Analog Test Interface for IEEE 1687 Employing Split SAR Architecture to Support Embedded Instrument Dependability Applications
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1993 ◽
Vol 4
(3)
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pp. 261-268
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2011 ◽
Vol 20
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pp. 1323-1340
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2006 ◽
Vol 149
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pp. 731
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2015 ◽
Vol 84
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pp. 185-200
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