QC-LDPC Codes with Fast Encoding for Error Control in NAND Flash Memories

2018 International Conference on Signals and Electronic Systems (ICSES) ◽

10.1109/icses.2018.8507336 ◽

2018 ◽

Author(s):

Wojciech Sulek ◽

Marcin Kucharczyk

Keyword(s):

Error Control ◽

Flash Memories ◽

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Improving the Reliability of MLC NAND Flash Memories Through Adaptive Data Refresh and Error Control Coding

Journal of Signal Processing Systems ◽

10.1007/s11265-014-0880-5 ◽

2014 ◽

Vol 76 (3) ◽

pp. 225-234 ◽

Author(s):

Chengen Yang ◽

Hsing-Min Chen ◽

Trevor N. Mudge ◽

Chaitali Chakrabarti

Keyword(s):

Error Control ◽

Flash Memories ◽

Error Control Coding ◽

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A Joint Decoding Strategy of Non-binary LDPC Codes Based on Retention Error Characteristics for MLC NAND Flash Memories

2016 Sixth International Conference on Instrumentation & Measurement, Computer, Communication and Control (IMCCC) ◽

10.1109/imccc.2016.85 ◽

2016 ◽

Author(s):

Liyan Qiao ◽

Hefeng Wu ◽

Debao Wei ◽

Shiyuan Wang

Keyword(s):

Flash Memories ◽

Joint Decoding ◽

Error Characteristics

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Word error control algorithm through multi-reading for NAND Flash memories

2011 9th IEEE International Conference on ASIC ◽

10.1109/asicon.2011.6157165 ◽

2011 ◽

Author(s):

Chong Zhang ◽

Tsutomu Yoshihara

Keyword(s):

Control Algorithm ◽

Error Control ◽

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Weighted Bit-Flipping Decoding of LDPC Codes with LLR Adjustment for MLC Flash Memories

IEICE Transactions on Fundamentals of Electronics Communications and Computer Sciences ◽

10.1587/transfun.e102.a.1571 ◽

2019 ◽

Vol E102.A (11) ◽

pp. 1571-1574

Author(s):

Xuan ZHANG ◽

Xiaopeng JIAO ◽

Yu-Cheng HE ◽

Jianjun MU

Keyword(s):

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A Heavy-ion Beam Monitor Based on 3D NAND Flash Memories

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2021.3072298 ◽

2021 ◽

pp. 1-1

Author(s):

S. Gerardin ◽

M. Bagatin ◽

A. Paccagnella ◽

S. Beltrami ◽

A. Costantino ◽

...

Keyword(s):

Ion Beam ◽

Heavy Ion ◽

Flash Memories ◽

Beam Monitor ◽

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Wireless optical communication channel modeling and error control based on LDPC codes

2012 4th Electronic System-Integration Technology Conference ◽

10.1109/estc.2012.6485914 ◽

2012 ◽

Author(s):

Xiaorong Gao ◽

Pei Wang ◽

Jianqiang Guo ◽

Jinlong Li ◽

Kai Yang ◽

...

Keyword(s):

Optical Communication ◽

Error Control ◽

Communication Channel ◽

Channel Modeling ◽

Wireless Optical Communication ◽

Optical Communication Channel

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Enhancement of electrical characteristics of the coupling ratio and the program/erase operation for NAND flash memories with an asymmetric interpoly-dielectric structure

Japanese Journal of Applied Physics ◽

10.7567/jjap.53.064306 ◽

2014 ◽

Vol 53 (6) ◽

pp. 064306 ◽

Author(s):

Ju Tae Ryu ◽

Sung Hwan Jang ◽

Tae Whan Kim

Keyword(s):

Electrical Characteristics ◽

Dielectric Structure ◽

Coupling Ratio ◽

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Improving Read Disturb Characteristics by Self-Boosting Read Scheme for Multilevel NAND Flash Memories

Japanese Journal of Applied Physics ◽

10.1143/jjap.48.04c062 ◽

2009 ◽

Vol 48 (4) ◽

pp. 04C062 ◽

Author(s):

Myounggon Kang ◽

Ki-Tae Park ◽

Youngsun Song ◽

Soonwook Hwang ◽

Byung Yong Choi ◽

...

Keyword(s):

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Comparison of TID Response of Micron Technology Single-Level Cell High Density NAND Flash Memories

2010 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2010.5619508 ◽

2010 ◽

Author(s):

Duc N. Nguyen ◽

Farokh Irom

Keyword(s):

High Density ◽

Flash Memories ◽

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Triple-Level-Cell/Single-Level-Cell Mix-Mode Operation Induced Data Retention Degradation in 3-D NAND Flash Memories

IEEE Electron Device Letters ◽

10.1109/led.2021.3121213 ◽

2021 ◽

pp. 1-1

Author(s):

Yu-Heng Liu ◽

Yu-Siang Yang ◽

Chih-Yuan Tseng ◽

Wei Lin ◽

An-Chang Liu ◽

...

Keyword(s):

Data Retention ◽

Flash Memories ◽

Single Level ◽

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