Novel low thermal budget gate stack solutions for BTI reliability in future Logic Device technologies : Invited paper
2000 ◽
Vol 39
(Part 1, No. 4B)
◽
pp. 2162-2166
Keyword(s):
2010 ◽
Vol 16
(1)
◽
pp. 106-113
◽
2000 ◽
Vol 40
(4-5)
◽
pp. 815-819
◽
Keyword(s):
2009 ◽
Vol 12
(9)
◽
pp. H319
◽
2001 ◽
Vol 82-84
◽
pp. 387-392
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