Full information and full control in a behavioral context

Electron tomography is a technique where many projections of an object are collected from the transmission electron microscope (TEM), and are then used to reconstruct the object in its entirety, allowing internal structure to be viewed. As vital as is the 3-D structural information and with no other 3-D imaging technique to compete in its resolution range, electron tomography of amorphous structures has been exercised only sporadically over the last ten years. Its general lack of popularity can be attributed to the tediousness of the entire process starting from the data collection, image processing for reconstruction, and extending to the 3-D image analysis. We have been investing effort to automate all aspects of electron tomography. Our systems of data collection and tomographic image processing will be briefly described.To date, we have developed a second generation automated data collection system based on an SGI workstation (Fig. 1) (The previous version used a micro VAX). The computer takes full control of the microscope operations with its graphical menu driven environment. This is made possible by the direct digital recording of images using the CCD camera.

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Computer-Controlled Hrem Alignment Using Automated Diffractogram Analysis

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100181415 ◽

1990 ◽

Vol 48 (1) ◽

pp. 532-533

Author(s):

G.Y. Fan ◽

O.L. Krivanek

Keyword(s):

Electron Microscope ◽

High Resolution ◽

The Other ◽

Full Information ◽

Resolution Electron ◽

Skilled Operator ◽

Automatic Alignment ◽

High Resolution Electron Microscope ◽

Computer Controlled ◽

Recorded Image

Full alignment of a high resolution electron microscope (HREM) requires five parameters to be optimized: the illumination angle (beam tilt) x and y, defocus, and astigmatism magnitude and orientation. Because neither voltage nor current centering lead to the correct illumination angle, all the adjustments must be done on the basis of observing contrast changes in a recorded image. The full alignment can be carried out by a computer which is connected to a suitable image pick-up device and is able to control the microscope, sometimes with greater precision and speed than even a skilled operator can achieve. Two approaches to computer-controlled (automatic) alignment have been investigated. The first is based on measuring the dependence of the overall contrast in the image of a thin amorphous specimen on the relevant parameters, the other on measuring the image shift. Here we report on our progress in developing a new method, which makes use of the full information contained in a computed diffractogram.

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Time as Behavioral Context and Mediator of Decision Making

PsycEXTRA Dataset ◽

10.1037/e493532008-001 ◽

2008 ◽

Author(s):

Jeff Joireman

Keyword(s):

Decision Making ◽

Behavioral Context

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About some aspects of sanitary and hygienic certification of carcinogenic enterprises

Russian Journal of Occupational Health and Industrial Ecology ◽

10.31089/1026-9428-2019-59-9-564-566 ◽

2020 ◽

pp. 564-565

Author(s):

I. I. Berezin ◽

G. A. Nikiforova

Keyword(s):

Working Conditions ◽

Full Information ◽

Harmful Effects

The actual problems of sanitary-hygienic certification of carcinogenic organizations are presented. The need to extend certification to all carcinogenic production, which will provide full information on the carcinogenic hazards of working conditions in order to eliminate the harmful effects of carcinogens.

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A Silicon Debugging Methodology on Customer Prototype for Wafer Foundries

ISTFA 2012: Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2012p0411 ◽

2012 ◽

Author(s):

Mai Zhihong ◽

Ng Tsu Hau ◽

Dawood M. Khalid ◽

Tan Pik Kee ◽

Jeffrey Lam

Keyword(s):

Case Studies ◽

Semiconductor Industry ◽

Full Information ◽

Limited Information ◽

Ip Protection ◽

First Case ◽

Silicon Debugging ◽

Failure Location ◽

Device Chip ◽

Latch Up

Abstract IP protection is of major importance for a semiconductor company and only limited information is made available for device debugging for the product outsourced to a foundry. In order to position ourselves better in the ever competitive semiconductor industry, with the consideration of IP protection, we have to provide the customers with the Si debugging capability and device/chip verification services in foundry. This paper explores the Si debugging methodology and technique in a foundry. Two case studies are presented and discussed. The first case illustrates the isolation of the failure location by InGaAs microscopy, upon which the failure was identified to be caused by a latch-up issue. In the second case, due to confidentiality considerations from the customer, full information could not be provided to the foundry for silicon debugging. The paper illustrates the ability to effectively debug a failure despite being constrained by limited information from the customer.

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Internet of Things (IoT) is Smart Homes and the Risks

Journal of Electronics and Sensors ◽

10.31829/2689-6958/jes2019-2(1)-105 ◽

2019 ◽

pp. 1-4

Keyword(s):

Continuous Monitoring ◽

Human Person ◽

Advanced Technology ◽

Efficient Production ◽

Technological Evolution ◽

Technological Revolution ◽

Full Control ◽

Control Production ◽

Smart Technologies ◽

And Control

Undoubtedly is a technological revolution that has certainly focused on the interest of software development companies, companies of IT, hardware design, networks and artificial intelligence. A technological revolution that started a few years ago and has evolved rapidly, thanks to the technological evolution of IT and networks. It is a combination of many communication protocols, sensors and other intelligent technologies, the correlation between smart technologies, networks and services that all together complete processes in order to achieve the result for which they were installed. In advanced technology countries, both simple users and industry use IoT where sensors are simplified and automated at home and in industry, there is continuous monitoring, control and prediction of product failure for the benefit of efficient production of high quality products and control production at each stage of product processing / production. Someone could well think and say that all this is fantastic and that we have solved the problem of organization, easy life without further thoughts and worries since everything is done automatically.An IoT in an intelligent house could literally regulate everything, using sensors and appropriate software could talk with a human person, as well as someone could appropriately entice all that security and literally take full control of the premises of a home with consequences from minimal to catastrophic including the complete destruction of a home.

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