Systems of In Situ Diagnostics of Plasma-Surface Interaction in a Mephist-1 Tokamak

2021 ◽  
Author(s):  
V. A. Kurnaev ◽  
V. E. Nikolaeva ◽  
S. A. Krat ◽  
E. D. Vovchenko ◽  
A. V. Kaziev ◽  
...  
Keyword(s):  
Surface Interaction ◽  
Plasma Surface ◽  
In Situ Diagnostics

Systems of in situ diagnostics of plasma-surface interaction in MEPHIST-1 tokamak

2021 ◽  
Vol 64 (1) ◽  
pp. 118-124
Author(s):  
V.A. Kurnaev ◽  
◽  
V.E. Nikolaeva ◽  
S.A. Krat ◽  
E.D. Vovchenko ◽  
...  
Keyword(s):  
Discharge Chamber ◽  
Interaction Analysis ◽  
Surface Interaction ◽  
Diagnostic Tools ◽  
Spherical Tokamak ◽  
Plasma Surface ◽  
In Situ Methods ◽  
Working Out ◽  
Plasma Technologies

In the Institute for Laser and Plasma Technologies of NRNU MEPhI a compact spherical tokamak MEPhIST (MEPhI-Spherical Tokamak) for educational, demonstration and research purposes is under development and construction. The creation of plasma diagnostics systems involves several stages, determined by the successive complication of the plasma researchtasks, the upgrading of the device and the development of educational and methodological material for laboratory work to be put at the tokamak. Working out in situ methods of plasma-surface interaction analysis is one of the main scientific and technological goals of this tokamak. The complex of diagnostics described in the paper provides complementary information about the processes occurring at plasma with surface contact, is a set of very informative and well-tested diagnostic tools that allow students to obtain visual and reliable information about the processes occurring in the discharge chamber of the tokamak.

In-situ diagnostics for plasma surface processing

1993 ◽  
Vol 56 (6) ◽  
pp. 479-492 ◽  
Author(s):  
G. M. W. Kroesen ◽  
F. J. Hoog
Keyword(s):  
Surface Processing ◽  
Plasma Surface ◽  
In Situ Diagnostics

Concepts for In Situ Diagnostics in Analog Microelectronic Circuits

2007 ◽  
Author(s):  
Ted Kolasa ◽  
Alfredo Mendoza
Keyword(s):  
Analog Circuits ◽  
System Architecture ◽  
Analog Circuit ◽  
Fault Localization ◽  
Diagnostic System ◽  
Diagnostic Capability ◽  
Common Signal ◽  
Diagnostic Capabilities ◽  
In Situ Diagnostics

Abstract Comprehensive in situ (designed-in) diagnostic capabilities have been incorporated into digital microelectronic systems for years, yet similar capabilities are not commonly incorporated into the design of analog microelectronics. And as feature sizes shrink and back end interconnect metallization becomes more complex, the need for effective diagnostics for analog circuits becomes ever more critical. This paper presents concepts for incorporating in situ diagnostic capability into analog circuit designs. Aspects of analog diagnostic system architecture are discussed as well as nodal measurement scenarios for common signal types. As microelectronic feature sizes continue to shrink, diagnostic capabilities such as those presented here will become essential to the process of fault localization in analog circuits.

scholarly journals The upgraded TOMAS device: A toroidal plasma facility for wall conditioning, plasma production, and plasma–surface interaction studies

2021 ◽  
Vol 92 (2) ◽  
pp. 023506
Author(s):  
A. Goriaev ◽  
T. Wauters ◽  
S. Möller ◽  
R. Brakel ◽  
S. Brezinsek ◽  
...  
Keyword(s):  
Surface Interaction ◽  
Plasma Production ◽  
Plasma Surface ◽  
Toroidal Plasma ◽  
Interaction Studies
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