The Threshold Voltage Degradation of MOSFET in Heavy-ion Single Event Effect Test

2018 ◽  
Author(s):  
Zeming Zhang ◽  
Yingqi Ma ◽  
Dan Li ◽  
Chao Tong ◽  
Xiaoxiao Guo ◽  
...  
Keyword(s):  
Threshold Voltage ◽  
Heavy Ion ◽  
Single Event ◽  
Single Event Effect ◽  
Voltage Degradation ◽  
Effect Test ◽  
Threshold Voltage Degradation

Impact of Device Structure on Neutron-Induced Single-Event Effect in SiC MOSFETs

2019 ◽  
Vol 963 ◽  
pp. 738-741
Author(s):  
Hiroshi Kono ◽  
Teruyuki Ohashi ◽  
Takao Noda ◽  
Kenya Sano
Keyword(s):  
Threshold Voltage ◽  
Drift Region ◽  
Single Event ◽  
Drain Voltage ◽  
Device Structure ◽  
Pin Diodes ◽  
Power Mosfets ◽  
Single Event Effect ◽  
Significant Difference ◽  
Avalanche Breakdown Voltage

Neutron single event effect (SEE) tolerance of SiC power MOSFETs with different drift region design were evaluated. The SEE is detected over the SEE threshold voltage (VSEE). The failure rate increases exponentially as the drain voltage increases above VSEE. The device with higher avalanche breakdown voltage has higher SEE threshold voltage. The neutron SEE tolerance of MOSFETs and PiN diodes of the same epitaxial structure were also evaluated. There was no significant difference in the neutron SEE tolerance of these devices.

Atmospheric neutron single event effect test on Xilinx 28 nm system on chip at CSNS-BL09

2019 ◽  
Vol 99 ◽  
pp. 119-124 ◽  
Author(s):  
Weitao Yang ◽  
Yonghong Li ◽  
Yang Li ◽  
Zhiliang Hu ◽  
Fei Xie ◽  
...  
Keyword(s):  
System On Chip ◽  
Single Event ◽  
Single Event Effect ◽  
On Chip ◽  
Effect Test

Single Event Effect Testing With Ultrahigh Energy Heavy Ion Beams

2020 ◽  
Vol 67 (1) ◽  
pp. 63-70 ◽  
Author(s):  
Maria Kastriotou ◽  
Pablo Fernandez-Martinez ◽  
Ruben Garcia Alia ◽  
Carlo Cazzaniga ◽  
Matteo Cecchetto ◽  
...  
Keyword(s):  
Heavy Ion ◽  
Ion Beams ◽  
Ultrahigh Energy ◽  
Single Event ◽  
Single Event Effect

Circuit Simulation of Threshold-Voltage Degradation in a-Si:H TFTs Fabricated at 175 $^{\circ}\hbox{C}$

2007 ◽  
Vol 54 (7) ◽  
pp. 1781-1783 ◽  
Author(s):  
Rahul Shringarpure ◽  
Sameer Venugopal ◽  
Zi Li ◽  
Lawrence T. Clark ◽  
David R. Allee ◽  
...  
Keyword(s):  
Threshold Voltage ◽  
Circuit Simulation ◽  
Voltage Degradation ◽  
Threshold Voltage Degradation
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