Transfer printing of III-V devices for silicon photonics

Author(s):  
B. Corbett ◽  
R. Loi ◽  
L. Liu ◽  
B. Roycroft ◽  
J. O'Callaghan
Author(s):  
Ruggero Loi ◽  
James O'Callaghan ◽  
Brendan Roycroft ◽  
Antonio Jose Trindade ◽  
Alin Fecioru ◽  
...  

Author(s):  
Jing Zhang ◽  
Grigorij Muliuk ◽  
Jeroen Goyvaerts ◽  
Bahawal Haq ◽  
Sulakshna Kumari ◽  
...  

Author(s):  
G. Roelkens ◽  
J. Zhang ◽  
A. De Groote ◽  
J. Juvert ◽  
N. Ye ◽  
...  

Photonics ◽  
2022 ◽  
Vol 9 (1) ◽  
pp. 40
Author(s):  
Jack Mulcahy ◽  
Frank H. Peters ◽  
Xing Dai

The article below presents a review of current research on silicon photonics. Herein, an overview of current silicon modulator types and modern integration approaches is presented including direct bonding methods and micro-transfer printing. An analysis of current state of the art silicon modulators is also given. Finally, new prospects for III–V-silicon integration are explored and the prospects of an integrated modulator compatible with current CMOS processing is investigated.


2017 ◽  
Vol 25 (13) ◽  
pp. 14290 ◽  
Author(s):  
Jing Zhang ◽  
Andreas De Groote ◽  
Amin Abbasi ◽  
Ruggero Loi ◽  
James O’Callaghan ◽  
...  

Author(s):  
Joan Juvert ◽  
Tommaso Cassese ◽  
Sarah Uvin ◽  
Andreas De Groote ◽  
Brad Snyder ◽  
...  

Author(s):  
Brian Corbett ◽  
Ruggero Loi ◽  
James O’Callaghan ◽  
Gunther Roelkens

Author(s):  
Pradip Sairam Pichumani ◽  
Fauzia Khatkhatay

Abstract Silicon photonics is a disruptive technology that aims for monolithic integration of photonic devices onto the complementary metal-oxide-semiconductor (CMOS) technology platform to enable low-cost high-volume manufacturing. Since the technology is still in the research and development phase, failure analysis plays an important role in determining the root cause of failures seen in test vehicle silicon photonics modules. The fragile nature of the test vehicle modules warrants the development of new sample preparation methods to facilitate subsequent non-destructive and destructive analysis methods. This work provides an example of a single step sample preparation technique that will reduce the turnaround time while simultaneously increasing the scope of analysis techniques.


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