Abnormal chopping effects on the signal of the metal-insulator metal diode (laser frequency measurement)

2002 ◽  
Author(s):  
J.W. Won ◽  
J.H. Jo ◽  
J.H. Park ◽  
T.H. Yoon ◽  
Y.P. Kim
Keyword(s):  
Diode Laser ◽  
Frequency Measurement ◽  
Laser Frequency ◽  
Metal Insulator ◽  
Laser Frequency Measurement ◽  
Metal Insulator Metal

Laser Frequency Measurement at NPL

1989 ◽  
pp. 459-460
Author(s):  
D. J. E. Knight ◽  
K. I. Pharaoh ◽  
M. J. Padgett
Keyword(s):  
Frequency Measurement ◽  
Laser Frequency ◽  
Laser Frequency Measurement

Modeling, Fabrication, and Electrical Testing of Metal-Insulator-Metal Diode

2011 ◽  
Author(s):  
Terrance O'Regan ◽  
Matthew Chin ◽  
Cheng Tan ◽  
Anthony Birdwell
Keyword(s):  
Metal Insulator ◽  
Metal Insulator Metal

scholarly journals Hyperspectral Molecular Orientation Mapping in Metamaterials

2021 ◽  
Vol 11 (4) ◽  
pp. 1544
Author(s):  
Meguya Ryu ◽  
Yoshiaki Nishijima ◽  
Shinya Morimoto ◽  
Naoki To ◽  
Tomoki Hashizume ◽  
...  
Keyword(s):  
Molecular Orientation ◽  
Field Enhancement ◽  
Chemical Mapping ◽  
Metal Insulator ◽  
Orientation Mapping ◽  
Metal Insulator Metal ◽  
Finger Printing ◽  
Thermal Emitter ◽  
Ir Bands ◽  
Sub Wavelength

The four polarisation method is adopted for measurement of molecular orientation in dielectric nanolayers of metal-insulator-metal (MIM) metamaterials composed of gold nanodisks on polyimide and gold films. Hyperspectral mapping at the chemical finger printing spectral range of 4–20 μμm was carried out for MIM patterns of 1–2.5 μμm period (sub-wavelength). Overlay images taken at 0,π4,π2,3π4 orientation angles and subsequent baseline compensation are shown to be critically important for the interpretation of chemical mapping results and reduction of spurious artefacts. Light field enhancement in the 60-nm-thick polyimide (I in MIM) was responsible for strong absorption at the characteristic polyimide bands. Strong absorbance A at narrow IR bands can be used as a thermal emitter (emittance E=1−R), where R is the reflectance and A=1−R−T, where for optically thick samples the transmittance is T=0.

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