Simulating fluorescent microscope images of cell populations

2005 ◽  
Author(s):  
A. Lehmussola ◽  
J. Selinummi ◽  
P. Ruusuvuori ◽  
A. Niemisto ◽  
O. Yli-Harja
Keyword(s):  
Cell Populations ◽  
Fluorescent Microscope ◽  
Microscope Images

Routine Digital Processing of Microscope Images

1990 ◽  
Vol 48 (1) ◽  
pp. 550-551
Author(s):  
E. Wisse ◽  
A. Geerts ◽  
R.B. De Zanger
Keyword(s):  
Operating System ◽  
Digital Processing ◽  
Hard Disks ◽  
The Sun ◽  
Tape Drive ◽  
High Definition ◽  
Fluorescent Microscope ◽  
Microscope Images ◽  
Helical Scan ◽  
Ethernet Connection

The slowscan and TV signal of the Philips SEM 505 and the signal of a TV camera attached to a Leitz fluorescent microscope, were digitized by the data acquisition processor of a Masscomp 5520S computer, which is based on a 16.7 MHz 68020 CPU with 10 Mb RAM memory, a graphics processor with two frame buffers for images with 8 bit / 256 grey values, a high definition (HD) monitor (910 × 1150), two hard disks (70 and 663 Mb) and a 60 Mb tape drive. The system is equipped with Imaging Technology video digitizing boards: analog I/O, an ALU, and two memory mapped frame buffers for TV images of the IP 512 series. The Masscomp computer has an ethernet connection to other computers, such as a Vax PDP 11/785, and a Sun 368i with a 327 Mb hard disk and a SCSI interface to an Exabyte 2.3 Gb helical scan tape drive. The operating system for these computers is based on different versions of Unix, such as RTU 4.1 (including NFS) on the acquisition computer, bsd 4.3 for the Vax, and Sun OS 4.0.1 for the Sun (with NFS).

On Simulating 3D Fluorescent Microscope Images

2007 ◽  
pp. 309-316 ◽  
Author(s):  
David Svoboda ◽  
Marek Kašík ◽  
Martin Maška ◽  
Jan Hubený ◽  
Stanislav Stejskal ◽  
...  
Keyword(s):  
Fluorescent Microscope ◽  
Microscope Images

Computational Framework for Simulating Fluorescence Microscope Images With Cell Populations

2007 ◽  
Vol 26 (7) ◽  
pp. 1010-1016 ◽  
Author(s):  
A. Lehmussola ◽  
P. Ruusuvuori ◽  
J. Selinummi ◽  
H. Huttunen ◽  
O. Yli-Harja
Keyword(s):  
Fluorescence Microscope ◽  
Cell Populations ◽  
Computational Framework ◽  
Microscope Images

Electron microscopy of endocardial cell populations

1978 ◽  
Vol 36 (2) ◽  
pp. 486-487
Author(s):  
T. G. Sarphie ◽  
C. R. Comer ◽  
D. J. Allen
Keyword(s):  
Electron Microscopy ◽  
Plasma Membrane ◽  
Cellular Transformation ◽  
Cell Populations ◽  
Cell Surfaces ◽  
Kb Cells ◽  
Dna Viruses ◽  
Cell Cycles ◽  
Ultrastructural Studies ◽  
Endocardial Cell

Previous ultrastructural studies have characterized surface morphology during norma cell cycles in an attempt to associate specific changes with specific metabolic processes occurring within the cell. It is now known that during the synthetic ("S") stage of the cycle, when DNA and other nuclear components are synthesized, a cel undergoes a doubling in volume that is accompanied by an increase in surface area whereby its plasma membrane is elaborated into a variety of processes originally referred to as microvilli. In addition, changes in the normal distribution of glycoproteins and polysaccharides derived from cell surfaces have been reported as depreciating after cellular transformation by RNA or DNA viruses and have been associated with the state of growth, irregardless of the rate of proliferation. More specifically, examination of the surface carbohydrate content of synchronous KB cells were shown to be markedly reduced as the cell population approached division Comparison of hamster kidney fibroblasts inhibited by vinblastin sulfate while in metaphase with those not in metaphase demonstrated an appreciable decrease in surface carbohydrate in the former.

Electron Microscope Observations of Magnetic and Electric Effects

1970 ◽  
Vol 28 ◽  
pp. 430-431
Author(s):  
John Silcox
Keyword(s):  
Electron Microscope ◽  
Electric Fields ◽  
Magnetic Image ◽  
Magnetic Effects ◽  
Ferromagnetic Films ◽  
Diffraction Contrast ◽  
Microscope Images ◽  
Electric Effects ◽  
Image Detail

Several aspects of magnetic and electric effects in electron microscope images are of interest and will be discussed here. Clearly electrons are deflected by magnetic and electric fields and can give rise to image detail. We will review situations in ferromagnetic films in which magnetic image effects are the predominant ones, others in which the magnetic effects give rise to rather subtle changes in diffraction contrast, cases of contrast at specimen edges due to leakage fields in both ferromagnets and superconductors and some effects due to electric fields in insulators.

Interlayer mixing in GaAs/AlxGa1-xAs heterostructures as a result of Se+ ion implantation

1988 ◽  
Vol 46 ◽  
pp. 908-909
Author(s):  
E.G. Bithell ◽  
W.M. Stobbs
Keyword(s):  
Ion Implantation ◽  
Diffusion Coefficients ◽  
Dark Field ◽  
Atomic Mass ◽  
Composition Profile ◽  
Semiconductor Heterostructures ◽  
Transmission Electron ◽  
Microscope Images ◽  
Damage Process ◽  
Electron Energy Loss

It is well known that the microstructural consequences of the ion implantation of semiconductor heterostructures can be severe: amorphisation of the damaged region is possible, and layer intermixing can result both from the original damage process and from the enhancement of the diffusion coefficients for the constituents of the original composition profile. A very large number of variables are involved (the atomic mass of the target, the mass and energy of the implant species, the flux and the total dose, the substrate temperature etc.) so that experimental data are needed despite the existence of relatively well developed models for the implantation process. A major difficulty is that conventional techniques (e.g. electron energy loss spectroscopy) have inadequate resolution for the quantification of any changes in the composition profile of fine scale multilayers. However we have demonstrated that the measurement of 002 dark field intensities in transmission electron microscope images of GaAs / AlxGa1_xAs heterostructures can allow the measurement of the local Al / Ga ratio.

Simulation of three Dimensional Defect Images in Transmission Electron Microscopy

1976 ◽  
Vol 34 ◽  
pp. 470-471
Author(s):  
W. D. Cooper ◽  
C. S. Hartley ◽  
J. J. Hren
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Three Dimensional ◽  
Crystalline Lattice ◽  
Continuum Models ◽  
Thin Foils ◽  
Transmission Electron ◽  
Microscope Images ◽  
General Computer Program ◽  
General Computer

Interpretation of electron microscope images of crystalline lattice defects can be greatly aided by computer simulation of theoretical contrast from continuum models of such defects in thin foils. Several computer programs exist at the present time, but none are sufficiently general to permit their use as an aid in the identification of the range of defect types encountered in electron microscopy. This paper presents progress in the development of a more general computer program for this purpose which eliminates a number of restrictions contained in other programs. In particular, the program permits a variety of foil geometries and defect types to be simulated.The conventional approximation of non-interacting columns is employed for evaluation of the two-beam dynamical scattering equations by a piecewise solution of the Howie-Whelan equations.

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