Study of the effect of nanofabricated surface roughness on conductivity in the terahertz regime with a high-Q resonator

2011 ◽  
Author(s):  
Benjamin B. Yang ◽  
Matt Kirley ◽  
John H. Booske
Keyword(s):  
Surface Roughness ◽  
High Q

scholarly journals Effects of defects and surface roughness on high-Q modes in ZnO microspheres

2021 ◽  
Vol 11 (5) ◽  
pp. 1568
Author(s):  
Ching-Hang Chien ◽  
Rizwana Khanum ◽  
Chia-Liang Liu ◽  
Rakish S. Moirangthem ◽  
Yia-Chung Chang
Keyword(s):  
Surface Roughness ◽  
High Q

Glass Based Inductors, Capacitors and System-In-Package for RF Applications

2016 ◽  
Vol 2016 (1) ◽  
pp. 000299-000304
Author(s):  
Jeb H Flemming ◽  
Roger Cook ◽  
Kyle McWethy
Keyword(s):  
Surface Roughness ◽  
Material Properties ◽  
Building Blocks ◽  
Packaging Materials ◽  
Current Crowding ◽  
High Q ◽  
Passive Devices ◽  
Glassy Materials ◽  
Rf Applications ◽  
Power Inductors

Abstract Glassy materials offer a number of advantages over traditional packaging materials, such as laminates and ceramics including: (1) Better material properties, (2) decreased surface roughness to mitigate current crowding, (3) the ability to create small precise features with greater densities, and (4) the opportunity to integrate passive devices such as power inductors and High-Q inductors into an interposer substrate along with other active and passive devices. This paper will cover an overview of our efforts to create APEX® Glass based devices that form the building blocks for a variety of RF applications including power inductors, High-Q inductors, capacitors, filters and interposers. We also demonstrate the power of integrating these individual building blocks into more complex devices that offer compelling solutions for the increasingly complex RF market. Performance data is presented for power inductors and the in-glass inductors.

scholarly journals Deformed microcavities with very high Q-factors and directional farfield emission

2020 ◽  
Vol 238 ◽  
pp. 01006
Author(s):  
Arne Behrens ◽  
Martí Bosch ◽  
Martina Hentschel ◽  
Stefan Sinzinger
Keyword(s):  
Surface Roughness ◽  
State Of The Art ◽  
Whispering Gallery Mode ◽  
Q Factor ◽  
Tapered Fiber ◽  
High Q ◽  
Whispering Gallery ◽  
Q Factors ◽  
Very High

We report the design and optimized fabrication of deformed whispering gallery mode resonators in silica with solely ICP-RIE. This allows us to control the morphology of the resonators more freely and results in low surface roughness. The light was coupled into the resonator using a state of the art tapered fiber approach and we determined the Q-factor in the range of 105

Fabrication of High-Q, High-Confinement 4H-SiC Microring Resonators by Surface Roughness Reduction

2019 ◽  
Author(s):  
Yi Zheng ◽  
Minhao Pu ◽  
Ailun Yi ◽  
Ayman N. Kamel ◽  
Martin. R. Henriksen ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Microring Resonators ◽  
High Q

Roughness measurements of nonlinear optical polymer films by scanning tunneling microscopy

1989 ◽  
Vol 47 ◽  
pp. 22-23
Author(s):  
I. H. Musselman ◽  
R.-T. Chen ◽  
P. E. Russell
Keyword(s):  
Surface Roughness ◽  
Scanning Tunneling Microscopy ◽  
Nonlinear Optical ◽  
Polymer Surface ◽  
Light Extinction ◽  
Scanning Tunneling ◽  
Silicon Substrates ◽  
Tunneling Microscopy ◽  
Optical Polymer ◽  
Total Light

Scanning tunneling microscopy (STM) has been used to characterize the surface roughness of nonlinear optical (NLO) polymers. A review of STM of polymer surfaces is included in this volume. The NLO polymers are instrumental in the development of electrooptical waveguide devices, the most fundamental of which is the modulator. The most common modulator design is the Mach Zehnder interferometer, in which the input light is split into two legs and then recombined into a common output within the two dimensional waveguide. A π phase retardation, resulting in total light extinction at the output of the interferometer, can be achieved by changing the refractive index of one leg with respect to the other using the electrooptic effect. For best device performance, it is essential that the NLO polymer exhibit minimal surface roughness in order to reduce light scattering. Scanning tunneling microscopy, with its high lateral and vertical resolution, is capable of quantifying the NLO polymer surface roughness induced by processing. Results are presented below in which STM was used to measure the surface roughness of films produced by spin-coating NLO-active polymers onto silicon substrates.

Surface roughness measurements of vanadium-contaminated fluidized cracking catalysts by atomic force microscopy

1996 ◽  
Vol 54 ◽  
pp. 866-867
Author(s):  
H. Kinney ◽  
M.L. Occelli ◽  
S.A.C. Gould
Keyword(s):  
Surface Roughness ◽  
Zeolite Y ◽  
Atomic Level ◽  
Microporous Structure ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Before And After ◽  
Roughness Measurements ◽  
Cracking Catalysts

For this study we have used a contact mode atomic force microscope (AFM) to study to topography of fluidized cracking catalysts (FCC), before and after contamination with 5% vanadium. We selected the AFM because of its ability to well characterize the surface roughness of materials down to the atomic level. It is believed that the cracking in the FCCs occurs mainly on the catalysts top 10-15 μm suggesting that the surface corrugation could play a key role in the FCCs microactivity properties. To test this hypothesis, we chose vanadium as a contaminate because this metal is capable of irreversibly destroying the FCC crystallinity as well as it microporous structure. In addition, we wanted to examine the extent to which steaming affects the vanadium contaminated FCC. Using the AFM, we measured the surface roughness of FCCs, before and after contamination and after steaming.We obtained our FCC (GRZ-1) from Davison. The FCC is generated so that it contains and estimated 35% rare earth exchaged zeolite Y, 50% kaolin and 15% binder.

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