A unified approach for a time-domain built-in self-test technique and fault detection

Author(s):  
B. Provost ◽  
A.M. Brosa ◽  
E. Sanchez-Sinencio
Author(s):  
Mehmet Ince ◽  
Ender Yilmaz ◽  
Wei Fu ◽  
Joonsung Park ◽  
Krishnaswamy Nagaraj ◽  
...  

Author(s):  
P M Frank ◽  
B Koppen

The paper presents a unified approach and general solution of the robustness problem in fault detection and isolation concepts. The ultimate objective is the design of an unknown input fault-detection observer providing a perfect decoupling between unknown inputs and faults. If this is not possible because certain prerequisites are not fulfilled, two optimal compromises in the time domain and in the frequency domain are described. The basic definitions concerning robustness and unknown input fault detectability are given, and the design techniques for the proposed approaches are outlined. The cross-connections to other methods are discussed and a practical example is given.


VLSI Design ◽  
1998 ◽  
Vol 7 (2) ◽  
pp. 191-201
Author(s):  
Sunil R. Das ◽  
Nita Goel ◽  
Wen B. Jone ◽  
Amiya R. Nayak

In this paper, we focus on the use of signature-based output compaction technique for built-in self-testing of VLSI circuits. We give algorithm for single-output and multiple-output signature generation using exhaustive test patterns extending the syndrome conccpt. The signature wc develop is a functional signature and is very effective for both input and internal line fault detection, as seen from simulation on various benchmark circuits. The signature generators can bc easily implemented using the current VLSI technology.


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