Analog Test Interface for IEEE 1687 Employing Split SAR Architecture to Support Embedded Instrument Dependability Applications

Author(s):  
Jerrin Pathrose ◽  
Leon van de Logt ◽  
Hans G. Kerkhoff
Keyword(s):  
2011 ◽  
Vol 20 (07) ◽  
pp. 1323-1340 ◽  
Author(s):  
KASTURI GHOSH ◽  
ARABINDA ROY ◽  
SEKHAR MONDAL ◽  
BAIDYANATH RAY

This paper reports a comprehensive solution for the problem of test and diagnosis of OTA based analog circuits. Based on the parametric deviation of circuit components, a test and diagnosis methodology are proposed. Compressed signature generated out of multiple performance parameters has resulted in significant enhancement in fault diagnosing capability. The voluminous response data has been handled with Cellular Automata (CA) based classifier to achieve excellent diagnostic resolution.


2019 ◽  
Author(s):  
Tyler L Renshaw

This brief report presents an analog test of the relative classification validity of three cutoff values (CVs; 16, 18, and 20) derived from responses to the self-report version of the Strengths and Difficulties Questionnaire: Total Difficulties Scale. Results from Bayesian t-tests, using several school-specific subjective well-being indicators as dependent variables, yielded evidence suggesting all CV models effectively differentiated between students with lower and higher levels of risk. Evidence also indicated that the lowest CV (16) was more effective than the higher CVs (18, 20) at identifying students with greater levels of risk, and that the higher CVs functioned comparably well. Implications for future research and practice are noted.


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