scholarly journals ON the Effects of Acquisition Parameters and Surface Properties in Sea Oil Seep Observation by Means of High-Resolution SAR

2018 ◽  
Author(s):  
F. Nunziata ◽  
C.R. de Macedo ◽  
A. Buono ◽  
D. Velotto ◽  
M. Migliaccio
Keyword(s):  
High Resolution ◽  
Surface Properties ◽  
Oil Seep

Ceres Surface Properties by High-Resolution Imaging from Earth

Icarus ◽  
1993 ◽  
Vol 105 (2) ◽  
pp. 271-281 ◽  
Author(s):  
O. Saint-Pé ◽  
M. Combes ◽  
F. Rigaut
Keyword(s):  
High Resolution ◽  
Surface Properties ◽  
High Resolution Imaging ◽  
Resolution Imaging

Retrieval of atmospheric and surface properties from high-resolution FTIR measured radiances

2003 ◽  
Author(s):  
Xu Liu ◽  
Jean-Luc Moncet ◽  
Richard Lynch ◽  
William L. Smith
Keyword(s):  
High Resolution ◽  
Surface Properties

Comprehensive upgrade of the high-resolution small-angle neutron scattering instrument KWS-3 at FRM II

2011 ◽  
Vol 44 (2) ◽  
pp. 337-342 ◽  
Author(s):  
Guenter Goerigk ◽  
Zoltan Varga
Keyword(s):  
High Resolution ◽  
Neutron Scattering ◽  
Surface Properties ◽  
Small Angle ◽  
Small Angle Neutron Scattering ◽  
Vacuum System ◽  
Mirror Surface ◽  
Main Subject ◽  
User Friendly

After the KWS-3 instrument was moved from Jülich to Munich (in the first half of 2007), it underwent a fundamental evaluation, with the final result that a major upgrade for the whole instrument became necessary. The main subject of the upgrade project was a general mirror refurbishment,i.e.a new polishing and subsequently a new coating of the mirror surface with the isotope65Cu. In parallel to the mirror refurbishment, comprehensive upgrade activities in the vacuum system, electronics and programming have been performed with the aims of protecting the new mirror coating from aging (degradation of the mirror's surface properties), transforming the instrument into a user-friendly state and introducing conceptual improvements.

High-resolution REM of the reconstruction of sapphire surfaces

1991 ◽  
Vol 49 ◽  
pp. 644-645
Author(s):  
J. Liu
Keyword(s):  
High Resolution ◽  
Surface Properties ◽  
Film Growth ◽  
High Energy ◽  
Pure Oxygen ◽  
Transmission Electron ◽  
Metal Support ◽  
Sample Preparation Procedure ◽  
Reflection Electron Microscopy ◽  
Microscopy Techniques

Sapphire (α-Al2O3) is widely used in industry and research as a high temperature insulator, a substrate for growing thin films and carrier materials in catalysis. It is important to understand the surface properties of the substrate materials for thin film growth and for metal support interactions. Recently RHEED (reflection high energy electron diffraction) and REM (reflection electron microscopy) techniques have been used to characterize surface properties of sapphire annealed in air or in oxygen. The presentpaper reports some results of high resolution REM imaging of lattice fringes of reconstructed sapphire surface.The sample preparation procedure was reported elsewhere. The results presented here were obtained from a sample annealed in pure oxygen at 1650° C for 72 h. The high resolution REM observations were done in a Philips 400T transmission electron microscope operated at 120 kV with a vacuum pressure about 10-7 Torr.

High Resolution Etching of Gaas and Cds Crystals

1982 ◽  
Vol 17 ◽  
Author(s):  
D. V. Podlesnik ◽  
H.H. Gilgen ◽  
R.M. Osgood ◽  
A. Sanchez ◽  
V. Daneu
Keyword(s):  
High Resolution ◽  
Surface Properties ◽  
Laser Intensity ◽  
Optical Measurements ◽  
Laser Beams ◽  
Etching Time ◽  
Grating Fabrication ◽  
High Laser ◽  
High Laser Intensity

ABSTRACTSubmicrometer gratings have been etched in GaAs and CdS crystals which have been immersed in an oxidizing etch and illuminated with interferring laser beams. A resolution of 170 nm was obtained. At high laser intensity and with prolonged etching time the surface properties of the material are degraded. The use of in-situ optical measurements of grating parameters allows ready optimization of the grating fabrication process.

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