Low-Cost Low-Power Test-Bed for Experimental Investigation of Common-Mode Chokes for High-Power Applications

2007 ◽  
Author(s):  
Annette Muetze ◽  
Bee See Heng
Keyword(s):  
Experimental Investigation ◽  
Low Power ◽  
High Power ◽  
Low Cost ◽  
Test Bed ◽  
Common Mode ◽  
Power Test ◽  
Low Power Test

Access-in-turn test architecture for low-power test application

2016 ◽  
Vol 104 (3) ◽  
pp. 433-441 ◽  
Author(s):  
Weizheng Wang ◽  
JinCheng Wang ◽  
Zengyun Wang ◽  
Lingyun Xiang
Keyword(s):  
Low Power ◽  
Power Test ◽  
Low Power Test ◽  
Test Application ◽  
Test Architecture

A low power test pattern generation for built-in self-test based circuits

2011 ◽  
Vol 98 (3) ◽  
pp. 301-309 ◽  
Author(s):  
Bo Ye ◽  
Tianwang Li ◽  
Qian Zhao ◽  
Duo Zhou ◽  
Xiaohua Wang ◽  
...  
Keyword(s):  
Low Power ◽  
Test Pattern ◽  
Pattern Generation ◽  
Test Pattern Generation ◽  
Power Test ◽  
Low Power Test ◽  
Self Test ◽  
Built In Self Test
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