Influence of low amounts of nanostructured silica and calcium carbonate fillers on the large-area dielectric breakdown performance of bi-axially oriented polypropylene

Author(s):  
I. Rytoluoto ◽  
K. Lahti ◽  
M. Karttunen ◽  
M. Koponen ◽  
S. Virtanen ◽  
...  
1987 ◽  
Vol 101 ◽  
Author(s):  
E.L. Joyce ◽  
T.R. Jervis

ABSTRACTA gas phase process for large area depositions on an ambient temperature substrate using laser-induced dielectric breakdown of gas phase precursors has recently been developed.1 Deposits of nickel alloys show excellent grain refinement (<10 nm) and metastable phase incorporation due to rapid quenching from the gas phase. Particle size distribution and compositional variance within the deposited films have been studied using electron microscopy and electron diffraction. Kinetic expressions to explain homogeneous gas phase nucleation and growth of the deposited materials have been developed in an effort to better understand this process. The effect of system variables on film and powder grain sizes has been studied. This analysis gives insight into the fluid flow/heat transfer patterns involved in the system and their effect on the final deposited material. The effect of system pressure, gas phase composition, and laser pulse energy, on particle size, surface area coverage, and deposition thickness are discussed.


Author(s):  
Hannes Ranta ◽  
Ilkka Rytöluoto ◽  
Kari Lahti

<p>The power law relationship has been used to some extent in order to compare dielectric breakdown strength results between materials of varying thickness. However, especially in case of relatively new materials such as nanocomposites, it can be questioned whether the measured results actually behave accordingly to the power law and to what extent – most importantly, can the power law be used to predict properties of thinner films than those actually measured. This paper addresses the problem in case of biaxially oriented PPsilica nanocomposite films of different thickness, the breakdown results of which are compared and fitted to the power law relationship.</p>


2019 ◽  
Vol 963 ◽  
pp. 745-748 ◽  
Author(s):  
Daniel J. Lichtenwalner ◽  
Shadi Sabri ◽  
Edward van Brunt ◽  
Brett Hull ◽  
Satyaki Ganguly ◽  
...  

Gate oxide reliability on silicon carbide MOSFETs and large-area SiC N-type capacitors was studied for devices fabricated on 150mm SiC substrates. Oxide lifetime was measured under accelerated stress conditions using constant-voltage time-dependent dielectric breakdown (TDDB) testing, or ramped-voltage breakdown (RBD) testing. TDDB results from 1200V Gen3 MOSFETs reveal a field acceleration parameter of about 35 nm/V, similar to values reported for SiO2 on silicon. Temperature-dependent RBD tests of large capacitors from 25°C to 200°C reveal an apparent activation energy of 0.24eV, indicating that oxide lifetime increases as the temperature is decreased, as expected. Using this acceleration parameter and activation energy in the linear field model, the gate oxide lifetime from MOSFET TDDB testing extrapolates to greater than 108 hours at a gate voltage of 15 VGS at 175°C.


Author(s):  
S. F. Glover ◽  
I. Smith ◽  
Gene Neau ◽  
G. E. Pena ◽  
J. M. Rudys ◽  
...  

2013 ◽  
Vol 131 (1) ◽  
pp. n/a-n/a ◽  
Author(s):  
Suvi Virtanen ◽  
Hannes Ranta ◽  
Susanna Ahonen ◽  
Mikko Karttunen ◽  
Jani Pelto ◽  
...  

2013 ◽  
Vol 873 ◽  
pp. 503-506 ◽  
Author(s):  
Meng Lin Jiang ◽  
Shi Wei Lin ◽  
Wen Kai Jiang

Thermal roller nanoimprint lithography with the ability of larger area micro-to nanometer-scale patterning on flexible substrates possesses the advantages of low cost and high throughput, and is widely being practiced in industry. Hologram images have been successfully embossed in shrink biaxially oriented polypropylene films by the large-area roller nanoimprint lithography technique. The defects which occur during embossing processes have been studied in order to identify the underlying formation mechanism.


Author(s):  
W. A. Stygar ◽  
T. C. Wagoner ◽  
H. C. Ives ◽  
Z. R. Wallace ◽  
V. Anaya ◽  
...  

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