Test point selection based on functional simulation and FMMEA for an electronic system on PHM

Author(s):  
Xufei Wang ◽  
Zhongqun Li ◽  
Shunong Zhang ◽  
Jiaming Liu ◽  
Cong Shao
2014 ◽  
Vol 986-987 ◽  
pp. 2078-2081
Author(s):  
Wei Wei ◽  
Fei Teng Zhang

Analysis the characteristics of the measured transmission signal of Mobile Industry Processor Interface (MIPI) Display Serial Interface Physical Layer (D-PHY) interface based on a project platform. Firstly, introduces the transmission characteristics and mutual conversion process of physical layer about high-speed and low power mode, and by the transmission signal measured a platform of high-speed mode, present the D-PHY transmission signal each test items and test point selection, make the phone run smoothly and screen display normally, this test analysis certain practicability and expansibility.


2010 ◽  
Vol 7 (1) ◽  
pp. 223-230
Author(s):  
Hong-Xia Wang ◽  
Xiao-Hui Ye ◽  
Liang Wang

Diagnosis strategy is a testing sequence of the fault detection and isolation. For the distribution of the electronic equipment, a feasible engineering maintenance method is put forward based on the questions of test point selection and diagnosis strategy. The concepts of local diagnosis strategy and global diagnosis strategy are introduced. From which the local optimal diagnosis strategy is determined when the local optimal test points have been introduced by using the test information entropy, furthermore, the global optimal diagnosis strategy is determined by coalescing the local optimal diagnosis strategies. At last, the validity of the method is illustrated by an example from which the conclusion can be drawn that it is an optimal diagnosis strategy and the complexity of computation can be reduced.


2011 ◽  
Vol 18 (1) ◽  
pp. 115-128 ◽  
Author(s):  
Andrzej Pułka

Two Heuristic Algorithms for Test Point Selection in Analog Circuit Diagnoses The paper presents a heuristic approach to the problem of analog circuit diagnosis. Different optimization techniques in the field of test point selection are discussed. Two new algorithms: SALTO and COSMO have been introduced. Both searching procedures have been implemented in a form of the expert system in PROLOG language. The proposed methodologies have been exemplified on benchmark circuits. The obtained results have been compared to the others achieved by different approaches in the field and the benefits of the proposed methodology have been emphasized. The inference engine of the heuristic algorithms has been presented and the expert system knowledge-base construction discussed.


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