Reliability assessment of LED luminaires based on step-stress accelerated degradation test

2012 ◽  
Author(s):  
Rongbin Ren ◽  
Daoguo Yang ◽  
Miao Cai ◽  
Ming Gong
Keyword(s):  
Reliability Assessment ◽  
Accelerated Degradation ◽  
Degradation Test ◽  
Accelerated Degradation Test

Study on Reliability Assessment of Degradation Date Based on Pseudo Life Distribution

2013 ◽  
Vol 401-403 ◽  
pp. 1499-1502
Author(s):  
Ai Li Liu ◽  
Fang Yong Kou ◽  
Kun Hu Kou
Keyword(s):  
Data Processing ◽  
High Reliability ◽  
Reliability Assessment ◽  
Life Distribution ◽  
Accelerated Degradation ◽  
Degradation Data ◽  
Long Lifetime ◽  
Degradation Test ◽  
Accelerated Degradation Test

In order to develop the reliability assessment of high-reliability and long-lifetime products, analyses for accelerated degradation test is discussed in this article. First, a method of building degradation path is presented; second, the means of degradation data processing is analyzed; finally, an example is presented and validity of this method is verified.

Study of SnO2 Gas Sensor Accelerated Degradation Test

2014 ◽  
Vol 667 ◽  
pp. 364-367 ◽  
Author(s):  
Hui Juan Yuan ◽  
Jun Zhong Li ◽  
Zi Mei Su ◽  
En Jing Zhang ◽  
Ying Yang ◽  
...  
Keyword(s):  
Normal Stress ◽  
Gas Sensor ◽  
Reliability Assessment ◽  
Degradation Model ◽  
Accelerated Degradation ◽  
Accelerated Degradation Testing ◽  
Degradation Test ◽  
Accelerated Degradation Test ◽  
Degradation Testing ◽  
Accelerate Degradation

According to the reliability assessment of the SnO2 gas sensor, an accelerate degradation model was established by using temperature as the accelerated stress, the constant stress accelerated degradation testing (CSADT) was designed and conducted. The reliability of SnO2 gas sensor under the normal stress level was assessed based on pseudo life.

Reliability assessment of indium tin oxide thin films by accelerated degradation test

2006 ◽  
Vol 17 (2-4) ◽  
pp. 955-958 ◽  
Author(s):  
Yong-Nam Kim ◽  
Seong-Min Jeong ◽  
Min-Seok Jeon ◽  
Hyun-Gyoo Shin ◽  
Jun-Kwang Song ◽  
...  
Keyword(s):  
Thin Films ◽  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Reliability Assessment ◽  
Oxide Thin Films ◽  
Accelerated Degradation ◽  
Degradation Test ◽  
Accelerated Degradation Test

Reliability assessment for metallized film pulse capacitors with accelerated degradation test

2011 ◽  
Vol 23 (6) ◽  
pp. 1701-1704
Author(s):  
赵建印 Zhao Jianyin ◽  
刘芳 Liu Fang ◽  
奚文骏 Xi Wenjun ◽  
贺少勃 He Shaobo ◽  
魏晓峰 Wei Xiaofeng
Keyword(s):  
Reliability Assessment ◽  
Accelerated Degradation ◽  
Degradation Test ◽  
Accelerated Degradation Test
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