Move-On-Modify: An Efficient yet Crash-Consistent Update Strategy for Interlaced Magnetic Recording

We have reported the dependence of the magnetic and recording properties of CoPtCr recording media on the thickness of the Cr underlayer. It was inferred from XRD data that grain-to-grain epitaxy of the Cr with the CoPtCr was responsible for the interaction observed between these layers. However, no cross-sectional TEM (XTEM) work was performed to confirm this inference. In this paper, we report the application of new techniques for preparing XTEM specimens from actual magnetic recording disks, and for layer-by-layer micro-diffraction with an electron probe elongated parallel to the surface of the deposited structure which elucidate the effect of the crystallographic structure of the Cr on that of the CoPtCr.XTEM specimens were prepared from magnetic recording disks by modifying a technique used to prepare semiconductor specimens. After 3mm disks were prepared per the standard XTEM procedure, these disks were then lapped using a tripod polishing device. A grid with a single 1mmx2mm hole was then glued with M-bond 610 to the polished side of the disk.

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Transmission Electron Microscopy studies of texture of Cr underlayer of magnetic recording hard disk

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100087215 ◽

1991 ◽

Vol 49 ◽

pp. 580-581

Author(s):

L. Tang ◽

G. Thomas ◽

M. R. Khan ◽

S. L. Duan

Keyword(s):

Electron Microscopy ◽

Thin Films ◽

Transmission Electron Microscopy ◽

Magnetic Recording ◽

Magnetic Thin Films ◽

Magnetic Films ◽

Substrate Bias ◽

Epitaxial Relationship ◽

Transmission Electron

Cr thin films are often used as underlayers for Co alloy magnetic thin films, such as Co1, CoNi2, and CoNiCr3, for high density longitudinal magnetic recording. It is belived that the role of the Cr underlayer is to control the growth and texture of the Co alloy magnetic thin films, and, then, to increase the in plane coercivity of the films. Although many epitaxial relationship between the Cr underlayer and the magnetic films, such as ﹛1010﹜Co/ {110﹜Cr4, ﹛2110﹜Co/ ﹛001﹜Cr5, ﹛0002﹜Co/﹛110﹜Cr6, have been suggested and appear to be related to the Cr thickness, the texture of the Cr underlayer itself is still not understood very well. In this study, the texture of a 2000 Å thick Cr underlayer on Nip/Al substrate for thin films of (Co75Ni25)1-xTix dc-sputtered with - 200 V substrate bias is investigated by electron microscopy.

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High-resolution scanning electron microscopy of thin-film magnetic media of magnetic recording disk

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100131309 ◽

1992 ◽

Vol 50 (2) ◽

pp. 1334-1335

Author(s):

K. Ogura ◽

H. Nishioka ◽

N. Ikeo ◽

T. Kanazawa ◽

J. Teshima

Keyword(s):

Thin Film ◽

Fine Structure ◽

High Resolution ◽

Magnetic Recording ◽

High Performance ◽

Magnetic Hysteresis ◽

Grain Structure ◽

Magnetic Media ◽

Cross Sectional ◽

Resolution Observation

Structural appraisal of thin film magnetic media is very important because their magnetic characters such as magnetic hysteresis and recording behaviors are drastically altered by the grain structure of the film. However, in general, the surface of thin film magnetic media of magnetic recording disk which is process completed is protected by several-nm thick sputtered carbon. Therefore, high-resolution observation of a cross-sectional plane of a disk is strongly required to see the fine structure of the thin film magnetic media. Additionally, observation of the top protection film is also very important in this field.Recently, several different process-completed magnetic disks were examined with a UHR-SEM, the JEOL JSM 890, which consisted of a field emission gun and a high-performance immerse lens. The disks were cut into approximately 10-mm squares, the bottom of these pieces were carved into more than half of the total thickness of the disks, and they were bent. There were many cracks on the bent disks. When these disks were observed with the UHR-SEM, it was very difficult to observe the fine structure of thin film magnetic media which appeared on the cracks, because of a very heavy contamination on the observing area.

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