽  
Lingling Bao ◽  
Rui Wang ◽  
Jiagen Li ◽  
Dong Xu ◽  
...  
2019 ◽  
Vol 15 (3) ◽  
pp. 1-26
Author(s):  
Ji Wang ◽  
Weidong Bao ◽  
Lei Zheng ◽  
Xiaomin Zhu ◽  
Philip S. Yu

IEEE Access ◽  
2018 ◽  
Vol 6 ◽  
pp. 63560-63569 ◽  
Author(s):  
Xiaowei Zhao ◽  
Jiagen Li ◽  
Rui Wang ◽  
Fei He ◽  
Lin Yue ◽  
...  

2018 ◽  
Vol 12 (S6) ◽  
Author(s):  
Fei He ◽  
Rui Wang ◽  
Jiagen Li ◽  
Lingling Bao ◽  
Dong Xu ◽  
...  

Author(s):  
Xin Zhao ◽  
Guiguang Ding ◽  
Yuchen Guo ◽  
Jungong Han ◽  
Yue Gao

Cross-view retrieval, which focuses on searching images as response to text queries or vice versa, has received increasing attention recently. Cross-view hashing is to efficiently solve the cross-view retrieval problem with binary hash codes. Most existing works on cross-view hashing exploit multi-view embedding method to tackle this problem, which inevitably causes the information loss in both image and text domains. Inspired by the Generative Adversarial Nets (GANs), this paper presents a new model that is able to Turn Cross-view Hashing into single-view hashing (TUCH), thus enabling the information of image to be preserved as much as possible. TUCH is a novel deep architecture that integrates a language model network T for text feature extraction, a generator network G to generate fake images from text feature and a hashing network H for learning hashing functions to generate compact binary codes. Our architecture effectively unifies joint generative adversarial learning and cross-view hashing. Extensive empirical evidence shows that our TUCH approach achieves state-of-the-art results, especially on text to image retrieval, based on image-sentences datasets, i.e. standard IAPRTC-12 and large-scale Microsoft COCO.


1999 ◽  
Vol 173 ◽  
pp. 243-248
Author(s):  
D. Kubáček ◽  
A. Galád ◽  
A. Pravda

AbstractUnusual short-period comet 29P/Schwassmann-Wachmann 1 inspired many observers to explain its unpredictable outbursts. In this paper large scale structures and features from the inner part of the coma in time periods around outbursts are studied. CCD images were taken at Whipple Observatory, Mt. Hopkins, in 1989 and at Astronomical Observatory, Modra, from 1995 to 1998. Photographic plates of the comet were taken at Harvard College Observatory, Oak Ridge, from 1974 to 1982. The latter were digitized at first to apply the same techniques of image processing for optimizing the visibility of features in the coma during outbursts. Outbursts and coma structures show various shapes.


1994 ◽  
Vol 144 ◽  
pp. 29-33
Author(s):  
P. Ambrož

AbstractThe large-scale coronal structures observed during the sporadically visible solar eclipses were compared with the numerically extrapolated field-line structures of coronal magnetic field. A characteristic relationship between the observed structures of coronal plasma and the magnetic field line configurations was determined. The long-term evolution of large scale coronal structures inferred from photospheric magnetic observations in the course of 11- and 22-year solar cycles is described.Some known parameters, such as the source surface radius, or coronal rotation rate are discussed and actually interpreted. A relation between the large-scale photospheric magnetic field evolution and the coronal structure rearrangement is demonstrated.


2000 ◽  
Vol 179 ◽  
pp. 205-208
Author(s):  
Pavel Ambrož ◽  
Alfred Schroll

AbstractPrecise measurements of heliographic position of solar filaments were used for determination of the proper motion of solar filaments on the time-scale of days. The filaments have a tendency to make a shaking or waving of the external structure and to make a general movement of whole filament body, coinciding with the transport of the magnetic flux in the photosphere. The velocity scatter of individual measured points is about one order higher than the accuracy of measurements.


Author(s):  
Simon Thomas

Trends in the technology development of very large scale integrated circuits (VLSI) have been in the direction of higher density of components with smaller dimensions. The scaling down of device dimensions has been not only laterally but also in depth. Such efforts in miniaturization bring with them new developments in materials and processing. Successful implementation of these efforts is, to a large extent, dependent on the proper understanding of the material properties, process technologies and reliability issues, through adequate analytical studies. The analytical instrumentation technology has, fortunately, kept pace with the basic requirements of devices with lateral dimensions in the micron/ submicron range and depths of the order of nonometers. Often, newer analytical techniques have emerged or the more conventional techniques have been adapted to meet the more stringent requirements. As such, a variety of analytical techniques are available today to aid an analyst in the efforts of VLSI process evaluation. Generally such analytical efforts are divided into the characterization of materials, evaluation of processing steps and the analysis of failures.


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