Facilities for in situ diagnostics and monitoring of paintings

Author(s):  
Anna Impallaria ◽  
Ferruccio Petrucci
Keyword(s):  
Author(s):  
Ted Kolasa ◽  
Alfredo Mendoza

Abstract Comprehensive in situ (designed-in) diagnostic capabilities have been incorporated into digital microelectronic systems for years, yet similar capabilities are not commonly incorporated into the design of analog microelectronics. And as feature sizes shrink and back end interconnect metallization becomes more complex, the need for effective diagnostics for analog circuits becomes ever more critical. This paper presents concepts for incorporating in situ diagnostic capability into analog circuit designs. Aspects of analog diagnostic system architecture are discussed as well as nodal measurement scenarios for common signal types. As microelectronic feature sizes continue to shrink, diagnostic capabilities such as those presented here will become essential to the process of fault localization in analog circuits.


Author(s):  
V. A. Kurnaev ◽  
V. E. Nikolaeva ◽  
S. A. Krat ◽  
E. D. Vovchenko ◽  
A. V. Kaziev ◽  
...  

2021 ◽  
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pp. 283-292
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David Alexander ◽  
Jake Pellicotte ◽  
Alejandro Mejia ◽  
Caitlin Benway ◽  
Calvin Maurice Stewart ◽  
...  

2019 ◽  
Vol 146 ◽  
pp. 96-99 ◽  
Author(s):  
X. Jiang ◽  
G. Sergienko ◽  
B. Schweer ◽  
S. Möller ◽  
M. Freisinger ◽  
...  

2018 ◽  
Vol 49 (9) ◽  
pp. 4274-4289 ◽  
Author(s):  
K. Kageyama ◽  
F. Adziman ◽  
E. Alabort ◽  
T. Sui ◽  
A. M. Korsunsky ◽  
...  

2002 ◽  
Vol 150 (1) ◽  
pp. 57-63 ◽  
Author(s):  
N Chaoui ◽  
P Pasquet ◽  
J Solis ◽  
C.N Afonso ◽  
R Oltra

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