Research on reliability assessment of space electronic products based on integration of highly accelerated life test and accelerated degradation test

Author(s):  
Kai Liu ◽  
Congmin Lv ◽  
Wei Dang ◽  
Lingjiang Li ◽  
Tianji Zou ◽  
...  
2013 ◽  
Vol 401-403 ◽  
pp. 1499-1502
Author(s):  
Ai Li Liu ◽  
Fang Yong Kou ◽  
Kun Hu Kou

In order to develop the reliability assessment of high-reliability and long-lifetime products, analyses for accelerated degradation test is discussed in this article. First, a method of building degradation path is presented; second, the means of degradation data processing is analyzed; finally, an example is presented and validity of this method is verified.


2019 ◽  
Vol 13 ◽  
Author(s):  
Xiangxiang Zhang ◽  
Jun Yang ◽  
Xuefeng Kong

Background: Multi-stress accelerated life test (MALT) has obtained increasing attention in reliability assessment due to its advantages. Started with constant-stress ALT with two stress variables, MALT has developed a lot during the past decades. In MALT, design of test plan and data analysis are two crucial aspects. Numerous researchers have discussed these two aspects and some important methods of planning and data analysis for MALT are presented. Methods: We first conducted a survey in the journal databases including Elsevier, Springer, IEEEXplore, Wiley and Taylor & Francis; and patent databases like Spacenet, USPTO and WIPO. Then we revised the literature including patents comprehensively on planning and analysis of multi-stress ALT. Results: Optimal designs for MALT under different stress loadings are summarized, and different types of statistical inference methods are categorized and introduced. Finally, some challenges and research trends are discussed for future study.


2014 ◽  
Vol 667 ◽  
pp. 364-367 ◽  
Author(s):  
Hui Juan Yuan ◽  
Jun Zhong Li ◽  
Zi Mei Su ◽  
En Jing Zhang ◽  
Ying Yang ◽  
...  

According to the reliability assessment of the SnO2 gas sensor, an accelerate degradation model was established by using temperature as the accelerated stress, the constant stress accelerated degradation testing (CSADT) was designed and conducted. The reliability of SnO2 gas sensor under the normal stress level was assessed based on pseudo life.


2006 ◽  
Vol 17 (2-4) ◽  
pp. 955-958 ◽  
Author(s):  
Yong-Nam Kim ◽  
Seong-Min Jeong ◽  
Min-Seok Jeon ◽  
Hyun-Gyoo Shin ◽  
Jun-Kwang Song ◽  
...  

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