scholarly journals On semi-classical spectral series for an atom in a periodic polarized electric field

Author(s):  
A. Ifa ◽  
H. Louati ◽  
M. Rouleux

This paper is mainly a report of further observations on the Stark-effect in helium made with a view to establishing various definite Stark patterns for the series lines. It thus appears as an extension to an earlier paper in which it was pointed out that a plan for Stark patterns is contained implicitly in the Bohr perturbation theory of the Stark-effect as developed by Kramers to predict connections between the hydrogen fine structure and the components observed in high fields. This plan, which on the perturbation theory might be expected to make its appearance in helium, receives somewhat detailed support from the present data, and will be outlined in later paragraphs. It should be stated now, however, that while the detailed analyses here given may be regarded as an extension to the observations by Stark and Nyquist, they offer definite reasons for a rather extensive revision of the complex analyses reported by Takamine and Kokubu. Soon after his discovery of this effect Stark suggested that it might be found to be of the same nature for the various members of a single spectral series. He noted, in particular, that on the early plates certain principal and sharp series lines of helium were merely displaced without being split by the applied electric field. In the following paper Stark and Kirschbaum gave the results of a more complete examination of the Stark-effect for the series lines of orthohelium, parhelium, lithium, and the doublets of calcium. With the single exception of the parhelium line λ 3614, which appeared to be double, they found all principal and sharp series lines simply displaced. The two components of each calcium doublet were shifted in the same direction, and by nearly the same amounts.


Author(s):  
G. F. Rempfer

In photoelectron microscopy (PEM), also called photoemission electron microscopy (PEEM), the image is formed by electrons which have been liberated from the specimen by ultraviolet light. The electrons are accelerated by an electric field before being imaged by an electron lens system. The specimen is supported on a planar electrode (or the electrode itself may be the specimen), and the accelerating field is applied between the specimen, which serves as the cathode, and an anode. The accelerating field is essentially uniform except for microfields near the surface of the specimen and a diverging field near the anode aperture. The uniform field forms a virtual image of the specimen (virtual specimen) at unit lateral magnification, approximately twice as far from the anode as is the specimen. The diverging field at the anode aperture in turn forms a virtual image of the virtual specimen at magnification 2/3, at a distance from the anode of 4/3 the specimen distance. This demagnified virtual image is the object for the objective stage of the lens system.


Author(s):  
Patrick P. Camus

The theory of field ion emission is the study of electron tunneling probability enhanced by the application of a high electric field. At subnanometer distances and kilovolt potentials, the probability of tunneling of electrons increases markedly. Field ionization of gas atoms produce atomic resolution images of the surface of the specimen, while field evaporation of surface atoms sections the specimen. Details of emission theory may be found in monographs.Field ionization (FI) is the phenomena whereby an electric field assists in the ionization of gas atoms via tunneling. The tunneling probability is a maximum at a critical distance above the surface,xc, Fig. 1. Energy is required to ionize the gas atom at xc, I, but at a value reduced by the appliedelectric field, xcFe, while energy is recovered by placing the electron in the specimen, φ. The highest ionization probability occurs for those regions on the specimen that have the highest local electric field. Those atoms which protrude from the average surfacehave the smallest radius of curvature, the highest field and therefore produce the highest ionizationprobability and brightest spots on the imaging screen, Fig. 2. This technique is called field ion microscopy (FIM).


1993 ◽  
Vol 3 (8) ◽  
pp. 1201-1225 ◽  
Author(s):  
G. N�ron de Surgy ◽  
J.-P. Chabrerie ◽  
O. Denoux ◽  
J.-E. Wesfreid

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