High Accuracy Thermal Compression Bonding Technology for Large-Sized Substrate

2017 ◽  
Author(s):  
Noboru Asahi ◽  
Yoshihito Mizutani ◽  
Koichi Imai ◽  
Yasunori Hashimoto ◽  
Hikaru Tomita ◽  
...  
Keyword(s):  
High Accuracy ◽  
Thermal Compression ◽  
Bonding Technology

High- Accuracy Die-Bonding Technology for LED Array

1985 ◽  
Vol 8 (4) ◽  
pp. 500-504
Author(s):  
H. Tanabe ◽  
I. Shibata ◽  
K. Nihei ◽  
K. Miyaki
Keyword(s):  
High Accuracy ◽  
Led Array ◽  
Bonding Technology ◽  
Die Bonding

Challenge and warpage optimization of thermal compression bonding technology on coreless substrates

2017 ◽  
Author(s):  
Mike Tsai ◽  
Jensen Tsai ◽  
Yan Han Yao ◽  
Roger Lo ◽  
Cheng Kai Chang ◽  
...  
Keyword(s):  
Thermal Compression ◽  
Bonding Technology ◽  
Warpage Optimization

Improvement of Fundamental Technology of 3-D Thermal Compression Bonding With High Accuracy

2019 ◽  
Vol 9 (5) ◽  
pp. 836-844
Author(s):  
Kohei Seyama ◽  
Shoji Wada ◽  
Yuji Eguchi ◽  
Doug Day ◽  
Shigetoshi Sugawa
Keyword(s):  
High Accuracy ◽  
Thermal Compression

A New 1,000 kV Electron Microscope

1967 ◽  
Vol 25 ◽  
pp. 260-261
Author(s):  
M. Nishigaki ◽  
S. Katagiri ◽  
H. Kimura ◽  
B. Tadano
Keyword(s):  
Electron Microscope ◽  
High Voltage ◽  
Basic Research ◽  
Chromatic Aberration ◽  
High Accuracy ◽  
Biological Specimen ◽  
Voltage Electron ◽  
High Voltage Electron Microscope ◽  
High Voltage Electron

The high voltage electron microscope has many advantageous features in comparison with the ordinary electron microscope. They are a higher penetrating efficiency of the electron, low chromatic aberration, high accuracy of the selected area diffraction and so on. Thus, the high voltage electron microscope becomes an indispensable instrument for the metallurgical, polymer and biological specimen studies. The application of the instrument involves today not only basic research but routine survey in the various fields. Particularly for the latter purpose, the performance, maintenance and reliability of the microscope should be same as those of commercial ones. The authors completed a 500 kV electron microscope in 1964 and a 1,000 kV one in 1966 taking these points into consideration. The construction of our 1,000 kV electron microscope is described below.

Tropospheric Duct Anomaly Threat Model for High Integrity and High Accuracy Navigation

2016 ◽  
Author(s):  
Samer Khanafseh ◽  
Axel Von Engeln ◽  
Boris Pervan ◽  
Illinois Institute of Technology
Keyword(s):  
High Accuracy ◽  
Threat Model ◽  
High Integrity

Application Of BIM-Technology In The Restoration Of Buildings

2020 ◽  
pp. 42-48
Keyword(s):  
Chinese Communist Party ◽  
Laser Scanning ◽  
High Accuracy ◽  
Information Environment ◽  
Information Modeling ◽  
Structural Scheme ◽  
Traditional Design ◽  
Information Interaction ◽  
Heritage Buildings ◽  
Effective Organization

The paper describes the main trends in the development of BIM technologies in the field of restoration and reconstruction of historical and cultural heritage buildings. The practical part of the paper presents the experience in using information modeling technologies when restoring the building, where the VI Congress of the Chinese Communist Party in Moscow took place. The use of laser scanning technologies made it possible to reproduce with high accuracy in the information model the original appearance of the building using Autodesk RevitR software. It is shown, how the use of information modeling technologies affects the duration of restoration process, taking into account the calculation of the structural scheme and bearing structures of the building, ensuring the identity of the decoration and the effective organization of electromechanical installation. Operating in a single BIM information environment makes it possible to continuously obtain reliable information on the project, which provides more effective information interaction and communication of participants compared to using traditional design methods.

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