Analysis of Threshold Voltage Instability under Semi-ON Hot Electron Stress in AlGaN/GaN High Electron Mobility Transistor
2011 ◽
Vol 50
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pp. 110202
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2015 ◽
Vol 36
(4)
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pp. 381-383
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Vol 48
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pp. 081002
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2019 ◽
Vol 52
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pp. 195102
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2021 ◽
2016 ◽
Vol 214
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pp. 1600504
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